Patents by Inventor Hideki Hirakawa

Hideki Hirakawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10747153
    Abstract: A belt-type transport device includes a belt, a pressure unit, a nip forming unit, a belt stretching roller, an inclination controller, a contact unit, and a support unit. The belt is an endless belt, has an outer circumferential surface and an inner circumferential surface, and is to be rotated. The pressure unit is in contact with the outer circumferential surface of the belt. The nip forming unit presses the belt against the pressure unit so as to form a nip through which a recording medium is to be transported. The belt stretching roller is disposed inside the belt and stretches the belt. The inclination controller controls inclination of the belt stretching roller. The contact unit is provided along a width direction of the belt and is in contact with the inner circumferential surface of the belt. The support unit supports the contact unit such that the contact unit is able to follow inclination of the belt which is changed due to the inclination of the belt stretching roller.
    Type: Grant
    Filed: July 22, 2019
    Date of Patent: August 18, 2020
    Assignee: FUJI XEROX CO., LTD.
    Inventors: Mitsutoshi Hongo, Kouichi Kimura, Hideki Kuge, Kei Tanaka, Noboru Hirakawa, Takashi Matsubara, Takashi Ohashi, Takashi Ochi, Toshimasa Toyama
  • Publication number: 20200218184
    Abstract: A belt-type transport device includes a belt, a pressure unit, a nip forming unit, a belt stretching roller, an inclination controller, a contact unit, and a support unit. The belt is an endless belt, has an outer circumferential surface and an inner circumferential surface, and is to be rotated. The pressure unit is in contact with the outer circumferential surface of the belt. The nip forming unit presses the belt against the pressure unit so as to form a nip through which a recording medium is to be transported. The belt stretching roller is disposed inside the belt and stretches the belt. The inclination controller controls inclination of the belt stretching roller. The contact unit is provided along a width direction of the belt and is in contact with the inner circumferential surface of the belt. The support unit supports the contact unit such that the contact unit is able to follow inclination of the belt which is changed due to the inclination of the belt stretching roller.
    Type: Application
    Filed: July 22, 2019
    Publication date: July 9, 2020
    Applicant: FUJI XEROX Co., Ltd.
    Inventors: Mitsutoshi HONGO, Kouichi KIMURA, Hideki KUGE, Kei TANAKA, Noboru HIRAKAWA, Takashi MATSUBARA, Takashi OHASHI, Takashi OCHI, Toshimasa TOYAMA
  • Patent number: 9568500
    Abstract: An electrical test probe according to an embodiment includes a probe main body portion having a connection end to a circuit of a probe base plate and made of a first metal material with resiliency, and a probe tip portion having a probe tip, made of a second metal material with higher hardness than that of the first metal material for the probe main body portion, and communicating with the probe main body portion, wherein the probe main body portion and the probe tip portion are provided with a current path made of an equal metal material extending from the probe tip to the connection end.
    Type: Grant
    Filed: May 9, 2013
    Date of Patent: February 14, 2017
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Hideki Hirakawa, Yuko Kanazawa
  • Patent number: 8975908
    Abstract: An embodiment disperses a force acting on a border portion between an extending portion and a pedestal portion or a reinforcing member to prevent breakage of a probe tip portion of a probe. An electrical test probe includes a probe main body, a recess provided at an end of the main body and having an inner surface, and a probe tip having a part received in the recess. The inner surface has a central area and two lateral areas on both sides of the central area, and the part of the probe tip is located at the central area and at least at either one of the lateral areas.
    Type: Grant
    Filed: September 16, 2011
    Date of Patent: March 10, 2015
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Takayuki Hayashizaki, Akira Soma, Hideki Hirakawa
  • Patent number: 8671567
    Abstract: A method for manufacturing a probed for an electrical test includes producing by a deposition technique a deposit including a probe main body portion made of a nickel-boron alloy and a probe tip portion projecting downward from the probe main body portion and made of a different conductive material from the probe main body portion. The method further includes annealing the deposit. The average grain diameter of the nickel-boron alloy is between 97 ? and 170 ?. The contained amount of boron is from 0.02 wt % to 0.20 wt %.
