Patents by Inventor Hideki Yabushita

Hideki Yabushita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8225668
    Abstract: An ultrasonic wave propagating method capable of propagating plate waves between a probe and a test piece despite variations in the thickness or the surface angle of a test piece, and an ultrasonic propagating device and an ultrasonic testing device using this method. Ultrasonic waves are propagated between a probe (20) for transmitting or receiving ultrasonic waves and a test piece (100) for propagating plate waves. When propagating ultrasonic waves, a probe that can set an ultrasonic wave incident angle from the probe (20) to the test piece (100) and/or an ultrasonic wave receivable angle from the test piece to the probe in a plurality of states is used. A focal point type probe may be used as the above probe (20).
    Type: Grant
    Filed: June 30, 2006
    Date of Patent: July 24, 2012
    Assignees: Independent Administrative Institution Japan Aerospace Exploration Agency, Non-Destructive Inspection Company Limited
    Inventors: Hideki Yabushita, Tatsuyuki Nagai, Shigeyuki Matsubara, Norio Nemoto, Hiroshi Miyamoto
  • Patent number: 8024975
    Abstract: An ultrasonic wave is sent from a transmission element to a test element to produce a plate wave in the test element, and the plate wave propagating through the test element is received by a reception element to thereby test the test element on the propagation route of the plate wave. The other probe that is the other reception element or transmission element is disposed between the transmission element and the reception element. A probe holding mechanism that has support legs contacting the surface of the test element and keeps constant an angle of the other probe with respect to the surface of the test element is allowed to support the other probe. And, the other probe is allowed to cross over in non-contact the propagation route of the plate wave extending from the transmission element to the reception element by means of support legs.
    Type: Grant
    Filed: June 30, 2006
    Date of Patent: September 27, 2011
    Assignees: Independent Administrative Institution Japan Aerospace Exploration Agency, Non-Destructive Inspection Company Limited
    Inventors: Hideki Yabushita, Tatsuyuki Nagai, Shigeyuki Matsubara, Norio Nemoto, Hiroshi Miyamoto
  • Publication number: 20090165561
    Abstract: An ultrasonic wave propagating method capable of propagating plate waves between a probe and a test piece despite variations in the thickness or the surface angle of a test piece, and an ultrasonic propagating device and an ultrasonic testing device using this method. Ultrasonic waves are propagated between a probe (20) for transmitting or receiving ultrasonic waves and a test piece (100) for propagating plate waves. When propagating ultrasonic waves, a probe that can set an ultrasonic wave incident angle from the probe (20) to the test piece (100) and/or an ultrasonic wave receivable angle from the test piece to the probe in a plurality of states is used. A focal point type probe may be used as the above probe (20).
    Type: Application
    Filed: June 30, 2006
    Publication date: July 2, 2009
    Inventors: Hideki Yabushita, Tatsuyuki Nagai, Shigeyuki Matsubara, Norio Nemoto, Hiroshi Miyamoto
  • Publication number: 20080302188
    Abstract: A ultrasonic testing method capable of carrying out a test of high degree of freedom where a degree of freedom of arranging a transmission element and a reception element is high and the scope of an object of testing is not likely to be limited, and a ultrasonic testing device using this. An ultrasonic wave is sent from a transmission element (20) to a test element (100) to produce a plate wave in the test element, and the plate wave propagating through the test element is received by a reception element (30) to thereby test the test element on the propagation route of the plate wave. The other probe that is the other reception element (20) or transmission element (30) is disposed between the transmission element (20) and the reception element (30). A probe holding mechanism (40) that has support legs (46) contacting the surface of the test element and keeps constant an angle of the other probe with respect to the surface of the test element is allowed to support the other probe.
    Type: Application
    Filed: June 30, 2006
    Publication date: December 11, 2008
    Applicant: Independent Administrative Institution Japan Aerospace Explaration Agency
    Inventors: Hideki Yabushita, Tatsuyuki Nagai, Shigeyuki Matsubara, Norio Nemoto, Hiroshi Miyamoto