Abstract: A management device includes: an acquisition unit that acquires change information from which a change in an operational state of one or more functional units included in an onboard network is discernible, and from which a change in a state of use of a transmission path in the onboard network by the functional units is discernible; and a setting change unit that performs setting change to change settings for the onboard network based on the change information acquired by the acquisition unit.

Abstract: A sample holder with high versatility is provided. A sample holder 100 includes a holder shaft 2, a placement unit 3 on which a sample SAM is placeable, a moving mechanism 4 that moves the holder shaft in a first direction, rotating mechanism 5 that rotates the holder shaft 2 in a first rotation direction with a center of the holder shaft 2 as a rotation axis, a protrusion unit 6 that is fixed to the holder shaft 2 so as to protrude in a second direction intersecting the first direction and whose position is changed according to the rotation and movement of the holder shaft 2, and a guide unit 7 that surrounds an outer periphery of the holder shaft 2 and whose position is not changed according to the rotation and movement of the holder shaft 2. The guide unit 7 is provided with a through hole (7a) and a through hole (7b). A width of the through hole (7a) in the first rotation direction is larger than a width of the through hole (7b) in the first rotation direction.

Abstract: An object of the invention is to reduce influence of a phase contrast on an observation image in a transmission electron microscope and to enable image observation with high magnification and high resolution. The transmission electron microscope according to the invention can switch between a first mode in which a lens barrel is airtightly sealed between an electron beam source side and a stage side by a diaphragm, and a second mode in which the lens barrel is not airtightly sealed (see FIG. 2).

Abstract: Described is a peelable heat shrink tube composed of a fluororesin and having a determination coefficient calculated from [Equation 1] below using an elastic modulus ratio (%) of more than 0, but 0.90 or less: Determination ? coefficient = ( correlation ? coefficient ) 2 = [ ( covariance ) ( standard ? deviation ? of ? X ) ? ( standard ? deviation ? of ? Y ) ] 2 [ Equation ? 1 ] where X, Y and covariance represent the following: X: Proportion of the position of each point, where the elastic modulus was measured, from the interior of the tube Y: Elastic modulus ratio in each region Covariance: Average of the product of deviations of X and Y.

Abstract: An object of the invention is to provide a technique of capturing images at higher speed and higher magnification when acquiring continuous tilted images with an electron microscope. The electron microscope of the invention includes a first spherical receiver fixed to a column of the electron microscope and configured to slide with a spherical fulcrum provided at a tip end of a sample holder; a spherical surface part provided on the column; and a second spherical receiver provided outside the column. The spherical surface part and the second spherical receiver slide on a contact part between the spherical surface part and the second spherical receiver, and a track of the slide is along a spherical surface centered on a central axis of the first spherical receiver, so that a view shift and a focus shift from an observation position of a sample can be reduced.

Abstract: An object of the invention is to provide a technique of capturing images at higher speed and higher magnification when acquiring continuous tilted images with an electron microscope. The electron microscope of the invention includes a first spherical receiver fixed to a column of the electron microscope and configured to slide with a spherical fulcrum provided at a tip end of a sample holder; a spherical surface part provided on the column; and a second spherical receiver provided outside the column. The spherical surface part and the second spherical receiver slide on a contact part between the spherical surface part and the second spherical receiver, and a track of the slide is along a spherical surface centered on a central axis of the first spherical receiver, so that a view shift and a focus shift from an observation position of a sample can be reduced.

Abstract: There is provided a technology for imparting attenuation while maintaining rigidity of a support member that reduces vibration of a sample stage when disturbance such as an environmental sound is applied to a device and vibrates the sample stage. A charged particle beam device according to the present disclosure includes a sample stage that can move a sample, an attenuation unit that attenuates vibration of the sample stage, and a sample chamber that stores the sample stage and the attenuation unit. In the charged particle beam device, the sample stage and the attenuation unit are disposed so as to be horizontal to each other. Also, the sample stage is configured to be supported so as to be sandwiched between the attenuation unit and a first side surface of a casing, and the inside of the casing of the attenuation unit is filled with a plural number of friction bodies.