    Type: Grant
    Filed: November 4, 2010
    Date of Patent: March 18, 2014
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Hideki Hirakawa, Satoshi Kaizuka
  • Publication number: 20130321016
    Abstract: An electrical test probe according to an embodiment includes a probe main body portion having a connection end to a circuit of a probe base plate and made of a first metal material with resiliency, and a probe tip portion having a probe tip, made of a second metal material with higher hardness than that of the first metal material for the probe main body portion, and communicating with the probe main body portion, wherein the probe main body portion and the probe tip portion are provided with a current path made of an equal metal material extending from the probe tip to the connection end.
    Type: Application
    Filed: May 9, 2013
    Publication date: December 5, 2013
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Hideki HIRAKAWA, Yuko KANAZAWA
  • Publication number: 20120068726
    Abstract: An embodiment disperses a force acting on a border portion between an extending portion and a pedestal portion or a reinforcing member to prevent breakage of a probe tip portion of a probe. An electrical test probe includes a probe main body, a recess provided at an end of the main body and having an inner surface, and a probe tip having a part received in the recess. The inner surface has a central area and two lateral areas on both sides of the central area, and the part of the probe tip is located at the central area and at least at either one of the lateral areas.
    Type: Application
    Filed: September 16, 2011
    Publication date: March 22, 2012
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Takayuki HAYASHIZAKI, Akira SOMA, Hideki HIRAKAWA
  • Patent number: 7983912
    Abstract: A speech recognition apparatus includes a generation unit generating a recognition candidate associated with a speech utterance and a likelihood; a storing unit storing the one recognition; a selecting unit selecting the recognition candidate as a recognition result of a first speech utterance; an utterance relation determining unit determining whether a second speech utterance which is input after the input of the first speech utterance is a speech re-utterance of a whole of the first speech utterance or a speech re-utterance of a part of the first speech utterance; a whole correcting unit correcting the recognition candidate of the whole of the first speech utterance when the second speech utterance is the whole of the first speech utterance; and a part correcting unit correcting the recognition candidate for the part of the first speech utterance when the second speech utterance is the part of the first speech utterance.
    Type: Grant
    Filed: March 15, 2006
    Date of Patent: July 19, 2011
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Hideki Hirakawa, Tetsuro Chino
  • Patent number: 7960988
    Abstract: An electrical test contactor comprises a contactor main body including a plate-shaped attachment portion extending in the up-down direction, a plate-shaped arm portion extending from the lower end portion of the attachment portion at least to one side in the right-left direction, and a plate-shaped pedestal portion projecting downward from the tip end portion of the arm portion, a contact portion projecting downward from the lower end of the pedestal portion and having the lower end of the contact portion acting as a probe tip, and a resistor having a higher resistance value than the contactor main body and the contact portion and arranged at the contactor main body so as to heighten the resistance value of the contactor.
    Type: Grant
    Filed: December 19, 2008
    Date of Patent: June 14, 2011
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Yoshiyuki Fukami, Kazuya Numajiri, Osamu Arai, Hideki Hirakawa
  • Publication number: 20110115515
    Abstract: The embodiment of the subject matter provides a probe that is good both in mechanical characteristics and electrical characteristics. A probe for an electrical test comprises a probe main body portion made of a nickel-boron alloy, and a probe tip portion projecting downward from the probe main body portion and made of a different conductive material from that for the probe main body portion. The crystal size of the nickel-boron alloy is 50 nm at the maximum, and the contained amount of the boron is 0.02 wt % or more and 0.20 wt % or less.
