Patents by Inventor Hidehiko Kuroda

Hidehiko Kuroda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130197846
    Abstract: A thickness measurement apparatus and method thereof being possible to measure an object to be inspected with required sensitivity stability and accuracy is provided.
    Type: Application
    Filed: October 11, 2011
    Publication date: August 1, 2013
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Hidehiko Kuroda, Yoshihiro Yamashita, Akio Sumita
  • Patent number: 8497986
    Abstract: A laser maintenance apparatus including a laser irradiation device which includes a first optical element for irradiating detection laser light on a test object to detect an ultrasonic wave; a second optical element for irradiating generation laser light on a test object so as to excite the ultrasonic wave; and an optical system container for containing the first and second optical element. The reflection direction of the first optical element and the reflection direction of the second optical element are arranged at an angle along the circumferential direction of the test object. The light reflected by the first optical element is irradiated at a position different than light reflected by the second optical element, and the laser irradiation positions of the light reflected by the first and second optical elements are different in the axial direction and the circumferential direction of the test object.
    Type: Grant
    Filed: April 23, 2010
    Date of Patent: July 30, 2013
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Makoto Ochiai, Takahiro Miura, Mitsuaki Shimamura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida
  • Publication number: 20120285246
    Abstract: According to an embodiment, a nuclear reactor monitoring device comprises: an ultrasonic wave transmission means which is installed on the outside surface of a reactor pressure vessel and transmits ultrasonic pulses to the interior of the reactor pressure vessel; an ultrasonic wave receiving means which is installed on the outside surface of the reactor pressure vessels and receives reflected pulses including ultrasonic waves from the ultrasonic pulses reflected by an inspection object in the reactor pressure vessel; a preprocessing means which specifies and removes the reflected ultrasonic pulses generated in the wall of the reactor pressure vessel from the reflected pulse signal received by the ultrasonic wave receiving means or selectively extracts the reflected pulse signal; and a calculation means which determines the vibration of the inspection object from the reflection pulse signal processed by the preprocessing means in accordance with the observation time of the inspection object.
    Type: Application
    Filed: June 21, 2012
    Publication date: November 15, 2012
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Hidehiko KURODA, Tooru Ootsubo
  • Patent number: 8248595
    Abstract: A surface inspecting method including irradiating a laser light to a test object to generate an ultrasonic wave, irradiating a second laser light at a position apart by a known distance from a position where the laser light is irradiated and receiving a reflection light thereof, and correcting a generation surface wave of a received ultrasonic wave by using an ultrasonic wave other than the generation surface wave to thereby detect a flaw of the test object. A characterization of the generation surface wave is divided or integrated by the same characterization of the ultrasonic wave other than the generation surface wave included in an output signal to obtain a performance index value and obtain a depth of the flaw by applying the performance index value to a calibration curve in which a corresponding relation between the performance index value and the depth of the flaw is obtained preliminarily.
    Type: Grant
    Filed: September 19, 2011
    Date of Patent: August 21, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
  • Publication number: 20120048021
    Abstract: A surface inspecting method for inspecting a flaw of a test object using a surface wave and estimating a depth of the flaw of the test object from an attenuation ratio of a frequency of a generation wave, the surface inspecting method including calculating a power spectrum of generation wave generating the flaw of the test object; integrating the power spectrum of the generation wave passing the flaw of the test object and calculating an integration value thereof; converting the integration value into a flaw depth based on a calibration created beforehand and calculating the flaw depth of the test object; and displaying the calculated flaw depth of the test object.
    Type: Application
    Filed: September 19, 2011
    Publication date: March 1, 2012
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
  • Patent number: 8115936
    Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.
    Type: Grant
    Filed: April 23, 2010
    Date of Patent: February 14, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida, Tetsuro Aikawa, Satoshi Okada, Toru Onodera, Akira Tsuyuki
  • Patent number: 8094297
    Abstract: A surface inspecting method for inspecting a flaw of a test object using a surface wave and estimating a depth of the flaw of the test object from an attenuation ratio of a frequency of a generation wave, the surface inspecting method including calculating a power spectrum of generation wave generating the flaw of the test object; integrating the power spectrum of the generation wave passing the flaw of the test object and calculating an integration value thereof; converting the integration value into a flaw depth based on a calibration created beforehand and calculating the flaw depth of the test object; and displaying the calculated flaw depth of the test object.
    Type: Grant
    Filed: April 23, 2010
    Date of Patent: January 10, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
  • Publication number: 20110317796
    Abstract: A vibration measuring apparatus for nuclear reactor internal structure includes a holder which has an opening contact on a surface of a pressure vessel of a nuclear reactor; a vibrator accommodated in the holder so as to transmit or receive an ultrasonic wave; a couplant with which the holder is filled up; and, a bias component applies a biasing force to the vibrator in the direction of the opening; The couplant is a solid state of metal material at normal temperature and change to liquid stage by heat transfer from the pressure vessel.