Abstract: An object of the present invention is to provide a heat shrink tube excellent in peelability and transparency, and a method for producing the heat shrink tube. The present invention provides a peelable heat shrink tube comprising a composition containing a melt-processable fluororesin and PTFE, the PTFE lacking a heat history of its melting point or higher after polymerization and having a specific gravity, as measured according to ASTM D4894, of 2.20 or less. The content of the PTFE is 0.05 to 3.0 wt % based on the total weight of the melt-processable fluororesin and the PTFE. The present invention also provides a method for producing the tube which comprises melt-extruding the composition at a temperature lower than the melting point of the PTFE.

Abstract: A charged particle beam device wherein a transmission image corresponding to an arbitrary diffraction spot or a diffraction pattern corresponding to a partial range in the transmission image are easily and automatically captured. A charged particle beam device having: an image-capturing unit for forming an image of a sample; a diaphragm disposed in the image-capturing unit, a plurality of openings having different sizes for transmitting an electron beam from the sample being formed in the diaphragm; a movement unit for varying the position of the diaphragm; and a display unit for displaying the formed image, wherein when the operator selects, e.g., a diffraction spot (A) on the display unit, the movement unit moves the diaphragm from the positional relationship between the diaphragm and the image in accordance with the position of the diffraction spot (A).

Abstract: In a side entry type sample holder, vibrations in the radial direction of the sample holder provoke a resolving power decrease in the measurement results. In the present invention, the side entry type sample holder has a stepped portion in the radial direction of an axial portion. The sample stage has a support part contacting the stepped portion in a cylindrical portion capable of moving as one body in the axis direction of the sample holder, and, through the contact between the stepped portion and the support part, a frictional force is generated, opposing the radial direction of the axial portion in the sample holder. In this manner, the vibrations in the radial direction of the sample holder are suppressed, and the resolving power decrease in the measurement results is suppressed.

Abstract: In a side entry type sample holder, vibrations in the radial direction of the sample holder provoke a resolving power decrease in the measurement results. In the present invention, the side entry type sample holder has a stepped portion in the radial direction of an axial portion. The sample stage has a support part contacting the stepped portion in a cylindrical portion capable of moving as one body in the axis direction of the sample holder, and, through the contact between the stepped portion and the support part, a frictional force is generated, opposing the radial direction of the axial portion in the sample holder. In this manner, the vibrations in the radial direction of the sample holder are suppressed, and the resolving power decrease in the measurement results is suppressed.

Abstract: An object of the present invention is to provide a heat shrink tube excellent in peelability and transparency, and a method for producing the heat shrink tube. The present invention provides a peelable heat shrink tube comprising a composition containing a melt-processable fluororesin and PTFE, the PTFE lacking a heat history of its melting point or higher after polymerization and having a specific gravity, as measured according to ASTM D4894, of 2.20 or less. The content of the PTFE is 0.05 to 3.0 wt % based on the total weight of the melt-processable fluororesin and the PTFE. The present invention also provides a method for producing the tube which comprises melt-extruding the composition at a temperature lower than the melting point of the PTFE.

Abstract: A charged particle beam device wherein a transmission image corresponding to an arbitrary diffraction spot or a diffraction pattern corresponding to a partial range in the transmission image are easily and automatically captured. A charged particle beam device having: an image-capturing unit for forming an image of a sample; a diaphragm disposed in the image-capturing unit, a plurality of openings having different sizes for transmitting an electron beam from the sample being formed in the diaphragm; a movement unit for varying the position of the diaphragm; and a display unit for displaying the formed image, wherein when the operator selects, e.g., a diffraction spot (A) on the display unit, the movement unit moves the diaphragm from the positional relationship between the diaphragm and the image in accordance with the position of the diffraction spot (A).