    Type: Application
    Filed: November 4, 2010
    Publication date: May 19, 2011
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Hideki HIRAKAWA, Satoshi KAIZUKA
  • Patent number: 7888958
    Abstract: A probe for current test is provided. The probe includes a probe body having a plate-like connection portion whose end face becomes a connection face to a probe board, a solder layer formed on at least one side face of said connection portion, and a guide portion formed on the connection portion. The guide portion penetrates the connection portion in its thickness direction from the one side face with the solder layer formed to the other side face. When the solder layer is melted, the guide portion guides a portion of the melted solder to the other side face.
    Type: Grant
    Filed: January 25, 2006
    Date of Patent: February 15, 2011
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Akira Souma, Yoshikazu Urushiyama, Masahisa Tazawa, Tomoya Sato, Hideki Hirakawa, Takayuki Hayashizaki
  • Patent number: 7862733
    Abstract: The present invention provides a probe manufacturing method in which, after a metal material for a probe is deposited on a base table, the probe can be detached from the base table relatively easily. A sacrificial layer is formed on a base table. The sacrificial layer is partially removed so as to form a recess in the sacrificial layer. A mask that exposes an area formed in a desired probe flat surface shape containing the recess is formed on the sacrificial layer. A probe material exhibiting different etching resistance characteristics from those of the sacrificial layer is deposited in the area exposed from the mask. By the deposition of the material, a coupling portion corresponding to the recess and a probe that is integral with the coupling portion are formed. After the mask is removed, the sacrificial layer is removed with use of etchant. Thereafter, the probe held on the base table at the coupling portion is detached from the base table together with the coupling portion.
    Type: Grant
    Filed: December 19, 2007
    Date of Patent: January 4, 2011
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Takayuki Hayashizaki, Hideki Hirakawa, Akira Soma, Kazuhito Hamada
  • Patent number: 7816931
    Abstract: A contact comprises a contact body at least provided with an arm region extending in the right-left direction, and a tip region extending downward from the front end portion of the arm region. The tip region is provided with a pedestal portion integrally continuous to the lower edge portion on the front end side of the arm region, and a contact portion projecting downward from the lower end portion of the pedestal portion and having a tip to be brought into contact with an electrode of a device under test at the lower end. The pedestal portion includes an underside region having at least four inclined faces located around the contact portion when the tip region is seen from below, and inclined such that a portion closer to the side of the contact portion becomes lower.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: October 19, 2010
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Hideki Hirakawa, Takayuki Hayashizaki, Akira Soma, Yuko Yamada
  • Publication number: 20100213956
    Abstract: A probe for current test comprising: a probe body having a plate-like connection portion whose end face becomes a connection face to a probe board; a solder layer formed on at least one side face of said connection portion; and a guide portion formed on the connection portion, penetrating the connection portion in its thickness direction from the one side face with the solder layer formed to the other side face, and when the solder layer is melted, capable of guiding a portion thereof to the other side face.
    Type: Application
    Filed: January 25, 2006
    Publication date: August 26, 2010
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Akira Souma, Yoshikazu Urushiyama, Masahisa Tazawa, Tomoya Sato, Hideki Hirakawa, Takayuki Hayashizaki
  • Patent number: 7747871
    Abstract: An information recording apparatus comprises an encryption section encrypting contents information and also a license condition referred to to limit use of the contents information and a decoding key for decoding the encrypted contents information to generate license information, and a recording section recording the encrypted contents information and the generated license information on a recording medium. An information reproducing apparatus comprises a decoder unit decoding the license information recorded on the recording medium using a second decoding key for decoding the license information and deciding on the basis of the license condition contained in the decoded license information whether the contents information can be used. If it is decided that the contents information can be used, the encrypted contents information recorded on the recording medium is decoded using the first decoding key contained in the decoded license information.