    Type: Application
    Filed: June 8, 2011
    Publication date: December 29, 2011
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Katsuhiko Sato, Hidehiko Kuroda, Mitsuhiro Enomoto, Hidefumi Amanai, Tooru Ootsubo
  • Patent number: 7888978
    Abstract: A frequency synthesizer includes first and second frequency dividers for receiving and frequency-dividing a signal generated by a voltage-controlled oscillator, a frequency mixer for mixing output signals of the first and second frequency dividers, and a third frequency divider for receiving and frequency-dividing a signal having one frequency of two frequencies that are output by the frequency mixer. The first, second third and frequency dividers and the frequency mixer are provided in a feedback loop within a PLL circuit between the voltage-controlled oscillator and the phase comparator. The phase comparator has a first input terminal to which a signal to which a signal that is output by the third frequency divider is input and a second input terminal to which a reference clock signal that is output by a reference signal generator is input. A loop filter supplies the voltage-controlled oscillator with a voltage that is based upon result of the phase comparison by a phase comparator.
    Type: Grant
    Filed: January 23, 2009
    Date of Patent: February 15, 2011
    Assignee: Renesas Electronics Corporation
    Inventor: Hidehiko Kuroda
  • Publication number: 20110025360
    Abstract: A semiconductor IC test device includes: an IC tester providing first and second control signals (CS1/CS2) based on a condition for qualifying a prescaler of a sorted semiconductor IC; and a probe card connected to the IC tester and the semiconductor IC. The probe card includes: a VCO (Voltage Controlled Oscillator) outputting a signal with frequency f based on CS1; a reference prescaler dividing f; a power variable device providing a signal with frequency f and a power based on CS2 to the sorted prescaler; a variable phase shifter canceling phase difference based on a difference between a path length through the reference prescaler versus sorted prescaler; and a conversion circuit section converting a signal based on a phase difference between a signal with a frequency divided by the sorted prescaler and a signal outputted from the reference prescaler, into a DC voltage, which is output to the IC tester.
    Type: Application
    Filed: July 19, 2010
    Publication date: February 3, 2011
    Applicant: RENESAS ELECTRONICS CORPORATION
    Inventor: Hidehiko KURODA
  • Publication number: 20100208248
    Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.
    Type: Application
    Filed: April 23, 2010
    Publication date: August 19, 2010
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Makoto OCHIAI, Takahiro Miura, Mitsuaki Shimamura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida
  • Publication number: 20100199768
    Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.
    Type: Application
    Filed: April 23, 2010
    Publication date: August 12, 2010
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Makoto Ochiai, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Masahiro Yoshida, Akira Tsuyuki
  • Publication number: 20100199769
    Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.
    Type: Application
    Filed: April 23, 2010
    Publication date: August 12, 2010
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Makoto OCHIAI, Takahiro Miura, Hidehiko Kuroda, Fukashi Osakata, Kentaro Tsuchihashi, Masahiro Yoshida, Tetsuro Aikawa, Satoshi Okada, Toru Onodera, Akira Tsuyuki
  • Publication number: 20100187108
    Abstract: A gas-component measurement device includes a housing having an suction port that introduces a measurement-targeted gas, and an exhaust port that discharges the measurement-targeted gas, and a water-absorbing member that is disposed in the housing and impregnated with a solvent that dissolves a gas component, and an electrochemical sensor that detects the gas component trapped by the solvent in the water-absorbing member. The exhaust port and suction port are disposed to oppose each other while sandwiching therebetween the electrochemical sensor.
    Type: Application
    Filed: June 18, 2008
    Publication date: July 29, 2010
    Inventors: Toru Matsumoto, Hidehiko Kuroda, Hideyuki Sato
  • Patent number: 7728967
    Abstract: A laser maintenance apparatus including a laser system which includes an optical system for emitting, in a first irradiation condition, a generation laser beam for generating an ultrasonic wave in a portion of an object on which maintenance is to be performed, and including a laser source configured to generate and detect a detection laser beam which interacts with the ultrasonic wave generated by the laser light beam in the first condition. The laser maintenance apparatus also includes a light transmitting device for transmitting laser light emitted from the laser system, a laser irradiation device for irradiating laser light transmitted by the light transmitting device to the object portion, and a transporting/scanning mechanism for transporting the light transmitting device and the laser irradiation device to a portion near the object portion, and scanning over an arbitrary range at the object portion.
