Patents by Inventor Hidejiro Kadowaki

Hidejiro Kadowaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7554671
    Abstract: A first beam having high coherence and a second beam having low coherence and having a central wavelength difference from that of the first beam are multiplexed onto the same optical axis. First and second multiplexed beams obtained by beam splitting are emitted at a measurement reflection plane and a reference plane, respectively. The reflected first and second multiplexed beams are multiplexed and interfere with each other. The interference generates a first interference signal that is obtained from the first beams at the interference unit and that relates to information on the distance to the measurement reflection plane and a second interference signal that is obtained from the second beams. The first and second interference signals are used to carry out calculations for determining the position of a measurement origin for the measurement reflection plane.
    Type: Grant
    Filed: July 25, 2006
    Date of Patent: June 30, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventors: Hidejiro Kadowaki, Ko Ishizuka, Shigeki Kato
  • Patent number: 7551290
    Abstract: A first beam having high coherence and a second beam having low coherence are multiplexed onto the same optical axis. This multiplexed beam is split into first and second multiplexed beams. The first multiplexed beam is directed towards a measurement reflection plane of an object to be measured, and the second multiplexed beam is directed towards a reference plane. The first and second multiplexed beams that are reflected from the measurement reflection plane and the reference plane, respectively, are multiplexed to cause the first beams to interfere with each other and the second beams to interfere with each other. Calculations are carried out to determine a measurement origin on the basis of the first and second interference signals obtained from the first and second beams, respectively.
    Type: Grant
    Filed: July 25, 2006
    Date of Patent: June 23, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventors: Hidejiro Kadowaki, Ko Ishizuka, Shigeki Kato
  • Patent number: 7375820
    Abstract: Interference measuring apparatus having an optical system for dividing a coherent light beam into two light beams, and causing the divided two light beams to pass along discrete optical paths. The light beams are made into linearly polarized light beams orthogonal to each other and given modulation to the phase of the wave front of at least one of them. The wave fronts of the linearly polarized light beams are superposed one upon the others. A light dividing member divides the light beams superposed one upon the other by the optical system into a plurality of light beams. A polarizing plate takes out each light beam with a 45° polarized component, and a plurality of light receiving elements individually receive the light beams taken out by the polarizing plate.
    Type: Grant
    Filed: January 20, 2006
    Date of Patent: May 20, 2008
    Assignee: Canon Kabushiki Kaisha
    Inventors: Ko Ishizuka, Hidejiro Kadowaki, Yasushi Kaneda, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu
  • Publication number: 20070024862
    Abstract: A first beam having high coherence and a second beam having low coherence are multiplexed onto the same optical axis. This multiplexed beam is split into first and second multiplexed beams. The first multiplexed beam is directed towards a measurement reflection plane of an object to be measured, and the second multiplexed beam is directed towards a reference plane. The first and second multiplexed beams that are reflected from the measurement reflection plane and the reference plane, respectively, are multiplexed to cause the first beams to interfere with each other and the second beams to interfere with each other. Calculations are carried out to determine a measurement origin on the basis of the first and second interference signals obtained from the first and second beams, respectively.
    Type: Application
    Filed: July 25, 2006
    Publication date: February 1, 2007
    Applicant: CANON KABUSHIKI KAISHA
    Inventors: Hidejiro Kadowaki, Ko Ishizuka, Shigeki Kato
  • Publication number: 20070024863
    Abstract: A first beam having high coherence and a second beam having low coherence and having a central wavelength difference from that of the first beam are multiplexed onto the same optical axis. First and second multiplexed beams obtained by beam splitting are emitted at a measurement reflection plane and a reference plane, respectively. The reflected first and second multiplexed beams are multiplexed and interfere with each other. The interference generates a first interference signal that is obtained from the first beams at the interference unit and that relates to information on the distance to the measurement reflection plane and a second interference signal that is obtained from the second beams. The first and second interference signals are used to carry out calculations for determining the position of a measurement origin for the measurement reflection plane.
    Type: Application
    Filed: July 25, 2006
    Publication date: February 1, 2007
    Applicant: CANON KABUSHIKI KAISHA
    Inventors: Hidejiro Kadowaki, Ko Ishizuka, Shigeki Kato
  • Patent number: 7110120
    Abstract: A laser beam is irradiated onto a moving object, and scattered light reflected from the moving object is split into two beams, which are then received through respective spatial filters that are 90° out of phase with each other, thereby providing two signals. The signals are processed to determine the movement direction of the moving object.
