Patents by Inventor Hidenori Nanba

Hidenori Nanba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7645986
    Abstract: An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the mass spectrometer. A gate electrode is located at a stage before an acceleration region that is located before an emitter for emitting ions. This gate electrode is capable of applying the voltage that is set on a mass-number region basis, and is also capable of separating desired ions to be measured on the basis of the mass number by switching the gate electrode at high speed. Therefore, it is possible to improve the resolution.
    Type: Grant
    Filed: April 25, 2008
    Date of Patent: January 12, 2010
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiromichi Kikuma, Hidenori Nanba, Akimasa Osaka
  • Publication number: 20080203292
    Abstract: An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the mass spectrometer. A gate electrode is located at a stage before an acceleration region that is located before an emitter for emitting ions. This gate electrode is capable of applying the voltage that is set on a mass-number region basis, and is also capable of separating desired ions to be measured on the basis of the mass number by switching the gate electrode at high speed. Therefore, it is possible to improve the resolution.
    Type: Application
    Filed: April 25, 2008
    Publication date: August 28, 2008
    Inventors: Hiromichi Kikuma, Hidenori Nanba, Akimasa Osaka
  • Patent number: 7375318
    Abstract: An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the mass spectrometer. A gate electrode is located at a stage before an acceleration region that is located before an emitter for emitting ions. This gate electrode is capable of applying the voltage that is set on a mass-number region basis, and is also capable of separating desired ions to be measured on the basis of the mass number by switching the gate electrode at high speed. Therefore, it is possible to improve the resolution.
    Type: Grant
    Filed: January 26, 2007
    Date of Patent: May 20, 2008
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiromichi Kikuma, Hidenori Nanba, Akimasa Osaka
  • Publication number: 20080073513
    Abstract: An object of the present invention is to provide a mass spectrometer that uses a time-of-flight mass spectrometer for performing mass spectrometry on the basis of the difference in flight time based on mass of desired ions, and that is suitable for improving the sensitivity and analysis precision of the mass spectrometer. A gate electrode is located at a stage before an acceleration region that is located before an emitter for emitting ions. This gate electrode is capable of applying the voltage that is set on a mass-number region basis, and is also capable of separating desired ions to be measured on the basis of the mass number by switching the gate electrode at high speed. Therefore, it is possible to improve the resolution.
    Type: Application
    Filed: January 26, 2007
    Publication date: March 27, 2008
    Inventors: Hiromichi Kikuma, Hidenori Nanba, Akimasa Osaka