Abstract: A radiation monitor and a hand-foot-cloth monitor include a hand monitoring unit capable of accurately measuring surface contamination regardless of the size of the hand of the examinee. A hand monitoring unit (7A) includes a fixed detecting unit (73a) and a movable detecting unit (72a) arranged to face the fixed detecting unit (73a) and movable reciprocatingly in a direction facing the fixed detecting unit (73a), an urging unit (79a) urging the movable detecting unit (72a) in a direction separating from the fixed detecting unit (73a), a pressing member (74a) arranged between the fixed detecting unit (73a) and the movable detecting unit (72a) and pressable by the hand of the examinee, and an interlock mechanism (77a) moving the movable detecting unit (72a) against the urging force of the urging unit (79a) in a direction approaching the fixed detecting unit (73a) according to the amount of pressing of the pressing member (74a).

Abstract: A radiation monitor and a hand-foot-cloth monitor include a hand monitoring unit capable of accurately measuring surface contamination regardless of the size of the hand of the examinee. A hand monitoring unit (7A) includes a fixed detecting unit (73a) and a movable detecting unit (72a) arranged to face the fixed detecting unit (73a) and movable reciprocatingly in a direction facing the fixed detecting unit (73a), an urging unit (79a) urging the movable detecting unit (72a) in a direction separating from the fixed detecting unit (73a), a pressing member (74a) arranged between the fixed detecting unit (73a) and the movable detecting unit (72a) and pressable by the hand of the examinee, and an interlock mechanism (77a) moving the movable detecting unit (72a) against the urging force of the urging unit (79a) in a direction approaching the fixed detecting unit (73a) according to the amount of pressing of the pressing member (74a).

Abstract: A method for inspecting an active-matrix-display-panel array substrate includes: a first step of applying a voltage V1 to the data terminal of a transistor while the transistor conducts, bringing the transistor into a non-conductive state, applying a voltage V1+?V to the data terminal, bringing the transistor into a conductive state, and measuring charge ?Q; a second step of applying a voltage V0 to the data terminal when the transistor does not conduct and the data terminal voltage is V3, and measuring a voltage Q1 flowing through the transistor when the transistor conducts; a third step of applying a voltage V0? to the data terminal when the transistor does not conduct and the data terminal voltage is V4, and measuring charge Q2 flowing when the transistor conducts; and a fourth step of determining a capacitance of the capacitor based on ?V, ?Q, V0, V0?, V3, V4, Q1, and Q2.

Abstract: The system for producing a display device controlled by a formula comprises a device for producing a panel substrate, which forms a thin film of a semiconductor material and forms the drive circuits for the pixels; a testing device for testing the resulting panel substrate; and a mounting device for mounting a display vehicle containing organic EL or liquid crystal material on a tested panel substrate. The testing apparatus having the testing device determine the threshold voltage of the drive circuits of each pixel during testing and these threshold values serve as the criteria for determining the parameters for substrate manufacture of the panel substrate manufacturing device.

Abstract: A contact making and breaking device improves the dielectric absorption property of capacitance between one signal wire brought out from a reed switch and an conductive casing. A low current measurement system using the contact making breaking device greatly shortens the measurement waiting time when low current is measured. The contact making and breaking device includes a reed switch with first and second signal wires brought out from either end, a conductive casing, and an insulating material formed between at least the first signal wire and the conductive casing. A tubular conductor is emplaced in the region in which the insulating material is formed and at least partially encloses the reed switch. The tubular conductor is connected to the first signal wire.

Abstract: A contact making and breaking device improves the dielectric absorption property of capacitance between one signal wire brought out from a reed switch and an conductive casing. A low current measurement system using the contact making breaking device greatly shortens the measurement waiting time when low current is measured. The contact making and breaking device includes a reed switch with first and second signal wires brought out from either end, a conductive casing, and an insulating material formed between at least the first signal wire and the conductive casing. A tubular conductor is emplaced in the region in which the insulating material is formed and at least partially encloses the reed switch. The tubular conductor is connected to the first signal wire.

Abstract: A switching operation for connection between plural measuring devices and plural DUTs is easily performed with a matrix of reed relays and connecting switches. The reed relay has a first guard pipe provided so as to cover a region extending from one end of the reed switch to the position adjacent to the contact point. A second guard pipe is provided so as to cover a region extending from the other end of the reed switch to a portion where the first guard pipe starts. When the reed relay is closed, and the first and second guard pipes are kept at the same potential as the signal line of the reed relay. On the other hand, when the reed relay is open, the guard connecting switch is also open. In this open switch case, the voltage at both terminals of the reed relay is ordinarily different. The signal lines of the reed switch at the measuring device side and the DUT side are respectively guarded by the first and second guard pipes.