Patents by Inventor Hidehiro Okada
Hidehiro Okada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7829848Abstract: A gas monitoring apparatus includes a sample introducing portion, a measurement portion, an ionization portion, a mass analysis portion, a data processing portion and a display. The sample introducing portion introduces a sample gas including an object material to be measured. The measurement portion measures a concentration of a predetermined coexisting material, which coexists with the object material in the sample gas. The ionization portion ionizes the sample gas. The mass analysis portion analyzes mass of an ion produced by the ionization portion. The data processing portion analyzes signals detected by the mass analysis portion to calculate a concentration of the object material. And the display displays results of analysis conducted by the data processing portion. The data processing portion includes an adjustment portion which adjusts the concentration of the object material according to the concentration of the predetermined coexisting material.Type: GrantFiled: October 2, 2008Date of Patent: November 9, 2010Assignees: Hitachi, Ltd., National Research Institute of Police ScienceInventors: Yasuaki Takada, Masao Suga, Hisashi Nagano, Izumi Waki, Hidehiro Okada, Tatsuo Nojiri, Yasuo Seto, Yasuhiro Sano, Shigeharu Yamashiro, Isaac Ohsawa
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Patent number: 7663098Abstract: A gas monitoring apparatus capable of real-time detection of a kind of chemical warfare agent, namely diphenylcyanoarsine (DC) and/or diphenylchloroarsine (DA). Atmospheric pressure chemical ionization mass spectrometry is carried out in the positive ionization mode, the total amount of DC and DA is determined from the intensity of an ion common to DC and DA, the DC concentration is determined from the intensity of an ion specific to DC, and the difference between them is regarded as the DA concentration.Type: GrantFiled: February 9, 2007Date of Patent: February 16, 2010Assignee: Hitachi, Ltd.Inventors: Yasuo Seto, Isaac Ohsawa, Hiroshi Sekiguchi, Hisashi Maruko, Yasuaki Takada, Akihiko Okumura, Hidehiro Okada, Hisashi Nagano, Izumi Waki
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Publication number: 20090039253Abstract: A gas monitoring apparatus includes a sample introducing portion, a measurement portion, an ionization portion, a mass analysis portion, a data processing portion and a display. The sample introducing portion introduces a sample gas including an object material to be measured. The measurement portion measures a concentration of a predetermined coexisting material, which coexists with the object material in the sample gas. The ionization portion ionizes the sample gas. The mass analysis portion analyzes mass of an ion produced by the ionization portion. The data processing portion analyzes signals detected by the mass analysis portion to calculate a concentration of the object material. And the display displays results of analysis conducted by the data processing portion. The data processing portion includes an adjustment portion which adjusts the concentration of the object material according to the concentration of the predetermined coexisting material.Type: ApplicationFiled: October 2, 2008Publication date: February 12, 2009Inventors: Yasuaki Takada, Masao Suga, Hisashi Nagano, Izumi Waki, Hidehiro Okada, Tatsuo Nojiri, Yasuo Seto, Yasuhiro Sano, Shigeharu Yamashiro, Isaac Ohsawa
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Patent number: 7449685Abstract: A gas monitoring apparatus includes a sample introducing portion, a measurement portion, an ionization portion, a mass analysis portion, a data processing portion and a display. The sample introducing portion introduces a sample gas including an object material to be measured. The measurement portion measures a concentration of a predetermined coexisting material, which coexists with the object material in the sample gas. The ionization portion ionizes the sample gas. The mass analysis portion analyzes mass of an ion produced by the ionization portion. The data processing portion analyzes signals detected by the mass analysis portion to calculate a concentration of the object material. And the display displays results of analysis conducted by the data processing portion. The data processing portion includes an adjustment portion which adjusts the concentration of the object material according to the concentration of the predetermined coexisting material.Type: GrantFiled: January 23, 2006Date of Patent: November 11, 2008Assignees: Hitachi, Ltd., National Research Institute of Police ScienceInventors: Yasuaki Takada, Masao Suga, Hisashi Nagano, Izumi Waki, Hidehiro Okada, Tatsuo Nojiri, Yasuo Seto, Yasuhiro Sano, Shigeharu Yamashiro, Isaac Ohsawa
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Publication number: 20080054172Abstract: A gas monitoring apparatus capable of real-time detection of a kind of chemical warfare agent, namely diphenylcyanoarsine (DC) and/or diphenylchloroarsine (DA). Atmospheric pressure chemical ionization mass spectrometry is carried out in the positive ionization mode, the total amount of DC and DA is determined from the intensity of an ion common to DC and DA, the DC concentration is determined from the intensity of an ion specific to DC, and the difference between them is regarded as the DA concentration.Type: ApplicationFiled: February 9, 2007Publication date: March 6, 2008Inventors: Yasuo Seto, Isaac Ohsawa, Hiroshi Sekiguchi, Hisashi Maruko, Yasuaki Takada, Akihiko Okumura, Hidehiro Okada, Hisashi Nagano, Izumi Waki
