Abstract: A simulation apparatus includes a discrete events simulation section to perform a discrete type simulation of components of a configured model as defined based on attribute information that is information on parts of the components of the defined configured model and connection information showing a connectional relationship among the components of the defined configured model; and a soft error rate computation processing section to compute a soft error rate of the defined configured model based on the simulation result of the discrete events simulation section and data on soft error rates in the attribute information.

Abstract: A failure caused by a soft-error including MNU, of an electronic apparatus is prevented, while suppressing increase of a mounting area, power consumption, and processing time. The electronic apparatus stores data indicating the state of a flip-flop included in a sequential logic circuit within an arithmetic unit, each time when execution is performed on a check point provided for every predetermined number of instructions. When a symptom of a soft-error is detected, the apparatus sets the state of the flip-flop included in the sequential logic circuit within the arithmetic unit, based on the data stored after execution of the instruction at the immediately preceding check point, and restarts execution from the next instruction, being subsequent to the instruction associated with the immediately preceding check point.

Abstract: A logic block group 120 having at least one set including a logic block having at least one logic circuit and a sequential circuit that inputs the output of the logic block is arranged in an irradiation region 110 of a high-energy particle irradiation device, and subjected to irradiation with high-energy particles. A control section 101 calculates the error rate of the logic circuit from the value obtained by subtracting the number of errors of the sequential circuit when the logic block of the logic block group 120 is bypassed, from the number of errors of the sequential circuit and the logic block of the logic block group 120.

Abstract: A simulation apparatus includes a discrete events simulation section to perform a discrete type simulation of components of a configured model as defined based on attribute information that is information on parts of the components of the defined configured model and connection information showing a connectional relationship among the components of the defined configured model; and a soft error rate computation processing section to compute a soft error rate of the defined configured model based on the simulation result of the discrete events simulation section and data on soft error rates in the attribute information.

Abstract: A failure caused by a soft-error including MNU, of an electronic apparatus is prevented, while suppressing increase of a mounting area, power consumption, and processing time. The electronic apparatus stores data indicating the state of a flip-flop included in a sequential logic circuit within an arithmetic unit, each time when execution is performed on a check point provided for every predetermined number of instructions. When a symptom of a soft-error is detected, the apparatus sets the state of the flip-flop included in the sequential logic circuit within the arithmetic unit, based on the data stored after execution of the instruction at the immediately preceding check point, and restarts execution from the next instruction, being subsequent to the instruction associated with the immediately preceding check point.

Abstract: Disclosed is means for quantifying resistance to soft errors in a logic circuit. A logic block group 120 having at least one set comprising a logic block having at least one logic circuit and a sequential circuit that inputs the output of the logic block is arranged in an irradiation region 110 of a high-energy particle irradiation device, and subjected to irradiation with high-energy particles. A control section 101 calculates the error rate of the logic circuit from the value obtained by subtracting the number of errors of the sequential circuit when the logic block of the logic block group 120 is bypassed, from the number of errors of the sequential circuit and the logic block of the logic block group 120.

Abstract: Spectrum data of white neutrons having different spectrum shapes, and SEE counts obtained by a white neutron method using this multiple spectrum data, are stored. A computing section reads out the spectrum data, divides the data into energy groups, and calculates and stores a total flux of each energy group. Furthermore, the computing section reads out the SEE counts with respect to each of the spectrum data and the total flux of each energy group, substitutes the SEE counts and the total flux into a simultaneous equation, and calculates the SEE cross section for each of the energy groups. Subsequently, the computing section calculates parameters which determine a formula of the approximate function of the SEE cross section as a function of energy, so that computed values of error counts obtained by integration of multiple spectra and the approximate function sufficiently match the actual measured values thereof.

Abstract: When resistivity against errors caused by cosmic ray neutrons in a semiconductor device is evaluated, the storage in the evaluation apparatus stores multiple spectrum data of white neutrons having different spectrum shapes, and multiple SEE counts obtained by the white neutron method using this multiple spectrum data. A computing section performs processing, with respect to each spectrum data, to read out the spectrum data from the storage, divide the data into multiple energy groups, calculates and stores a total flux of each energy group.

