Patents by Inventor Hidenori Horiuchi

Hidenori Horiuchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Comparison type dimension measuring method and apparatus using a laser beam in a microscope system
    Patent number: 4650335
    Abstract: A comparison-type dimension measurement system in which a laser 1 provides linearly polarized light that is directed by a polarization beam splitter 5 into a microscope system in which a specimen 13 is mounted. The reflected polarized light is rotated 90.degree. by a quarter wave plate 9 and passes through the beam splitter to a multi-element line sensor 19. The laser light is scanned by a rotatable mirror 3 over the specimen. Threshold intensities are determined on indicia of known separation on a reference specimen and used to calibrate the distance measured by the line sensor.
    Type: Grant
    Filed: November 30, 1983
    Date of Patent: March 17, 1987
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Tokuhisa Ito, Goro Kitamura, Hidenori Horiuchi, Masaaki Aoyama
  • Automatic focusing device in microscope system
    Patent number: 4625103
    Abstract: An automatic focusing device for vertical focusing of a specimen 23 in which an enlarging condenser lens 11 is placed between a light source 12 and a half mirror 7 in an automatic focus detecting system so that an enlarged image 24 of the light source is presented to an objective 1 of the focusing microscope M.
    Type: Grant
    Filed: November 30, 1983
    Date of Patent: November 25, 1986
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Goro Kitamura, Hidenori Horiuchi, Masaaki Aoyama, Tokuhisa Ito