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Patent number: 7260173Abstract: An image pickup unit is disposed so as to be able to obtain a scan projection image of an inspection subject from each of a vertical direction and a horizontal direction. An X-ray absorption coefficient of an object in the inspection subject is obtained from the vertical scan projection image and the horizontal scan projection image. It is determined whether there is a threat in the inspection subject on the basis of the X-ray absorption coefficient. Furthermore, a CT image is obtained by moving the image pickup unit around the inspection subject. It is determined whether there is a threat in the inspection subject, on the basis of the CT values of the CT image.Type: GrantFiled: February 25, 2003Date of Patent: August 21, 2007Assignees: Hitachi, Ltd., Hitachi Engineering & Services Co., Ltd.Inventors: Kyoichiro Wakayama, Hiroya Koshishiba, Hidehiro Okada, Yukiya Hattori
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Publication number: 20060289742Abstract: A gas monitoring apparatus includes a sample introducing portion, a measurement portion, an ionization portion, a mass analysis portion, a data processing portion and a display. The sample introducing portion introduces a sample gas including an object material to be measured. The measurement portion measures a concentration of a predetermined coexisting material, which coexists with the object material in the sample gas. The ionization portion ionizes the sample gas. The mass analysis portion analyzes mass of an ion produced by the ionization portion. The data processing portion analyzes signals detected by the mass analysis portion to calculate a concentration of the object material. And the display displays results of analysis conducted by the data processing portion. The data processing portion includes an adjustment portion which adjusts the concentration of the object material according to the concentration of the predetermined coexisting material.Type: ApplicationFiled: January 23, 2006Publication date: December 28, 2006Inventors: Yasuaki Takada, Masao Suga, Hisashi Nagano, Izumi Waki, Hidehiro Okada, Tatsuo Nojiri, Yasuo Seto, Yasuhiro Sano, Shigeharu Yamashiro, Isaac Ohsawa
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Patent number: 6806726Abstract: A semiconductor integrated circuit is segmented into a plurality of blocks. Each block includes a switching transistor which is connected between the CMOS circuit of the block and the ground point and is adapted to shut off the current of the CMOS circuit by being controlled by a test mode control signal, and a leakage current detecting circuit which has a self-check function for the block. A signal which is the logical sum of the outputs of the leakage current detecting circuits of all blocks is the led out of the semiconductor integrated circuit through a common external output terminal.Type: GrantFiled: December 30, 2003Date of Patent: October 19, 2004Assignee: Renesas Technology Corp.Inventors: Hidehiro Okada, Tetsuya Maruyama
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Publication number: 20040150419Abstract: A semiconductor integrated circuit is segmented into a plurality of blocks. Each block includes a switching transistor which is connected between the CMOS circuit of the block and the ground point and is adapted to shut off the current of the CMOS circuit by being controlled by a test mode control signal, and a leakage current detecting circuit which has a self-check function for the block. A signal which is the logical sum of the outputs of the leakage current detecting circuits of all blocks is led out of the semiconductor integrated circuit through a common external output terminal.Type: ApplicationFiled: December 30, 2003Publication date: August 5, 2004Inventors: Hidehiro Okada, Tetsuya Maruyama
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Publication number: 20040101097Abstract: An image pickup unit is disposed so as to be able to obtain a scan projection image of an inspection subject from each of a vertical direction and a horizontal direction. An X-ray absorption coefficient of an object in the inspection subject is obtained from the vertical scan projection image and the horizontal scan projection image. It is determined whether there is a threat in the inspection subject on the basis of the X-ray absorption coefficient. Furthermore, a CT image is obtained by moving the image pickup unit around the inspection subject. It is determined whether there is a threat in the inspection subject, on the basis of the CT values of the CT image.Type: ApplicationFiled: February 25, 2003Publication date: May 27, 2004Inventors: Kyoichiro Wakayama, Hiroya Koshishiba, Hidehiro Okada, Yukiya Hattori
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Patent number: 6693448Abstract: A semiconductor integrated circuit is segmented into a plurality of blocks. Each block includes a switching transistor which is connected between the CMOS circuit of the block and the ground point and is adapted to shut off the current of the CMOS circuit by being controlled by a test mode control signal, and a leakage current detecting circuit which has a self-check function for the block. A signal which is the logical sum of the outputs of the leakage current detecting circuits of all blocks is led out of the semiconductor integrated circuit through a common external output terminal.Type: GrantFiled: February 23, 2001Date of Patent: February 17, 2004Assignee: Renesas Technology CorporationInventors: Hidehiro Okada, Tetsuya Maruyama