Abstract: A semiconductor device includes: a substrate having a lower surface and a side surface and the substrate containing a semiconductor material; and an electrode provided on the lower surface, wherein the side surface has a first side surface portion, a second side surface portion provided on the first side surface portion, and a third side surface portion provided on the second side surface portion, the third side surface portion protrudes in a plane parallel to the lower surface more than the second side surface portion, and the first side surface portion protrudes in a plane parallel to the lower surface more than the third side surface portion.

Abstract: A semiconductor device includes a semiconductor part, a metal layer, first and second electrodes, and first and second control electrodes. The first and second electrodes are provided on a front surface of the semiconductor part and arranged along the front surface of the semiconductor part. The first control electrode is provided between the semiconductor part and the first electrode. The second control electrode is provided between the semiconductor part and the second electrode. The metal layer covers a back-surface of the semiconductor part. The metal layer includes a first layer and a second layer. The first layer of the metal layer is electrically connected to the semiconductor part. The second layer of the metal layer is provided on the first layer inside a periphery of the first layer. The second layer has a layer thickness thicker than a layer thickness of the first layer.

Abstract: A semiconductor device includes a semiconductor part, a metal layer, first and second electrodes, and first and second control electrodes. The first and second electrodes are provided on a front surface of the semiconductor part and arranged along the front surface of the semiconductor part. The first control electrode is provided between the semiconductor part and the first electrode. The second control electrode is provided between the semiconductor part and the second electrode. The metal layer covers a back-surface of the semiconductor part. The metal layer includes a first layer and a second layer. The first layer of the metal layer is electrically connected to the semiconductor part. The second layer of the metal layer is provided on the first layer inside a periphery of the first layer. The second layer has a layer thickness thicker than a layer thickness of the first layer.

Abstract: A semiconductor device includes a substrate, a semiconductor body and a metal layer between the substrate and the semiconductor body. The device further includes first and second electrodes, a first control electrode between the semiconductor body and the first electrode; and a second control electrode between the semiconductor body and the second electrode. The semiconductor body includes a first to fifth semiconductor layers. The second semiconductor layer is provided between the first semiconductor layer and the first electrode. The third semiconductor layer is selectively provided between the second semiconductor layer and the first electrode. The fourth semiconductor layer is provided between the first semiconductor layer and the second electrode. The fifth semiconductor layer selectively provided between the fourth semiconductor layer and the second electrode. The first, third and fifth semiconductor layers are of a first conductivity type.

Abstract: A semiconductor device includes a substrate, a semiconductor body and a metal layer between the substrate and the semiconductor body. The device further includes first and second electrodes, a first control electrode between the semiconductor body and the first electrode; and a second control electrode between the semiconductor body and the second electrode. The semiconductor body includes a first to fifth semiconductor layers. The second semiconductor layer is provided between the first semiconductor layer and the first electrode. The third semiconductor layer is selectively provided between the second semiconductor layer and the first electrode. The fourth semiconductor layer is provided between the first semiconductor layer and the second electrode. The fifth semiconductor layer selectively provided between the fourth semiconductor layer and the second electrode. The first, third and fifth semiconductor layers are of a first conductivity type.