Patents by Inventor Hideo ICHIMARU

Hideo ICHIMARU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of propagation test on battery system
    Patent number: 10418669
    Abstract: A method of propagation test on a battery system has: a main irradiation step of irradiating a laser beam in prescribed conditions, on a light-receiving part of the outer member of a light-receiving cell, or on a light-receiving part which is arranged in contact with the outer member of the light-receiving cell, thereby to heat the light-receiving cell; a thermal runaway confirming step of confirming a thermal runaway of the light-receiving cell; an irradiation stopping step of stopping the laser-beam irradiation after the thermal runaway was confirmed in the thermal runaway confirming step; and a system integrity inspection step of inspecting an integrity of the cells other than the light-receiving cell after the irradiation stopping step. The prescribed conditions are conditions in which a melted scar is formed on the light-receiving part.
    Type: Grant
    Filed: August 3, 2016
    Date of Patent: September 17, 2019
    Assignee: Japan Electrical Safety & Environment Technology Laboratories
    Inventors: Keizoh Honda, Hideki Tsuruga, Masachika Kodama, Takeshi Senoo, Kenji Nishioka, Hideo Ichimaru
  • METHOD OF PROPAGATION TEST ON BATTERY SYSTEM
    Publication number: 20170059500
    Abstract: A method of propagation test on a battery system has: a main irradiation step of irradiating a laser beam in prescribed conditions, on a light-receiving part of the outer member of a light-receiving cell, or on a light-receiving part which is arranged in contact with the outer member of the light-receiving cell, thereby to heat the light-receiving cell; a thermal runaway confirming step of confirming a thermal runaway of the light-receiving cell; an irradiation stopping step of stopping the laser-beam irradiation after the thermal runaway was confirmed in the thermal runaway confirming step; and a system integrity inspection step of inspecting an integrity of the cells other than the light-receiving cell after the irradiation stopping step. The prescribed conditions are conditions in which a melted scar is formed on the light-receiving part.
    Type: Application
    Filed: August 3, 2016
    Publication date: March 2, 2017
    Applicant: Japan Electrical Safety & Environment Technology Laboratories
    Inventors: Keizoh HONDA, Hideki TSURUGA, Masachika KODAMA, Takeshi SENOO, Kenji NISHIOKA, Hideo ICHIMARU