Patents by Inventor Hideo Kanda

Hideo Kanda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100091299
    Abstract: The relative position of a test surface is sequentially changed from a reference position where a surface central axis is aligned with a measurement optical axis such that the measurement optical axis is sequentially moved to a plurality of annular regions obtained by dividing the test surface in a diametric direction. The test surface is rotated on a rotation axis whenever the relative position is changed. Measurement light composed of a plane wave is radiated to the rotating test surface, and a one-dimensional image sensor captures interference fringes at each of a plurality of rotational positions. The shape information of each annular region is calculated on the basis of the captured interference fringes at each rotational position, and the shape information is connected to calculate the shape information of the entire measurement region.
    Type: Application
    Filed: October 14, 2009
    Publication date: April 15, 2010
    Inventors: Zongtao GE, Hideo Kanda, Takayuki Saito, Noboru Koizumi
  • Publication number: 20100033831
    Abstract: A liquid crystal sealing apparatus that radiates light to a sealing layer for sealing liquid crystal between a pair of substrates to cure the sealing layer includes: a laser beam source that emits laser beams as the light; and an optical system V that shapes the laser beams such that regions irradiated with the laser beams emitted from the laser beam source are substantially identical to the shape of the sealing layer. According to the liquid crystal sealing apparatus, since laser beams are used as light, it is possible to substantially restrict the irradiation regions to the sealing layer. Therefore, a mask for covering a liquid crystal region is not needed, and it is possible to radiate light with sufficiently high intensity to the sealing layer. As a result, it is possible to reliably seal the liquid crystal.
    Type: Application
    Filed: June 29, 2009
    Publication date: February 11, 2010
    Inventors: Hidenori TAKAHASHI, Hideo KANDA
  • Patent number: 7092104
    Abstract: In a speckle interferometer apparatus 2, an optical member mounting device 10 mounted with optical members including a pair of luminous flux outputting devices 9a, 9b, 9c, 9d is disposed on the object side of a main unit of an imaging device 3 while being separated from the imaging device 3. A light-transmitting area 14 is formed between the pair of luminous flux outputting devices 9a, 9b, 9c, 9d so as to transmit therethrough interference light from an object surface.
    Type: Grant
    Filed: February 18, 2004
    Date of Patent: August 15, 2006
    Assignee: Fujinon Corporation
    Inventors: Masatoshi Hizuka, Hideo Kanda, Takayuki Saito
  • Patent number: 6912055
    Abstract: Respective regional form information items obtained from regional interference fringe images corresponding to partial regions of a spherical surface to be inspected are transformed into regional synthesis form information items corresponding to a common coordinate system set for aperture synthesis by using a relationship among a polar coordinate system of the spherical surface, a plane coordinate system of an imaging plane, and the common coordinate system. Thus obtained regional synthesis form information items are subjected to aperture synthesis processing, so as to determine the overall form information of the spherical surface.
    Type: Grant
    Filed: March 14, 2003
    Date of Patent: June 28, 2005
    Assignee: Fujinon Corporation
    Inventors: Nobuaki Ueki, Hideo Kanda
  • Patent number: 6798585
    Abstract: A reference lens for an interferometer is constructed so that light transmitted by a partially reflecting reference spherical surface may be converged, toward a focal point that coincides with the center of curvature of the reference spherical surface, and reflected from a subject spherical surface that also has its center of curvature at the focal point. Measurement of the shape of the subject spherical surface is possible based on the interference of two light beams, one reflected by the subject spherical surface and one reflected by the reference spherical surface. The reference lens, which may include five or six lens components or lens elements, includes a negative meniscus lens component, a positive lens group, and a positive lens component. Specified conditions are satisfied to provide a reference lens that has favorable correction of aberrations, is compact, and can measure the surface accuracy of a wide range of convex spherical surfaces.
    Type: Grant
    Filed: January 21, 2003
    Date of Patent: September 28, 2004
    Assignee: Fuji Photo Optical Co., Ltd.
