Abstract: A monitor device for monitoring an object to be tested is provided in a test apparatus which includes a test section for testing the electrical characteristics of the object, a storage section for storing the object, and a transfer section for conveying the object between the storage section and the test section. This monitor device includes an imaging device used in alignment of the object in the test section, a sensor for sensing the position of the object in the transfer section, and a display panel for displaying an image of the interior of the test apparatus and displaying the alignment state in the test section and the position information of the object in the transfer section in the image of the test apparatus.

Abstract: A substrate inspecting method has a step of previously storing as initial setting data the positional information of a mounting table on which the substrate is placed and the positional information of the probe, a calibration step of moving a first alignment member provided at a position away by a specified distance from the mounting table together with the mounting table, and aligning the first alignment member with a second alignment member fixed to a position away by a specified distance from the probe, a step of calculating a distance between the calibrated position and the mutual probe/pad contact position on the basis of the previously stored initial setting data, and moving the mounting table on the basis of the calculated results to position the pad at the probe, and a step of contacting the pad of the substrate on the mounting table with the probe, and sending a test signal to a pattern circuit on the substrate to inspect.