Patents by Inventor Hidekatsu Yokoyama

Hidekatsu Yokoyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electron spin resonance measurement method and measurement device for measuring ESR within the interior of large samples
    Patent number: 6741077
    Abstract: Disclosed are a method of measuring ESR in a sample located outside a resonator using the B1 leaking to the exterior from the end of the resonator; and an ESR device comprised of at least a resonator capable of applying a B1 leaking from the end of the resonator to a sample located outside the resonator, and a magnet located on the resonator side of a plane containing the end of the resonator that is capable of applying a B0 and a modulation field. These inventions enable ESR measurement of the interior of large samples.
    Type: Grant
    Filed: April 25, 2002
    Date of Patent: May 25, 2004
    Assignee: Yamagata Public Corporation for the Development of Industry
    Inventors: Hidekatsu Yokoyama, Tateaki Ogata, Tadaaki Tsuchiya, Ryosuke Kudo
  • N-acyloxylated cycloalkyl compounds, composition containing the same and methods of use therefor
    Patent number: 6713492
    Abstract: Drugs or reagents containing as the active ingredient N-acyloxylated cycloalkyl compounds represented by general formula (I): wherein A is optionally substituted C4 or C5 cycloalkyl which may have one double bond in the ring; and R is C1-C3 alkyl or phenyl). The above compounds are hydroxyamine derivatives functioning as spin trapping agents and can rapidly react with free radicals or active oxygen in an objective organ in spite of their being excellent in stability during the preparation or administration thereof.
    Type: Grant
    Filed: May 24, 2001
    Date of Patent: March 30, 2004
    Assignees: Daiichi Radioisotope Laboratories, Ltd., Yamagata Public Corporation for the Development of Industry
    Inventors: Osamu Itoh, Heitaro Obara, Hidekatsu Yokoyama, Masaaki Aoyama
  • Electron spin resonance measurement method and measurement device
    Publication number: 20020163336
    Abstract: Disclosed are a method of measuring ESR in a sample located outside a resonator using the B1 leaking to the exterior from the end of the resonator; and an ESR device comprised of at least a resonator capable of applying a B1 leaking from the end of the resonator to a sample located outside the resonator, and a magnet located on the resonator side of a plane containing the end of the resonator that is capable of applying a B0 and a modulation field. These inventions enable ESR measurement of the interior of large samples.
    Type: Application
    Filed: April 25, 2002
    Publication date: November 7, 2002
    Inventors: Hidekatsu Yokoyama, Tateaki Ogata, Tadaaki Tsuchiya, Ryosuke Kudo