Patents by Inventor Hila Shteinberg

Hila Shteinberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for detecting line width defects in electrical circuit inspection
    Publication number: 20020038510
    Abstract: An automated optical inspection method detects width defects by employing locally applied width information. A defect determination is based on proximal width information of nearby parts of a conductor. Automated optical inspection systems inspect the surfaces of patterned objects for line width defects, employing line width data that is at least partially obtained automatically from analyzing a reference image of a non-defective patterned object.
    Type: Application
    Filed: October 3, 2001
    Publication date: April 4, 2002
    Applicant: ORBOTECH, LTD
    Inventors: Nissim Savareigo, Hila Shteinberg