Patents by Inventor Hillel Miller

Hillel Miller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8234618
    Abstract: A test system collects passing event data and failing event data, and merges the collected data into passing subsequences and failing subsequences, respectively. The test system identifies an overlap area between the passing subsequence and the failing subsequence in regards to time slices and tracepoint slices, and creates passing transactions and failing transactions using the event data corresponding to the overlap area. Next, the test system detects a timing discrepancy between the first passing transaction relative to the second passing transaction compared with the first failing transaction relative to the second failing transaction. The test system then reports the detected timing discrepancy, which allows a test engineer to perturb the test program in order to more frequently catch intermittent failures caused by asynchronous timing conditions.
    Type: Grant
    Filed: November 3, 2009
    Date of Patent: July 31, 2012
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Mrinal Bose, Jayanta Bhadra, Hillel Miller, Edward L. Swarthout, Ekaterina A. Trofimova
  • Patent number: 8161449
    Abstract: A method, computer program product, and data processing system that controls test packets that are sent to a coordinating computer system is provided. A node computer system runs a test case that results in one or more test result packets. Control data structures are received from one or more coordinating computer systems. The resulting test result packets are compared to the one or more received data structures. The comparison reveals whether one or more of the test result packets include results requested by the coordinating computer systems. Test result packets are selected when the comparison reveals that the selected test result packets include results requested by the coordinating computer systems. Selected test result packets are sent to one of the coordinating computer systems and unselected test result packets are discarded by the node.
    Type: Grant
    Filed: October 21, 2009
    Date of Patent: April 17, 2012
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Amol V. Bhinge, George W. Wood, Hillel Miller
  • Patent number: 7945418
    Abstract: An approach is provided to manage test transactors that interface with components of a hardware design. A first set of transactors is launched with the first set of transactors sending stimuli to various components that correspond to the first set of transactors. A manager receives signals when transactors of the first set have completed at which point a second set of transactors is identified that are dependent upon the first set transactors that completed. The second set of transactors is launched by the manager. The manager further facilitates transmission of data used by the various transactors. Transactors generate and provide stimuli to various components included in a hardware design, such as a System-on-a-Chip (SoC). Results from the hardware design are passed to the transactors which, in turn, pass the results back to the manager. In this manner, results from one transactor may be made available as input to another transactor.
    Type: Grant
    Filed: December 15, 2008
    Date of Patent: May 17, 2011
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Mrinal Bose, Jayanta Bhadra, Kenneth G. Davis, Yaniv Fais, Sharon Goldschlager, Amit Hermony, Hillel Miller, Prashant U. Naphade, Pankaj Sharma, Robert S. Slater
  • Publication number: 20110107146
    Abstract: A test system collects passing event data and failing event data, and merges the collected data into passing subsequences and failing subsequences, respectively. The test system identifies an overlap area between the passing subsequence and the failing subsequence in regards to time slices and tracepoint slices, and creates passing transactions and failing transactions using the event data corresponding to the overlap area. Next, the test system detects a timing discrepancy between the first passing transaction relative to the second passing transaction compared with the first failing transaction relative to the second failing transaction. The test system then reports the detected timing discrepancy, which allows a test engineer to perturb the test program in order to more frequently catch intermittent failures caused by asynchronous timing conditions.
    Type: Application
    Filed: November 3, 2009
    Publication date: May 5, 2011
    Inventors: Mrinal Bose, Jayanta Bhadra, Hillel Miller, Edward L. Swarthout, Ekaterina A. Trofimova
  • Publication number: 20100153053
    Abstract: An approach is provided to manage test transactors that interface with components of a hardware design. A first set of transactors is launched with the first set sending stimuli to various components that correspond to the first set of transactors. A manager receives signals when transactors of the first set have completed at which point a second set of transactors is identified that are dependent upon the first set transactors that completed. The second set of transactors is launched by the manager. The manager further facilitates transmission of data used by the various transactors. Transactors generate and provide stimuli to various components included in a hardware design, such as a System-on-a-Chip (SoC). Results from the hardware design are passed to the transactors which, in turn, pass the results back to the manager. In this manner, results from one transactor may be made available as input to another transactor.
    Type: Application
    Filed: December 15, 2008
    Publication date: June 17, 2010
    Inventors: Mrinal Bose, Jayanta Bhadra, Kenneth G. Davis, Yaniv Fais, Sharon Goldschlager, Amit Hermony, Hillel Miller, Prashant U. Naphade, Pankaj Sharma, Robert S. Slater
  • Publication number: 20100042959
    Abstract: A method, computer program product, and data processing system that controls test packets that are sent to a coordinating computer system is provided. A node computer system runs a test case that results in one or more test result packets. Control data structures are received from one or more coordinating computer systems. The resulting test result packets are compared to the one or more received data structures. The comparison reveals whether one or more of the test result packets include results requested by the coordinating computer systems. Test result packets are selected when the comparison reveals that the selected test result packets include results requested by the coordinating computer systems. Selected test result packets are sent to one of the coordinating computer systems and unselected test result packets are discarded by the node.
    Type: Application
    Filed: October 21, 2009
    Publication date: February 18, 2010
    Inventors: Amol V. Bhinge, George W. Wood, Hillel Miller
  • Patent number: 6321186
    Abstract: A method for verifying an integrated circuit design using constraint information to develop a weighted data structure. In one embodiment, a binary decision diagram (BDD) includes a plurality of nodes (401, 402, 403, 404, 405, 406, 407, 420, and 430) representing signals and states in the circuit, and each node has a branching probability based on user-defined weights. The BDD represents the intersection of the input space and state space which satisfies the constraints. Current state information resulting from simulation is used to dynamically adjust the branching probabilities of the BDD on the fly. In one embodiment, the constraint information is applicable for formal verification of a portion of the circuit. In another embodiment, a simulation controller (12) receives design and constraint information and generates the program to control simulator (14).
    Type: Grant
    Filed: May 3, 1999
    Date of Patent: November 20, 2001
    Assignee: Motorola, Inc.
    Inventors: Jun Yuan, Carl P. Pixley, Stephen Kurt Shultz, Hillel Miller