Patents by Inventor Hidemi Kawashima

Hidemi Kawashima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor testing apparatus
    Patent number: 6255844
    Abstract: A semiconductor testing apparatus capable of simultaneously testing a plurality of devices 3 to be tested to which a plurality of testing circuit blocks are allotted, respectively, comprising an arithmetic circuit 6 for receiving all outputs from the plurality of testing circuit blocks to compute the decision results from the plurality of devices.
    Type: Grant
    Filed: January 21, 2000
    Date of Patent: July 3, 2001
    Assignee: Ando Electric Co., Ltd.
    Inventor: Hidemi Kawashima