Patents by Inventor Hideki Makabe

Hideki Makabe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4945551
    Abstract: A soft X-ray lithographic system for making a reduced copy of a pattern is described. The system contains a source of soft X-rays, a spherical concave reflector which convergently projects the soft X-rays from the emitting means through a pattern to be copied and a Fresnel zone plate which focuses and reduces the beam of soft X-rays convergently projected through the pattern.
    Type: Grant
    Filed: November 14, 1989
    Date of Patent: July 31, 1990
    Assignee: Shimadzu Corporation
    Inventors: Hideki Makabe, Kenji Iwahashi
  • Patent number: 4482245
    Abstract: An apparatus for measuring a diamond color comprises a light source composed of a lamp and an integrating sphere for diffusing light therein emitted from the lamp; a diamond holder including diamond supporting head means and suction base means, thereby positioning the table facet of the diamond in the integrating sphere for allowing the diffused light from the light source to fall on the table facet of the diamond; a monochromator for separating a beam of light as it emerges from the diamond through the table facet side into a spectrum; a photodetector for detecting the light from the monochromator; variable slit means disposed in at least one of the monochromator and the photodetector for adjusting the size of the beam of light to a diameter of the diamond; a measurement unit for controlling at least the monochromator to obtain a spectrum of the light which has passed through the diamond; and an arithmetic unit for deriving tristimulus values X, Y and Z from the spectrum of the light from the diamond; which
    Type: Grant
    Filed: November 26, 1982
    Date of Patent: November 13, 1984
    Assignee: Kalnew Optical Industrial Co., Ltd.
    Inventors: Hideki Makabe, Toyoji Yamamoto, Yoshio Matsueda, Yasunori Ito, Katsuto Yamada
  • Patent number: 3994587
    Abstract: Densitometer for quantitative determination of the content of a sample spot on a TLC plate or the like, wherein dualwavelength zigzag scanning is conducted on the spot. Light reflected and transmitted by the sample is received by photometers, and compensation based on Kubelka-Munk's theoretical equations is made on the photometer output so that the output is substantially proportional to the quantity of the substance in the spot being scanned.
    Type: Grant
    Filed: July 22, 1975
    Date of Patent: November 30, 1976
    Assignee: Shimadzu Seisakusho Ltd.
    Inventors: Hiroshi Yamamoto, Takashi Kurita, Jugoro Suzuki, Rikuo Hira, Hideki Makabe