    Type: Grant
    Filed: January 6, 2004
    Date of Patent: September 19, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kato Shigeki, Hidejiro Kadowaki
  • Publication number: 20060114474
    Abstract: An interference measuring apparatus has an optical system for dividing a coherent light beam into two light beams, causing the divided two light beams to pass along discrete optical paths and making them into linearly polarized light beams orthogonal to each other and given modulation to the phase of the wave front of at least one of them, and again superposing the wave fronts of the linearly polarized light beams one upon the other, a light dividing member for dividing the light beams superposed one upon the other by the optical system into a plurality of light beams, a rock crystal plate formed with a predetermined level difference in conformity with the incidence positions of the plurality of light beams, a polarizing plate for taking out each light beam transmitted through the rock crystal plate with a 45° polarized component, and a plurality of light receiving elements for individually receiving the light beams taken out by the polarizing plate, a plurality of different interference phase signals being p
    Type: Application
    Filed: January 20, 2006
    Publication date: June 1, 2006
    Applicant: CANON KABUSHIKI KAISHA
    Inventors: Ko Ishizuka, Hidejiro Kadowaki, Yasushi Kaneda, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu
  • Patent number: 7034947
    Abstract: Interference measuring apparatus for detecting a plurality of different interference phase signals. The apparatus has a light dividing member for dividing linearly polarized light beams superposed one upon another into a plurality of light beams. The apparatus also includes a light transmitting member with a plurality of light passing portions having different light transmitting properties in conformity with the incidence positions of the plurality of light beams divided by the light dividing member. In addition, the apparatus has a polarizing plate to receive the plurality of light beams that passed through the light transmitting member.
    Type: Grant
    Filed: April 30, 2003
    Date of Patent: April 25, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventors: Ko Ishizuka, Hidejiro Kadowaki, Yasushi Kaneda, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu
  • Publication number: 20040145749
    Abstract: A laser beam is irradiated onto a moving object, and scattered light reflected from the moving object is split into two beams, which are then received through respective spatial filters that are 90° out of phase with each other, thereby providing two signals. The signals are processed to determine the movement direction of the moving object.
    Type: Application
    Filed: January 6, 2004
    Publication date: July 29, 2004
    Applicant: Canon Kabushiki Kaisha
    Inventors: Kato Shigeki, Hidejiro Kadowaki
  • Patent number: 6674066
    Abstract: An optical type encoder includes a light-emitting element, a scale, a light receiving element for detecting light from the scale when a light beam from the light-emitting element is projected onto the scale, an incremental signal resulting from displacement of the scale being obtained by detection by the light receiving element, two or more mark portions for producing an origin signal formed on the scale, and an origin detecting system for detecting the mark portions for producing the origin signal. The rising position or the falling position of at least one pulse signal indicative of the origin is determined by the detection signals of the two or more mark portions for producing the origin signal by the origin detecting system.
    Type: Grant
    Filed: April 14, 2000
    Date of Patent: January 6, 2004
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yasushi Kaneda, Hidejiro Kadowaki, Ko Ishizuka, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu
  • Publication number: 20030223075
    Abstract: An interference measuring apparatus has an optical system for dividing a coherent light beam into two light beams, causing the divided two light beams to pass along discrete optical paths and making them into linearly polarized light beams orthogonal to each other and given modulation to the phase of the wave front of at least one of them, and again superposing the wave fronts of the linearly polarized light beams one upon the other, a light dividing member for dividing the light beams superposed one upon the other by the optical system into a plurality of light beams, a rock crystal plate formed with a predetermined level difference in conformity with the incidence positions of the plurality of light beams, a polarizing plate for taking out each light beam transmitted through the rock crystal plate with a 45° polarized component, and a plurality of light receiving elements for individually receiving the light beams taken out by the polarizing plate, a plurality of different interference phase signals bei
    Type: Application
    Filed: April 30, 2003
    Publication date: December 4, 2003
    Applicant: CANON KABUSHIKI KAISHA
    Inventors: Ko Ishizuka, Hidejiro Kadowaki, Yasushi Kaneda, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu
  • Patent number: 6657181
    Abstract: An interference measuring apparatus has an optical system for dividing a coherent light beam into two light beams, causing the divided two light beams to pass along discrete optical paths and making them into linearly polarized light beams orthogonal to each other and given modulation to the phase of the wave front of at least one of them, and again superposing the wave fronts of the linearly polarized light beams one upon the other, a light dividing member for dividing the light beams superposed one upon the other by the optical system into a plurality of light beams, a rock crystal plate formed with a predetermined level difference in conformity with the incidence positions of the plurality of light beams, a polarizing plate for taking out each light beam transmitted through the rock crystal plate with a 45° polarized component, and a plurality of light receiving elements for individually receiving the light beams taken out by the polarizing plate, a plurality of different interference phase signals bei
    Type: Grant
    Filed: March 10, 2000
    Date of Patent: December 2, 2003
    Assignee: Canon Kabushiki Kaisha
    Inventors: Ko Ishizuka, Hidejiro Kadowaki, Yasushi Kaneda, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu
  • Patent number: 6631047
    Abstract: An apparatus having a first system for forming a composite light beam of two light beams to be made to interfere with each other, a splitting member for amplitude-splitting the composite light beam into three or more split light beams in the same area, and a second system for obtaining interference light beams of different phases from the plurality of split light beams.