    Type: Grant
    Filed: August 27, 2002
    Date of Patent: June 29, 2010
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Toru Kambayashi, Koichiro Akiyama, Shuichi Tsujimoto, Kazuo Sumita, Hideki Hirakawa, Toshihiro Sugaya
  • Patent number: 7736690
    Abstract: A probe tip section of an electrical test probe has a laminated structure consisting of a first deposition portion and a second deposition portion covering the first deposition portion, and by the laminated structure, a maximum cross-sectional area portion at which the cross-sectional area of the probe tip section is increased to a base portion is provided between a tip end of the probe tip section and the base portion in the probe tip section. At the maximum cross-sectional area portion, a dimension in the X direction as seen on a flat surface perpendicular to a protruding direction of the probe tip section is increased in a one-dimensional way, and in addition, a dimension in the Y direction perpendicular to the X direction is increased from the tip end toward the base portion, as a result of which the cross-sectional area of the probe tip section can be increased in a two-dimensional way.
    Type: Grant
    Filed: January 21, 2008
    Date of Patent: June 15, 2010
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Hideki Hirakawa, Yuko Yamada, Yosuke Yoshizawa, Takayuki Hayashizaki, Akira Soma, Shinji Kuniyoshi
  • Patent number: 7721429
    Abstract: A probe formed on a base table is detached from the base table without giving damage on the probe. The present invention provides a probe manufacturing method comprising the steps of forming on a sacrificial layer on a base table a recess exposing the sacrificial layer with a resist, depositing a probe material in the recess to form a probe and then removing the resist, leaving part of the sacrificial layer and removing the rest by an etching process, and detaching from the base table the probe held on the base table by the remaining part of the sacrificial layer. In the recess of the resist are formed a main body part corresponding to a flat surface shape of the probe and an auxiliary part continuing into the main body part. The probe is formed by deposition of the material at the main body part, and a holding portion is formed by deposition of the material at the auxiliary part.
    Type: Grant
    Filed: January 21, 2008
    Date of Patent: May 25, 2010
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Akira Soma, Takayuki Hayashizaki, Yosuke Yoshizawa, Hideki Hirakawa
  • Patent number: 7679389
    Abstract: A probe includes an arm region extending in the back and forth direction, and a tip region extending downward from the front end portion of the arm region. The tip region has a pedestal portion integrally continuous to a lower edge portion at the front end side of the arm region and having an underside inclined to an imaginary axis extending in the vertical direction; and a contact portion projected from the underside of the pedestal portion and having a tip orthogonal to an imaginary axis. Thus, the position of the tip can be accurately determined.
    Type: Grant
    Filed: March 7, 2005
    Date of Patent: March 16, 2010
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Shinji Kuniyoshi, Hideki Hirakawa, Akira Soma, Takayuki Hayashizaki
  • Patent number: 7629807
    Abstract: A probe for electrical test comprises a plate-shaped main portion having a base end to be attached to a support board and a tip end opposite the base end, and a probe tip portion arranged at the tip end of the main portion and having a probe tip to contact an electrode of a device under test, the main portion being made of a tenacity material. The main portion includes a conductive material extending from the base end to the tip end and at least part of which is buried within the tenacity material, and the tenacity material has higher resiliency than that of the conductive material while the conductive material has higher conductivity than that of the tenacity material. As a result, disorder of a signal provided via the probe is decreased without losing elastic deformation.
    Type: Grant
    Filed: August 9, 2005
    Date of Patent: December 8, 2009
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Hideki Hirakawa, Akira Soma, Takayuki Hayashizaki, Shinji Kuniyoshi, Masahisa Tazawa
  • Publication number: 20090230982
    Abstract: A contact comprises a contact body at least provided with an arm region extending in the right-left direction, and a tip region extending downward from the front end portion of the arm region. The tip region is provided with a pedestal portion integrally continuous to the lower edge portion on the front end side of the arm region, and a contact portion projecting downward from the lower end portion of the pedestal portion and having a tip to be brought into contact with an electrode of a device under test at the lower end. The pedestal portion includes an underside region having at least four inclined faces located around the contact portion when the tip region is seen from below, and inclined such that a portion closer to the side of the contact portion becomes lower.
    Type: Application
    Filed: February 18, 2009
    Publication date: September 17, 2009
    Applicant: KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Hideki HIRAKAWA, Takayuki HAYASHIZAKI, Akira SOMA, Yuko YAMADA