Abstract: A wear amount measuring device includes an image display unit, an image processing unit, and a wear amount computing unit. The image display unit displays a real object image based on real object image data containing a wear amount measurement target and a reference part, and displays a plan image based on design plan data containing the wear amount measurement target and the reference part. The image processing unit executes an image processing of overlapping the real object image and the plan image at an equal scale on a corresponding positional relation when the reference parts are matched. The wear amount computing unit computes a wear amount based on a magnitude of an interval between a measurement contour line drawn along a contour of the wear amount measurement target in the real object image and a plan contour line in the plan image.

Abstract: A wear amount measuring device includes an image display unit, an image processing unit, and a wear amount computing unit. The image display unit displays a real object image based on real object image data containing a wear amount measurement target and a reference part, and displays a plan image based on design plan data containing the wear amount measurement target and the reference part. The image processing unit executes an image processing of overlapping the real object image and the plan image at an equal scale on a corresponding positional relation when the reference parts are matched. The wear amount computing unit computes a wear amount based on a magnitude of an interval between a measurement contour line drawn along a contour of the wear amount measurement target in the real object image and a plan contour line in the plan image.

Abstract: A non-contact wafer temperature measuring apparatus by which a wafer temperature can be measured with accuracy in situ even in a low temperature process. The wafer temperature measuring apparatus for measuring a wafer temperature based on reflected light of light applied to a wafer as a target of temperature measurement includes: a light source unit for generating light containing a P-polarized component having a wavelength not larger than 400 nm and applying the light to the wafer; a light receiving unit for receiving the light reflected by the wafer and detecting at least intensity of the P-polarized component having the wavelength not larger than 400 nm; and a signal processing unit for calculating a temperature of the target of temperature measurement at least based on the intensity of the P-polarized component having the wavelength not larger than 400 nm detected by the light receiving unit.

Abstract: The present invention provides a database for implementing in a straightforward manner the sharing of a variety of touchpoint information between departments in an enterprise or the sharing of a variety of touchpoint information between enterprises.

Abstract: An object of this invention is to provide efficient operations of a production line for producing finished products by performing working in which a variety of parts are selectively combined with one another during a plurality of processes. A semi-finished product produced in processes (1 and 2) is assigned to an article number; parts serving as raw materials, a supplier of the semi-finished product, or a destination of the semi-finished product or part are specified; and these specified data are distributed and transmitted from a higher level system (4) to respective control systems (5, 6, 7 and 8) as planned data to be executed and planned data to be received.

Abstract: A confocal optical apparatus comprising a light source, a first aperture portion for passing light emitted from the light source and obtaining a point source, an objective lens for causing the light that has passed through the first aperture portion to converge on a measurement object, a second aperture portion located on a plane conjugate with the convergence surface on the measurement object, and light detectors for detecting light that has passed through the second aperture portion, wherein placing the first and second aperture portions in the same position and using them as the same aperture portion, as well as positioning the detection surfaces of the light detectors substantially on the same surfaces as the conjointly used identical aperture portions make it possible to reduce the size and weight of the apparatus, to perform three-dimensional shape measurements rapidly and accurately, and to facilitate the alignment of each portion.

Abstract: A three-dimensional image measuring device which comprises a light source; a plane image forming unit for forming a plane image in a space in its depth direction on the basis of light emitted from the light source; a scanning unit for moving and scanning the plane image formed by the plane image forming unit in its depth direction; an object to be measured disposed in the space where the plane image is formed; a light receiving unit for measuring the strength of light scattered on a surface of the object as the plane image is moved and scanned and; a distance measuring unit for measuring the distance to the object on the basis of the output of the light receiving unit, whereby a three-dimensional image with least reduced invisible area is easily and accurately measured in a short time without using the principle of triangulation.

Abstract: A three-dimensional image measuring device which comprises a light source; a plane image forming unit for forming a plane image in a space in its depth direction on the basis of light emitted from the light source; a scanning unit for moving and scanning the plane image formed by the plane image forming unit in its depth direction; an object to be measured disposed in the space,where the plane image is formed; a light receiving unit for measuring strength of light scattered on a surface of the object as the plane image is moved and scanned and; a distance measuring unit for measuring the distance to the Object on the basis of the output of the light receiving unit, whereby a three-dimensional image with least reduced invisible area is easily and accurately measured in a short time without using the principle of triangulation.

