Patents by Inventor Hideyo Takahata

Hideyo Takahata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for inspecting object defection by light beam
    Patent number: 4097160
    Abstract: A narrow beam from a laser source-like light beam is projected on an object, the light scattered from the projected spot of the object is detected by light detecters at a plural number of the detecting positions. The distribution of the scattered light is detected by comparing the values of the densities of the scattered lights at the plural number of the detecting positions among each other in such a manner that it is determined from the distribution of the scattered light whether there is a defect on the projected spot or not.
    Type: Grant
    Filed: April 4, 1977
    Date of Patent: June 27, 1978
    Assignee: Canon Kabushiki Kaisha
    Inventors: Masamichi Yataki, Hideyo Takahata, Norio Simomura