    Type: Grant
    Filed: July 6, 2006
    Date of Patent: June 1, 2010
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Makoto Ochiai, Yoshiaki Ono, Takahiro Miura, Mitsuaki Shimamura, Masaki Yoda, Hidehiko Kuroda, Itaru Chida, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Ryoichi Saeki
  • Patent number: 7671682
    Abstract: A variable gain power amplifier includes a power amplifying unit and a signal generating unit. The power amplifying unit includes a control terminal, and a gain of the power amplifying unit is variable by a control signal provided through the control terminal. The signal generating unit generates the control signal to be provided to the control terminal. The signal generating unit includes a switching circuit to be turned on and off by a binary signal, a constant current source that generates a constant current, and a variable current source that generates a variable current. Also, the signal generating unit generates, when the switching circuit is on, a control signal of a magnitude that turns on the power amplifying unit and depends on a magnitude of a sum of the constant current and the variable current. When the switching circuit is off, the signal generating unit generates a control signal of a magnitude that turns off the power amplifying unit.
    Type: Grant
    Filed: November 13, 2006
    Date of Patent: March 2, 2010
    Assignee: NEC Electronics Corporation
    Inventor: Hidehiko Kuroda
  • Publication number: 20090282920
    Abstract: A nuclear reactor vibration surveillance system has a first ultrasonic transducer for transmission, an ultrasonic transmitter, a second ultrasonic transducer for reception, an ultrasonic receiver, a signal processor, and a display unit. The first ultrasonic transducer for transmission is arranged on the outer surface of a reactor pressure vessel and is configured to convert a transmission signal into an ultrasonic pulse signal and allow the ultrasonic pulse to be transmitted to a reactor internal component. The second ultrasonic transducer for reception is arranged on the outer surface of the reactor pressure vessel and is configured to receive a reflected ultrasonic pulse reflected by the reactor internal component and convert the received reflected ultrasonic pulse into a reception signal.
    Type: Application
    Filed: March 23, 2009
    Publication date: November 19, 2009
    Inventors: Michio SATO, Mieko Sato, Hidehiko Kuroda, Mikio Izumi, Mitsuhiro Enomoto, Masaki Yoda
  • Patent number: 7594644
    Abstract: A semiconductor device is provided including a semiconductor element having a circuit and at least one electrode of the circuit, a flexible substrate having at least one electrode pad and surrounding the semiconductor element, a conductor for connecting the electrode with the electrode pad, and a plurality of solder bumps on the electrode pad, wherein at least a first portion between a surface facing the solder bumps of the semiconductor element and the flexible substrate is not fixed by adhesion.
    Type: Grant
    Filed: November 7, 2005
    Date of Patent: September 29, 2009
    Assignee: NEC Corporation
    Inventors: Takao Yamazaki, Hirobumi Inoue, Ichiro Hazeyama, Sakae Kitajo, Masahiro Kubo, Yoshimichi Sogawa, Hidehiko Kuroda
  • Publication number: 20090189700
    Abstract: A frequency synthesizer includes first and second frequency dividers for receiving and frequency-dividing a signal generated by a voltage-controlled oscillator, a frequency mixer for mixing output signals of the first and second frequency dividers, and a third frequency divider for receiving and frequency-dividing a signal having one frequency of two frequencies that are output by the frequency mixer. The first, second third and frequency dividers and the frequency mixer are provided in a feedback loop within a PLL circuit between the voltage-controlled oscillator and the phase comparator. The phase comparator has a first input terminal to which a signal to which a signal that is output by the third frequency divider is input and a second input terminal to which a reference clock signal that is output by a reference signal generator is input. A loop filter supplies the voltage-controlled oscillator with a voltage that is based upon result of the phase comparison by a phase comparator.
    Type: Application
    Filed: January 23, 2009
    Publication date: July 30, 2009
    Applicant: NEC Electronics Corporation
    Inventor: Hidehiko Kuroda
  • Publication number: 20070157730
    Abstract: A laser maintenance apparatus is provided with a laser system including a laser light source and an optical system and emitting a laser light, a light transmitting device for generating the laser light emitted from the laser system, and a laser irradiation device for irradiating the laser light generated by the light transmitting device to an object portion. The laser system includes an element for changing an irradiation condition of the laser light.
    Type: Application
    Filed: July 6, 2006
    Publication date: July 12, 2007
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Makoto Ochiai, Yoshiaki Ono, Takahiro Miura, Mitsuaki Shimamura, Masaki Yoda, Hidehiko Kuroda, Itaru Chida, Fukashi Osakata, Satoshi Yamamoto, Kentaro Tsuchihashi, Ryoichi Saeki, Masahiro Yoshida, Tetsuro Aikawa, Satoshi Okada, Toru Onodera, Akira Tsuyuki