Abstract: An electronic device includes a housing that houses a movable member inside the housing, and a shock absorbing member that reduces a shock to the movable member. The shock absorbing member holds the housing on an inner side of the shock absorbing member and includes at least one of a protrusion protruding in a direction along a movable direction of the movable member or a depression depressed in a direction along the movable direction on an outer side of the shock absorbing member.

Abstract: A spectroscope includes: a light incidence section that allows light from an outside to be incident; a diffraction grating that disperses wavelengths of the light incident on the diffraction grating by the light incidence section; a light reflector having a reflecting surface having an inclination variable around a rotation axis of the reflecting surface; and a light emitter that emits the light reflected by the light reflector to the outside. At least one of the light incidence section, the diffraction grating, and the light reflector, and the light emitter are changeable in a direction orthogonal to the rotation axis. The position of the light emitter is changeable in a direction along a center axis of the light emitted from the light emitter.

Abstract: An electronic device includes a housing that houses a movable member inside the housing, and a shock absorbing member that reduces a shock to the movable member. The shock absorbing member holds the housing on an inner side of the shock absorbing member and includes at least one of a protrusion protruding in a direction along a movable direction of the movable member or a depression depressed in a direction along the movable direction on an outer side of the shock absorbing member.

Abstract: A movable diffraction element and a spectroscope. The movable diffraction element includes a movable component having a comb-like shape, a supporting unit configured to support the movable component, a first cantilever actuator coupled to the supporting unit, a displacement determiner coupled to an edge of the first cantilever actuator, and a second cantilever actuator disposed parallel to the first cantilever actuator. In the movable diffraction element, a slope generated when the second cantilever actuator deforms is approximately equivalent to a slope generated at the first cantilever actuator. The spectroscope includes the movable diffraction element.

Abstract: (Object) To enable to provide a small-scale and low-cost spectrometer (Means of Achieving the Object) A spectrometer includes: a light incidence unit configured to allow incidence of light from outside; a diffraction grating configured to disperse, according to wavelength, the light that is incident through the light incidence unit; and a reflection unit including a reflection surface for reflecting the light that has been dispersed according to wavelength by the diffraction grating. Tilt of the reflection surface is changeable.

Abstract: To enable to provide a small-scale and low-cost spectrometer (Means of Achieving the Object) A spectrometer includes: a light incidence unit configured to allow incidence of light from outside; a diffraction grating configured to disperse, according to wavelength, the light that is incident through the light incidence unit; and a reflection unit including a reflection surface for reflecting the light that has been dispersed according to wavelength by the diffraction grating. Tilt of the reflection surface is changeable.

Abstract: A MEMS device includes a plurality of ribbon elements, a securing portion, and a plurality of connecting portions. The securing portion supports the plurality of ribbon elements. The plurality of connecting portions are disposed on ends of each of the plurality of ribbon elements and connect each of the plurality of ribbon elements to the securing portion. An angle formed by a longitudinal extending line of each of the plurality of ribbon elements and each of the plurality of connecting portions is greater than 0° in a planar direction of each of the plurality of ribbon elements.

Abstract: A frame, a spectroscope, a spectrometry unit, and an image forming apparatus. The frame has hollow structure and includes at least four apertures including a first aperture, a second aperture, a third aperture through which light enters the frame, and a fourth aperture, a concave diffraction grating disposed at a position of the first aperture, and a movable reflector disposed at a position of the second aperture to reflect light dispersed by the concave diffraction grating and change a reflection angle of the reflected light. Through the fourth aperture of the frame, the light reflected by the movable reflector exits the frame. The spectroscope includes the frame, and the frame further includes an optical entrance disposed at a position of the third aperture, and an optical exit disposed at a position of the fourth aperture.

Abstract: A spectrum measuring device including a ribbon element, a light detection element, and circuitry. The ribbon element includes a first light reflector including a plurality of first light reflection surfaces configured to be translated in an out-of-plane direction, and a second light reflector including a plurality of second light reflection surfaces that are fixed. The circuitry supplies a drive signal to the ribbon element in such a manner that a change of a displacement amount difference between the first light reflection surfaces and the second light reflection surfaces corresponds to a predetermined frequency; and acquires the light quantity data detected by the light detection element at a predetermined sampling frequency.

Abstract: A movable diffraction element and a spectroscope. The movable diffraction element includes a movable component having a comb-like shape, a supporting unit configured to support the movable component, a first cantilever actuator coupled to the supporting unit, a displacement determiner coupled to an edge of the first cantilever actuator, and a second cantilever actuator disposed parallel to the first cantilever actuator. In the movable diffraction element, a slope generated when the second cantilever actuator deforms is approximately equivalent to a slope generated at the first cantilever actuator. The spectroscope includes the movable diffraction element.

