Patents by Inventor Hideko TANAKA

Hideko TANAKA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Analysis device, liquefied gas production plant, and property analysis method
    Patent number: 11885741
    Abstract: A measurement device includes: a container into which sample gas is to be injected; a liquefaction mechanism configured to liquefy the sample gas in the container; a near-infrared probe extending from inside to outside the container; and a near-infrared measuring instrument configured to measure an absorbance spectrum of the sample gas in a state of being liquefied by the liquefaction mechanism, via the near-infrared probe.
    Type: Grant
    Filed: April 22, 2022
    Date of Patent: January 30, 2024
    Assignee: Yokogawa Electric Corporation
    Inventors: Ryota Sakai, Hideko Tanaka, Youko Nozawa, Toshiki Ohara
  • ANALYSIS DEVICE, LIQUEFIED GAS PRODUCTION PLANT, AND PROPERTY ANALYSIS METHOD
    Publication number: 20220244175
    Abstract: A measurement device includes: a container into which sample gas is to be injected; a liquefaction mechanism configured to liquefy the sample gas in the container; a near-infrared probe extending from inside to outside the container; and a near-infrared measuring instrument configured to measure an absorbance spectrum of the sample gas in a state of being liquefied by the liquefaction mechanism, via the near-infrared probe.
    Type: Application
    Filed: April 22, 2022
    Publication date: August 4, 2022
    Inventors: Ryota SAKAI, Hideko TANAKA, Youko NOZAWA, Toshiki OHARA
  • Measurement device, calibration curve generation system, spectrum measurement method, calibration curve generation method, analysis device, liquefied gas production plant, and property analysis method
    Patent number: 11340159
    Abstract: A measurement device includes: a container into which sample gas is to be injected; a liquefaction mechanism configured to liquefy the sample gas in the container; a near-infrared probe extending from inside to outside the container; and a near-infrared measuring instrument configured to measure an absorbance spectrum of the sample gas in a state of being liquefied by the liquefaction mechanism, via the near-infrared probe.
    Type: Grant
    Filed: December 19, 2019
    Date of Patent: May 24, 2022
    Assignee: Yokogawa Electric Corporation
    Inventors: Ryota Sakai, Hideko Tanaka, Youko Nozawa, Toshiki Ohara
  • Testing method and testing system
    Patent number: 11150182
    Abstract: A method for testing an analysis apparatus that analyzes a first fluid flowing through a pipe using light that has passed through a probe attached to and disposed inside the pipe such that a portion of a light path passes outside a housing of the probe. The method includes: after a second fluid that absorbs less of the light than the first fluid has been introduced into the pipe, introducing a third fluid having predetermined absorption characteristics into the housing of the probe; and analyzing the absorption characteristics of the third fluid using the light that has passed through the probe.
    Type: Grant
    Filed: September 5, 2018
    Date of Patent: October 19, 2021
    Assignee: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yoshihisa Hidaka, Gen Matsuno, Shigeru Takezawa, Hideko Tanaka, Kaori Sakuma, Akihiro Murata, Toshiki Ohara
  • TESTING METHOD AND TESTING SYSTEM
    Publication number: 20200256792
    Abstract: A method for testing an analysis apparatus that analyzes a first fluid flowing through a pipe using light that has passed through a probe attached to and disposed inside the pipe such that a portion of a light path passes outside a housing of the probe. The method includes: after a second fluid that absorbs less of the light than the first fluid has been introduced into the pipe, introducing a third fluid having predetermined absorption characteristics into the housing of the probe; and analyzing the absorption characteristics of the third fluid using the light that has passed through the probe.
    Type: Application
    Filed: September 5, 2018
    Publication date: August 13, 2020
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Yoshihisa Hidaka, Gen Matsuno, Shigeru Takezawa, Hideko Tanaka, Kaori Sakuma, Akihiro Murata, Toshiki Ohara
  • MEASUREMENT DEVICE, CALIBRATION CURVE GENERATION SYSTEM, SPECTRUM MEASUREMENT METHOD, CALIBRATION CURVE GENERATION METHOD, ANALYSIS DEVICE, LIQUEFIED GAS PRODUCTION PLANT, AND PROPERTY ANALYSIS METHOD
    Publication number: 20200209153
    Abstract: A measurement device includes: a container into which sample gas is to be injected; a liquefaction mechanism configured to liquefy the sample gas in the container; a near-infrared probe extending from inside to outside the container; and a near-infrared measuring instrument configured to measure an absorbance spectrum of the sample gas in a state of being liquefied by the liquefaction mechanism, via the near-infrared probe.
    Type: Application
    Filed: December 19, 2019
    Publication date: July 2, 2020
    Inventors: Ryota SAKAI, Hideko TANAKA, Youko NOZAWA, Toshiki OHARA