Abstract: On a sample base 1 disposed within a vacuum container is provided a scale S(1). . . S(N), where in an actual distance of the sample base is monitored by observing the scale trough an optical system for exclusive use thereof, which can catch it within a field of view. With this, it is possible to position a foreign body, as a target of analysis, which is analyzed or observed by a first analysis/observation device, so that it necessarily falls within a field of view of a second analysis/observation device, thereby realizing quick and automatic delivery of the samples when observing the foreign body on the sample by plural numbers of the devices.

Abstract: On a sample base 1 disposed within a vacuum container is provided a scale S(1) . . . S(N), where in an actual distance of the sample base is monitored by observing the scale trough an optical system for exclusive use thereof, which can catch it within a field of view.

Abstract: A water chemistry factor which is specific to a specific portion of a primary cooling system and universal is decided to be a standard target. The concentration of an agent for mitigating corrosion damage of structural material of the primary cooling system is controlled so that the target will be in a desirable range. All sensor groups provided in the primary cooling system are separated into sensor groups in different lines, of which a specific sensor group are connected to an arithmetic unit and a data base and are for always monitoring a plant process. For example, concentration distribution agreed with measured value oxidation component in the reactor water at the measurement points is selected from the data base, and it is used to estimate the standard target.

Abstract: This invention concerns a plant diagnosis apparatus which comprises a first detecting unit for detecting a state of devices constituting a circulating system in which a fluid circulates and a second detecting unit for detecting a quality of the above-mentioned circulating fluid or a quality of the atmosphere surrounding the above-mentioned circulating system, and a unit for diagnosing the circulating system by output of the first and second detecting units, and therefore can diagnose anomaly of facilities such as a nuclear power plant with high reliability and rapidity.

Abstract: An element (e.g., a sensor) has a fine-line thin film of a conductor formed on a non-conductive substrate, and a change of physical properties (e.g., deformation) of the substrate or the ambient environment is detected through a change in physical properties of the conductor. The element is manufactured by forming a layered film, composed of a semiconductor and a conductor, on the substrate, and forcibly diffusing part of this film, e.g., by selective irradiation with high-energy ions, to form this part into an alloy semi-conductor, thereby providing a two-dimensional pattern of the fine lines of the conductor and the semiconductor. By arranging a plurality of fine lines of a conductor transversely to a direction of growth of a crack in the substrate, crack in the substrate is detected through a change in electrical resistance of the fine lines. A dissolved oxygen sensor, a hydrogen sensor, and an electrical conductivity sensor (of an ambient medium) can also be provided.

Abstract: Two dissolved gas components in sample water, for example, oxygen and hydrogen in core water, are readily quantitatively determined in one and same membrane-type oxygen meter by using a membrane producing an overlapped potential region where a potential region for an oxidation limiting current plateau is overlapped with that for a reduction limiting current plateau between two dissolved gas components, and applying to between a pair of an electrode and a counter-electrode a more positive potential than the equilibrium potential for oxidation-reduction reaction of one of the two dissolved gas components principally, thereby measuring a current generated between the electrodes, and a more negative potential than the equilibrium potential for oxidation-reduction reaction of the other dissolved gas component, when desired, thereby measuring a current generated between the electrodes, and quantitatively determining a concentration of the first dissolved gas component from the latter current quantity and quantitati

Abstract: A plurality of sampling tubes are connected with a selector valve and the selector valve selects one of the sampling tubes so that the sample gas is lead through the selected sampling tube and a pipe way downstream of the selector valve to a leakage detection system. The pipe way is provided with a gas flushing section for flushing with high pressure gas and the gas flushing operation is performed before each change-over of the selector valve. The flow of sucked gas is kept constant by providing a gas flow control device downstream of the leakage detection section. A pressure sensor is provided for the pipe way leading to the detection section, to detect the gas pressure in the pipe way and the output of the pressure sensor is used to detect an abnormality occurring in the detection section inclusive of the pipe way thereto and also to correct the output of the pressure detector in the detection section.

Abstract: Disclosed is a sodium ionization detector (SID) for detecting sodium leaks by detecting the magnitude of fluctuation of the ion current produced by thermally ionizing sodium. There is a particular relationship between the magnitude of fluctuation of the ion current and the concentration of sodium. The sodium ionization detector is adapted to determine the magnitude of fluctuation of the ion current so as to compare it with a predetermined value. The magnitude of fluctuation of the ion current is determined, for example, by the root-mean-square value of a fluctuation component of the ion current.