Abstract: A spectrum measuring device including a ribbon element, a light detection element, and circuitry. The ribbon element includes a first light reflector including a plurality of first light reflection surfaces configured to be translated in an out-of-plane direction, and a second light reflector including a plurality of second light reflection surfaces that are fixed. The circuitry supplies a drive signal to the ribbon element in such a manner that a change of a displacement amount difference between the first light reflection surfaces and the second light reflection surfaces corresponds to a predetermined frequency; and acquires the light quantity data detected by the light detection element at a predetermined sampling frequency.

Abstract: A MEMS device includes a plurality of ribbon elements, a securing portion, and a plurality of connecting portions. The securing portion supports the plurality of ribbon elements. The plurality of connecting portions are disposed on ends of each of the plurality of ribbon elements and connect each of the plurality of ribbon elements to the securing portion. An angle formed by a longitudinal extending line of each of the plurality of ribbon elements and each of the plurality of connecting portions is greater than 0° in a planar direction of each of the plurality of ribbon elements.

Abstract: A spectral measurement device includes a light reflection grating having a plurality of movable gratings and a movable grating drive unit that displaces the movable gratings to alter a grating pattern of the light reflection grating, a light detecting element that detects light incident on the light reflection grating, a storage unit storing a relationship between a light quantity to be detected by the light detecting element and corresponding light intensities at differing wavelengths for different grating patterns, and a computation unit that calculates light intensities at the differing wavelengths of the light incident on the light reflection grating based on the light quantity of the incident light detected by the light detecting element for each of the different grating patterns by altering the grating pattern based on the relationship between the light quantity and the corresponding light intensities for the different grating patterns stored in the storage unit.

Abstract: A spectral measurement device includes a light reflection grating having a plurality of movable gratings and a movable grating drive unit that displaces the movable gratings to alter a grating pattern of the light reflection grating, a light detecting element that detects light incident on the light reflection grating, a storage unit storing a relationship between a light quantity to be detected by the light detecting element and corresponding light intensities at differing wavelengths for different grating patterns, and a computation unit that calculates light intensities at the differing wavelengths of the light incident on the light reflection grating based on the light quantity of the incident light detected by the light detecting element for each of the different grating patterns by altering the grating pattern based on the relationship between the light quantity and the corresponding light intensities for the different grating patterns stored in the storage unit.

Abstract: A thermal-type infrared sensor includes a thermopile; an electrical conduction path of the thermopile, the conduction path including at least one crossed section in which the conduction path is crossed; a first region that is closed or substantially closed and formed by part of the conduction path, the part of the conduction path including an output section of the conduction path and the at least one crossed section; and a second region that is closed or substantially closed and formed by another part of the conduction path having the at least one crossed section as a boundary. The first region and the second region do not overlap each other.

Abstract: A rear-surface-irradiation-type infrared sensor includes a substrate having a through hole passing through between an upper surface and a lower surface; an infrared absorption part on the substrate on a side of the upper surface separate from the substrate by the through hole; and a temperature sensor part detecting a change in a temperature of the infrared absorption part. The through hole includes a first through hole part having an opening on the upper surface and one or more second through hole parts having shapes different from the first through hole constituent part. The first through hole part and the second through hole part(s) communicate with each other. In a cross-sectional shape of the through hole on a plane perpendicular to the upper surface, an inside wall of the first through hole part is outside an inside wall of the of second through hole part(s).

Abstract: A thermal-type infrared sensor includes a thermopile; an electrical conduction path of the thermopile, the conduction path including at least one crossed section in which the conduction path is crossed; a first region that is closed or substantially closed and formed by part of the conduction path, the part of the conduction path including an output section of the conduction path and the at least one crossed section; and a second region that is closed or substantially closed and formed by another part of the conduction path having the at least one crossed section as a boundary. The first region and the second region do not overlap each other.

Abstract: An infrared ray sensor includes a thermopile. The thermopile includes a first semiconductor material part and a second semiconductor material part, the first semiconductor material part and the second semiconductor material part are laminated, and a dielectric film is provided between the first semiconductor material part and the second semiconductor material part.

Abstract: A thermal infrared sensor includes an infrared ray absorbing film that is thermally separated from a semiconductor substrate by a hollow part; and a temperature sensor configured to detect temperature changes of the infrared ray absorbing film. The infrared ray absorbing film includes an infrared ray antireflection structure configured with a sub wavelength structure, the infrared ray antireflection structure being provided on a surface of the infrared ray absorbing film facing the semiconductor substrate.

Abstract: A rear-surface-irradiation-type infrared sensor includes a substrate having a through hole passing through between an upper surface and a lower surface; an infrared absorption part on the substrate on a side of the upper surface separate from the substrate by the through hole; and a temperature sensor part detecting a change in a temperature of the infrared absorption part. The through hole includes a first through hole part having an opening on the upper surface and one or more second through hole parts having shapes different from the first through hole constituent part. The first through hole part and the second through hole part(s) communicate with each other. In a cross-sectional shape of the through hole on a plane perpendicular to the upper surface, an inside wall of the first through hole part is outside an inside wall of the of second through hole part(s).