    Inventor: Hideo Kanda
  • Publication number: 20040179204
    Abstract: In a speckle interferometer apparatus 2, an optical member mounting device 10 mounted with optical members including a pair of luminous flux outputting devices 9a, 9b, 9c, 9d is disposed on the object side of a main unit of an imaging device 3 while being separated from the imaging device 3. A light-transmitting area 14 is formed between the pair of luminous flux outputting devices 9a, 9b, 9c, 9d so as to transmit therethrough interference light from an object surface.
    Type: Application
    Filed: February 18, 2004
    Publication date: September 16, 2004
    Applicant: Fuji Photo Optical Co., Ltd.
    Inventors: Masatoshi Hizuka, Hideo Kanda, Takayuki Saito
  • Patent number: 6744523
    Abstract: An imaging optical system for an oblique incidence interferometer comprises first and second optical systems and an intermediate imaging surface therebetween. Each of the first and second imaging optical systems comprises two telecentric lenses, arranged afocal to each other, having respective focal lengths different from each other. A first image of a surface to be inspected having a deformed aspect ratio with respect to this surface is formed on the intermediate imaging surface by way of the first imaging optical system. The second imaging optical system is arranged such that the first image is focused onto the imaging surface of the interferometer as a second image corrected so as to have substantially the same aspect ratio as that of the surface to be inspected.
    Type: Grant
    Filed: March 26, 2002
    Date of Patent: June 1, 2004
    Assignee: Fuji Photo Optical Co., Ltd.
    Inventors: Nobuaki Ueki, Hideo Kanda
  • Patent number: 6643026
    Abstract: In an optical system for an oblique incidence interferometer, first and second prisms are used for luminous flux dividing and for luminous flux combining, respectively. Reference light and measurement light are separated from each other at a surface where collimated coherent light enters or exits from the first prism, whereas the reference light and measurement light are combined together at a surface where the measurement light enters or exits from the second prism.
    Type: Grant
    Filed: February 9, 2001
    Date of Patent: November 4, 2003
    Assignee: Fuji Photo Optical Co., Ltd.
    Inventors: Hideo Kanda, Fumio Watanabe, Fumio Kobayashi
  • Publication number: 20030184763
    Abstract: Respective regional form information items obtained from regional interference fringe images corresponding to partial regions of a spherical surface to be inspected are transformed into regional synthesis form information items corresponding to a common coordinate system set for aperture synthesis by using a relationship among a polar coordinate system of the spherical surface, a plane coordinate system of an imaging plane, and the common coordinate system. Thus obtained regional synthesis form information items are subjected to aperture synthesis processing, so as to determine the overall form information of the spherical surface.
    Type: Application
    Filed: March 14, 2003
    Publication date: October 2, 2003
    Applicant: Fuji Photo Optical Co., Ltd.
    Inventors: Nobuaki Ueki, Hideo Kanda
  • Publication number: 20030147152
    Abstract: A reference lens for an interferometer is constructed so that light transmitted by a partially reflecting reference spherical surface may be converged, toward a focal point that coincides with the center of curvature of the reference spherical surface, and reflected from a subject spherical surface that also has its center of curvature at the focal point. Measurement of the shape of the subject spherical surface is possible based on the interference of two light beams, one reflected by the subject spherical surface and one reflected by the reference spherical surface. The reference lens, which may include five or six lens components or lens elements, includes a negative meniscus lens component, a positive lens group, and a positive lens component. Specified conditions are satisfied to provide a reference lens that has favorable correction of aberrations, is compact, and can measure the surface accuracy of a wide range of convex spherical surfaces.
    Type: Application
    Filed: January 21, 2003
    Publication date: August 7, 2003
    Inventor: Hideo Kanda
  • Patent number: 6570661
    Abstract: In an interferometer optical system comprising a reference standard having an entrance surface on which a luminous flux from a light source is incident and a reference plane on which the luminous flux entering from the entrance surface is obliquely incident, an angle within the range of 10° to 30° is formed between the entrance surface and reference plane of the reference standard.
    Type: Grant
    Filed: December 18, 2000
    Date of Patent: May 27, 2003
    Assignee: Fuji Photo Optical Co., Ltd.
