Patents by Inventor Hideshi Tsutsui

Hideshi Tsutsui has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods for managing examination of foreign matters in through holes
    Patent number: 6862089
    Abstract: A method for managing an apparatus for examination of foreign matters in through holes is provided which can readily judge the presence or absence of a change in the examination conditions in the apparatus for examining foreign matters in through holes, and efficiently conduct a management of the apparatus.
    Type: Grant
    Filed: October 24, 2001
    Date of Patent: March 1, 2005
    Assignee: Seiko Epson Corporation
    Inventors: Noboru Goto, Hideshi Tsutsui, Mikio Saito
  • Method for managing examination of foreign matters in through holes
    Publication number: 20020109837
    Abstract: It is an object to provide a method for managing an apparatus for examination of foreign matters in through holes, which can readily judge the presence or absence of a change in the examination conditions in the apparatus for examining foreign matters in through holes, and efficiently conduct a management of the apparatus.
    Type: Application
    Filed: October 24, 2001
    Publication date: August 15, 2002
    Inventors: Noboru Goto, Hideshi Tsutsui, Mikio Saito