Abstract: The present invention is intended to reduce drift in a sample which occurs because of distortion in an O-ring which seals off from the atmosphere a sample chamber in which vacuum is retained. Provided is an electron microscope, wherein a sample holder (2) is inserted in a column (1), comprising: an O-ring (4) which makes airtight the column (1) of the electron microscope and the sample holder (2); a slider tube (30) which slides in the longitudinal direction of the sample holder (2) and positions the sample holder in the longitudinal direction; a bellows (32) which makes airtight the slider tube (30) and the column (1); a means (10) for driving the slider (30) in the longitudinal direction of the sample holder (2); and a holder umping part (40) which positions the sample holder (2) in the longitudinal direction. The electron microscope further comprises a sample movement device which has an elastic material (31) which connects the holder umping part (40) and the slider tube (30).

Abstract: The electric charged particle beam microscope includes an electric charged particle source; a condenser lens converging electric charged particles emitted from the electric charged particle source on a specimen; a deflector scanning the converged electric charged particles over the specimen; a control unit of the deflector; a specimen stage on which the specimen is mounted; a detector detecting the electric charged particles; a computer forming an image from a control signal from the deflector and an output signal from the detector; and a display part connected with the computer. The control unit of the deflector can change the scan rate of the electric charged particles. A first rate scan image is obtained at a first rate and a second rate scan image is obtained at a second rate slower than the first rate.

Abstract: An apparatus that can capture a rotation series of images of an observation area within a range of ?180° to +180° around the x axis thereof, and can capture a rotation series of images of the observation area within a range of ?180° to +180° around the y axis thereof.

Abstract: It is an object of the present invention to provide a noise-proof cover and a charged particle beam apparatus that realize both of suppression of an image failure caused by a specific frequency and a reduction in size. To attain the object, the present invention proposes a noise-proof cover that surrounds a charged particle beam apparatus, the noise-proof cover including a hollow section forming member that forms a cylindrical body having a wall surface extending along an inner wall of the noise-proof cover, one end of the cylindrical body formed by the hollow section forming member being opened and the other end of the cylindrical section being closed, and the charged particle beam apparatus surrounded by the noise-proof cover.

Abstract: The present invention relates to the acquisition of tilted series images of a minute sample in a short time. The present invention relates to: measuring in advance the relation between an amount of focus shift and a degree of coincidence at the time of acquiring tilted series images; calculating backwards a focus shift from the degree of coincidence on the basis of this relation; correcting the focus shift by controlling a stage, an objective lens, and the like; and thus acquiring the tilted series images. In addition, the present invention relates to: acquiring a reference image in advance at the time of photographing the tilted series images; obtaining the correlation between an acquired image and the reference image; and performing, if the degree of coincidence is equal to or smaller than a set value, processing such as the transmission of a warning message and the stop of an image acquisition sequence.

Abstract: There is provided an apparatus that can capture a rotation series of images of an observation area within a range of ?180° to +180° around the x axis thereof, and can capture a rotation series of images of the observation area within a range of ?180° to +180° around the y axis thereof.

Abstract: Provided are a resin tube for a guide wire, a method for manufacturing a resin tube for a guide wire, and a guide wire, configured such that the resin tube makes point contact in the axial direction with an object of contact at working site, thereby reducing frictional resistance and yielding excellent sliding properties, while also being prevented from kinking and collapsing, and having excellent buckling resistance. The resin tube for a guide wire is characterized in that the outer shape of a cross-section perpendicular to the axial direction is polygonal, elliptic, or irregular, that the resin tube is twisted in a helical shape about a deep inner-core hole as the axis of twisting, the deep inner-core hole extending in the axial direction and allowing a core wire to be inserted therein, and that the resin tube is provided with a trunk section having an undulation on the outer surface caused by the twisted eccentric wall thickness.