    Inventors: Hideo Kanda, Fumio Watanabe
  • Publication number: 20020140944
    Abstract: An imaging optical system for an oblique incidence interferometer comprises first and second optical systems and an intermediate imaging surface therebetween. Each of the first and second imaging optical systems comprises two telecentric lenses, arranged afocal to each other, having respective focal lengths different from each other. A first image of a surface to be inspected having a deformed aspect ratio with respect to this surface is formed on the intermediate imaging surface by way of the first imaging optical system. The second imaging optical system is arranged such that the first image is focused onto the imaging surface of the interferometer as a second image corrected so as to have substantially the same aspect ratio as that of the surface to be inspected.
    Type: Application
    Filed: March 26, 2002
    Publication date: October 3, 2002
    Applicant: Fuji Photo Optical Co., Ltd.
    Inventors: Nobuaki Ueki, Hideo Kanda
  • Patent number: 6297916
    Abstract: An imaging lens having three lens groups is designed so that image aberrations of an object at infinity (i.e, a collimated beam) and of an object at a finite distance are very well-corrected so that the imaging lens is particularly suitable for use imaging interference patterns formed on a screen by a grazing incidence interferometer. The imaging lens is composed of the following lens components, in successive order from the most object side: a first lens component having an overall meniscus shape with its concave surface on the object side, a second lens component having negative or positive refractive power, and a third lens component of positive or negative refractive power. The refractive power of the second lens component and the third lens component are always of opposite sign, and specified conditions are satisfied in order to assure high quality imaging. Each lens component may be formed of a single lens element or of multiple lens elements.
    Type: Grant
    Filed: March 13, 2000
    Date of Patent: October 2, 2001
    Assignee: Fuji Photo Optical Co., Ltd.
    Inventors: Hideo Kanda, Noboru Koizumi
  • Publication number: 20010017697
    Abstract: In an optical system for an oblique incidence interferometer, first and second prisms are used as luminous flux dividing means and luminous flux combining means, respectively. Reference light and measurement light are separated from each other at a surface where collimated coherent light enters or exits from the first prism, whereas the reference light and measurement light are combined together at a surface where the measurement light enters or exits from the second prism.
    Type: Application
    Filed: February 9, 2001
    Publication date: August 30, 2001
    Applicant: Fuji photo optical Co., Ltd.
    Inventors: Hideo Kanda, Fumio Watanabe, Fumio Kobayashi
  • Publication number: 20010007502
    Abstract: In an interferometer optical system comprising a reference standard having an entrance surface on which a luminous flux from a light source is incident and a reference plane on which the luminous flux entering from the entrance surface is obliquely incident, an angle within the range of 10° to 30° is formed between the entrance surface and reference plane of the reference standard.
    Type: Application
    Filed: December 18, 2000
    Publication date: July 12, 2001
    Inventors: Hideo Kanda, Fumio Watanabe
  • Patent number: 3974467
    Abstract: A long flexible waveguide is fabricated by corrugating a thin-walled tube circular in section and then molding the corrugated tube so as to make the shape of its section substantially rectangular. The long flexible waveguide has a substantially rectangular section wherein a corrugating pitch P falls within a range of .lambda..sub.g /10<P<2 K.sqroot.D.sup.. t where .lambda..sub.g denotes a wavelength in the waveguide, K a constant, D an outer diameter of the tube before the corrugation, and t a thickness of the wall of said tube, and wherein a radius of curvature R of each inside corner of the molded tube falls within a range of h .ltoreq.R .ltoreq.0.46 b where h denotes a depth of the corrugate form of said tube, and b a dimension of said tube on the side of a minor axis of said section. Rectangular waveguide thus fabricated has excellent electric characteristics and is produced under good working conditions.
    Type: Grant
    Filed: May 29, 1975
    Date of Patent: August 10, 1976
    Assignee: The Furukawa Electric Co., Ltd.
    Inventors: Susumu Tobita, Masashi Shimoishizaka, Isamu Oishi, Keiichi Miwa, Hideo Kanda