Patents by Inventor Hidemichi Komura

Hidemichi Komura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6629058
    Abstract: A fault diagnosis apparatus comprises a vibration sensor for detecting vibration waveforms being generating by machinery or equipment, a cumulative frequency computing device for obtaining a cumulative frequency distribution curve of an absolute value of the vibration waveforms detected by the vibration sensor, a maximum value detecting device for obtaining a maximum value xp of the vibration waveforms detected by the vibration sensor, a peak ratio computing device for obtaining the peak ratio &bgr;1 of an equivalent effective value &sgr;eq in the cumulative frequency distribution curve computed by the cumulative frequency computing device to the maximum value xp computed by the maximum value detecting device, and a fault diagnosing device for diagnosing the degree of fault of the machinery or equipment from the magnitude of the peak ratio &bgr;1 computed by the peak ratio computing device.
    Type: Grant
    Filed: April 17, 2001
    Date of Patent: September 30, 2003
    Assignee: Rion Co., Ltd.
    Inventors: Hidemichi Komura, Kazuo Shibata, Kazuhiro Shimomura
  • Patent number: 6498992
    Abstract: A method for diagnosis of a defect of an object to be inspected, such as a rotational machine, etc., by measuring a vibration generated thereby, wherein a measured signal generated by the object is detected, an amplitude probability density function of wave-form of the obtained measured signal is expanded orthogonally through a Gram-Charlier series, and the Gram-Charlier series are calculated so as to make diagnosis of defect(s) in the object to be inspected.
    Type: Grant
    Filed: April 13, 1999
    Date of Patent: December 24, 2002
    Assignee: Rion Co. Ltd.
    Inventors: Toshio Toyota, Tomoya Niho, Hou Jinyama, Hidemichi Komura
  • Publication number: 20010037180
    Abstract: A fault diagnosis apparatus comprises a vibration sensor for detecting vibration waveforms being generating by machinery or equipment, a cumulative frequency computing device for obtaining a cumulative frequency distribution curve of an absolute value of the vibration waveforms detected by the vibration sensor, a maximum value detecting device for obtaining a maximum value xp of the vibration waveforms detected by the vibration sensor, a peak ratio computing device for obtaining the peak ratio &bgr;1 of an equivalent effective value &sgr;eq in the cumulative frequency distribution curve computed by the cumulative frequency computing device to the maximum value xp computed by the maximum value detecting device, and a fault diagnosing device for diagnosing the degree of fault of the machinery or equipment from the magnitude of the peak ratio &bgr;1 computed by the peak ratio computing device.
    Type: Application
    Filed: April 17, 2001
    Publication date: November 1, 2001
    Inventors: Hidemichi Komura, Kazuo Shibata, Kazuhiro Shimomura
  • Patent number: 5396801
    Abstract: A hand-held vibrometer for measuring vibration at a surface of a vibrating object includes plural vibration sensors, each of which has a respective axis of measurement. The vibration sensors are mounted on a rigid body so that the respective axes of measurement of the sensors intersect at a contact point on the rigid body, which contact point is to be applied to the vibrating object. The contact point is at a central axis of the rigid body and the respective axes of measurement of the vibration sensors all intersect the central axis of the rigid body at the same angle. Respective amounts of vibration in the vibrating object in three orthogonal measurement axes are calculated on the basis of output signals provided from the plurality of vibration sensors. The above-described arrangement of the vibration sensors increases the contact resonance frequency, and consequently the measurement range, of the vibrometer.
    Type: Grant
    Filed: November 9, 1993
    Date of Patent: March 14, 1995
    Assignee: Rion Kabushiki Kaisha
    Inventor: Hidemichi Komura