    Type: Grant
    Filed: September 18, 1998
    Date of Patent: October 7, 2003
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kou Ishizuka, Hidejiro Kadowaki, Naoki Kawamata, Hiroyuki Hagiwara, Makoto Takamiya, Shigeki Kato, Hiroyuki Shiomi
  • Patent number: 6618218
    Abstract: An apparatus for detecting the relative displacement of a surface to be detected, and an apparatus and method for recording information on a hard disc of a hard disk drive using such a detecting apparatus, the detecting apparatus comprising an interference optical system for condensing a light beam on the surface to be detected, and making the reflected light from the surface to be detected interfere with the condensed light beam to thereby form an interference light beam, light receiving means for receiving the interference light beam and outputting bright and dark signals attributable to the relative displacement of the surface to be detected, and condensed light information supplying means for separating part of the reflected light from the surface to be detected from the optical path until the reflected light arrives at said light receiving means, and utilizing the separated light beam to detect the condensed state of the incident light beam onto the surface to be detected or make the condensed state obse
    Type: Grant
    Filed: September 5, 2000
    Date of Patent: September 9, 2003
    Assignee: Canon Kabushiki Kaisha
    Inventors: Hidejiro Kadowaki, Ko Ishizuka, Yasushi Kaneda, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu
  • Publication number: 20030133219
    Abstract: This specification discloses an apparatus comprising a first system for forming a composite light beam of two light beams to be made to interfere with each other, a splitting member for amplitude-splitting the composite light beam into three or more splitted light beams in the same area, and a second system for obtaining interference light beams of different phases from the plurality of splitted light beams.
    Type: Application
    Filed: September 18, 1998
    Publication date: July 17, 2003
    Inventors: KOU ISHIZUKA, HIDEJIRO KADOWAKI, NAOKI KAWAMATA, HIROYUKI HAGIWARA, MAKOTO TAKAMIYA, SHIGEKI KATO, HIROYUKI SHIOMI
  • Patent number: 6473184
    Abstract: An interferometer has a semiconductor laser which oscillates in multiple modes, an optical member for providing a beam from the semiconductor laser with a substantial optical path difference between optical paths partially in one beam, and an interference optical system for causing interference, using the beam having traveled via the optical member.
    Type: Grant
    Filed: May 1, 2000
    Date of Patent: October 29, 2002
    Assignee: Canon Kabushiki Kaisha
    Inventors: Ko Ishizuka, Hidejiro Kadowaki, Yasushi Kaneda, Shigeki Kato, Takayuki Kadoshima, Sakae Horyu
  • Patent number: 6259531
    Abstract: An apparatus for detecting the displacement information of an object has a light source, a diffraction grating for diffracting a light beam from the light source so that the light beam diffracted by the diffraction grating is incident on the object, and a photodetector for detecting the light from the object caused upon the incidence of the light beam thereon by the diffraction grating. Information regarding the relative displacement to the object along a predetermined direction is detected on the basis of a light detection signal from the photodetector. The diffraction grating is formed so that the light beam applied to the object may be condensed on the object in a direction in which the relative displacement to the object cannot be detected by the signal from the photodetector.
    Type: Grant
    Filed: June 15, 1999
    Date of Patent: July 10, 2001
    Assignee: Canon Kabushiki Kaisha
    Inventors: Makoto Takamiya, Hidejiro Kadowaki, Kou Ishizuka, Yasushi Kaneda
  • Patent number: 6151185
    Abstract: An apparatus for detecting position change information of an object includes a contact member for contacting the object, and a detecting unit for obtaining position change information of the object by detecting a change in force applied from the object to the contact member.
    Type: Grant
    Filed: September 4, 1997
    Date of Patent: November 21, 2000
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kou Ishizuka, Hidejiro Kadowaki, Makoto Takamiya
  • Patent number: 5930066
    Abstract: An apparatus records information on a hard disk with a magnetic head arm provided in a hard disk drive. The apparatus comprises an interference measuring system, containing an outgoing portion for a measuring light beam to the arm and a reference light forming portion, for obtaining relative displacement information with respect to the arm by interfering the reference light with reflected light of the measuring light from the arm or a slider belonging to the arm, the interference measuring system having a light beam deflecting member for deflecting the measuring light and thus guiding the measuring light to a lateral surface of the arm or of the slider, a control system for generating a signal for positioning the arm with respect to the hard disk on the basis of the relative displacement information obtained by the interference measuring system, and a signal system for transmitting a signal for recording information on the hard disk to the magnetic head.
    Type: Grant
    Filed: August 26, 1997
    Date of Patent: July 27, 1999
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kou Ishizuka, Hidejiro Kadowaki, Naoki Kawamata, Hiroyuki Hagiwara, Jun Ashiwa
  • Patent number: 5828387
    Abstract: A recording apparatus employs a control unit to compensate for any variations in the feed speed of a recording medium. The recording apparatus includes a recording unit for recording an image on a recording medium in accordance with the image data; a speed detection unit for detecting the actual feed speed of the recording medium or of a feed unit for feeding the recording medium; and a control unit for controlling the record timing of the recording unit in accordance with a difference between a reference feed speed and the actual feed speed of the recording medium or feed unit detected by the speed detection unit.
    Type: Grant
    Filed: December 6, 1994
    Date of Patent: October 27, 1998
    Assignee: Canon Kabushiki Kaisha
    Inventors: Masafumi Wataya, Toshiyuki Yanaka, Hidejiro Kadowaki, Ken Tsuchii, Haruhiko Takahashi, Makoto Takamiya, Kosuke Yamamoto