Abstract: A three-dimensional image measuring device which comprises a light source; a plane image forming unit for forming a plane image in a space in its depth direction on the basis of light emitted from the light source; a scanning unit for moving and scanning the plane image formed by the plane image forming unit in its depth direction; an object to be measured disposed in the space where the plane image is formed; a light receiving unit for measuring the strength of light scattered on a surface of the object as the plane image is moved and scanned and; a distance measuring unit for measuring the distance to the object on the basis of the output of the light receiving unit, whereby a three-dimensional image with least reduced invisible area is easily and accurately measured in a short time without using the principle of triangulation.

Abstract: A three-dimensional image display device which comprises a holographic plate having a plurality of holograms divided in correspondence with rotational angles, the holographic plate being exposed so that when light is irradiated, each of the holograms forms a point image at a different position in a depth direction of the holographic plate; a drive unit for rotating the holographic plate; a light irradiating unit including a plurality of light sources arranged substantially in a straight line so that the light sources are kept at substantially equal distances from the holographic plate, for irradiating the holographic plate with light from the light sources; and a controller for controlling the drive unit and lighting operations of the plurality of light sources of the light irradiating unit in accordance with a signal indicative of a three-dimensional image to be displayed so as to control lighting of a plurality of point images formed in a three-dimensional space, whereby a three-dimensional image can be obt

Abstract: A three-dimensional image measuring device which comprises a light source; a plane image forming unit for forming a plane image in a space in its depth direction .on the basis of light emitted from the light source; a scanning unit for moving and scanning the plane image formed by the plane image forming means in its depth direction; an object to be measured disposed in the space where the plane image is formed; a light receiving unit for measuring a strength of light scattered on a surface of the object as the plane image is moved and scanned and; a distance measuring unit for measuring the distance to the object on the basis of the output of the light receiving unit, whereby a three-dimensional image with least reduced invisible area is easily and accurately measured in a short time without using the principle of triangulation.

Abstract: A three-dimensional image display device which comprises a light source; a hologram divided into a plurality of divided areas and exposed so that point images are formed at different positions in a three-dimensional space in the respective divided areas when the light from the light source is irradiated; a hologram driver unit for driving the hologram such that light from the light source is selectively entered into one of the plurality of divided areas and; a control unit for controlling the lighting up of the point images formed in the three-dimensional space in correspondence to a three-dimensional image signal by controlling the hologram and the light source in accordance with the three-dimensional image signal to be displayed, whereby a three-dimensional image is obtained by the hologram with the simple-configured device.

Abstract: Method and device for detecting tool abnormality in machine tools in which a threshold value is determined based on the condition of a tool in machining and tool abnormality is detected by comparing data successively obtained from the tool during machining with the threshold value. The threshold value is determined by computing the tool condition data in machining for a period when an externally provided switch is on and stored in a memory of the device when the switch turns off.The application of this invention to numerical controlled machine tools is also disclosed in which a plurality of threshold values are determined according to machining conditions in each machining process and tool abnormality is detected by comparing tool condition data during machining with one of the threshold values corresponding to the condition of the machining.

Abstract: A numerically controlled (NC) machine tool has apparatus for automatically positioning and feeding a cutting tool to follow a programmably predetermined path. Sensing devices are provided to detect when the cutting tool suffers an abnormality, such as becoming dull or chipped. The feed devices of the NC machine tool are then commanded, by an arithmetic unit having a memory and by an NC command generating unit, to automatically retreat the cutting tool. It retreats, without interference with the workpiece, to a first position, parametrically determined by the shape and size of the workpiece, cutting tool data for the abnormality, completion and tool exchange positions, and by the nature of the machining operation. This retreat location is a position at which the cutting tool may be replaced. After replacement of the cutting tool, the cutting tool is automatically returned, via the first position, to a second position from which the machining is resumed.