Abstract: The present invention is directed to carrying out a high density magnetic recording to a material having a large coercive force by perpendicular magnetic recording head. By giving a patterning onto a soft magnetic under layer of a perpendicular two-layer recording media in sync with a period of a recording bit, a magnetic field from a write head can be allowed to converge to a soft magnetic column. Therefore, a magnetization reversal of the magnetic recording media material having a large anisotropic constant becomes possible, and then a high density magnetic recording can be achieved.

Abstract: The present invention is directed to carrying out a high density magnetic recording to a material having a large coercive force by perpendicular magnetic recording head. By giving a patterning onto a soft magnetic under layer of a perpendicular two-layer recording media in sync with a period of a recording bit, a magnetic field from a write head can be allowed to converge to a soft magnetic column. Therefore, a magnetization reversal of the magnetic recording media material having a large anisotropic constant becomes possible, and then a high density magnetic recording can be achieved.

Abstract: The present invention is directed to-carrying out a high density magnetic recording to a material having a large coercive force by perpendicular magnetic recording head. By giving a patterning onto a soft magnetic under layer of a perpendicular two-layer recording media in sync with a period of a recording bit, a magnetic field from a write head can be allowed to converge to a soft magnetic column. Therefore, a magnetization reversal of the magnetic recording media material having a large anisotropic constant becomes possible, and then a high density magnetic recording can be achieved.

Abstract: The present invention is directed to-carrying out a high density magnetic recording to a material having a large coercive force by perpendicular magnetic recording head.

Abstract: A device for reducing the magnetic field, leaked from an electromagnetic lens, in the sample position of a scanning electron microscope, a sample is mounted on a sample cassette which is made of a material having high magnetic permeability, and a head portion of an electron optical system which is made of a material having high magnetic permeability is arranged on the sample side. A window for passing a probe beam therethrough is provided in a wall surface of the electron optical system. Both the sample cassette and the electron optical system head portion surround the sample to constitute a magnetic shield.

Abstract: A Wien filter is used with secondary electrons that are emitted from a primary electron beam scanning a sample surface in a scanning electron microscope (SEM) used as an energy analyzer or a spin rotater with charged particle beams. The beam is focussed into an interior area of the filter that has magnetic and electric fields generated to cross one another. The beam intersects the crossed fields perpendicularly. The faces of either the magnetic pole pieces or the electrodes have a shape approximating the shape of a portion of a hyperbola, while the other of the faces are substantially planar. Auxiliary electrodes extend parallel to the beam's path of travel between the electrodes. The filter provides a wide area that enables stigmatic focussing of a wide diameter beam.

Abstract: A measured electron beam having a polarization vector as represented by arrow is irradiated to a ferromagnetic target made of an iron single crystal through a polarization vector rotator comprising a magnetic field generation coil and an electrostatic lens. A magnetic field generator is coupled with the target and aligns the direction of magnetization of the target in a direction represented by arrow. An oscillator for providing a rotation signal of the polarization vector of the measured electron beam is connected to the polarization vector rotator. The current absorbed by the target is detected and amplified by a current amplifier. A lock-in amplifier detects the phase and the magnitude of an A.C. component using the signal from the oscillator as a reference signal. The magnitude of the D.C. component of the absorbed current is detected by a D.C. current detector.

Abstract: A spin-polarization detector having in a region applied with a high voltage a target for scattering a measured electron beam and an electron detector for detecting scattered electrons from the target is disclosed, in which a fluorescent screen is used as the electron detector, and a light pulse from the fluorescent screen is transmitted through an optical guide to a photodetector disposed in a region having the ground potential, to be converted into an electric signal. The spin-polarization detector is simple in structure, small in size, and low in manufacturing cost. Further, when a plurality of scattered-electron detecting systems each including the target and the fluorescent screen are piled in a spin-polarization detector, the detection efficiency of the spin-polarization detector will be greatly enhanced.