Patents by Inventor Hiroaki Nishimine

Hiroaki Nishimine has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tungsten oxide photocatalyst comprising platinum particles
    Patent number: 8017238
    Abstract: To provide a tungsten oxide photocatalyst which shows a high photocatalytic activity by irradiating with visible light even under the environment where ultraviolet light is not irradiated, the tungsten oxide photocatalyst has tungsten oxide particles and Pt particles having a primary particle size of 3 to 20 nm supported on the surface of the tungsten oxide particles in an amount of 0.03 to 5 parts by weight based on 100 parts by weight of the tungsten oxide particles.
    Type: Grant
    Filed: March 28, 2008
    Date of Patent: September 13, 2011
    Assignees: National University Corporation Hokkaido University, Sumitomo Chemical Company, Limited
    Inventors: Bunsho Ohtani, Ryu Abe, Yoshiaki Sakatani, Makoto Murata, Hiroaki Nishimine
  • TUNGSTEN OXIDE PHOTOCATALYST
    Publication number: 20080241542
    Abstract: To provide a tungsten oxide photocatalyst which shows a high photocatalytic activity by irradiating with visible light even under the environment where ultraviolet light is not irradiated, the tungsten oxide photocatalyst has tungsten oxide particles and Pt particles having a primary particle size of 3 to 20 nm supported on the surface of the tungsten oxide particles in an amount of 0.03 to 5 parts by weight based on 100 parts by weight of the tungsten oxide particles.
    Type: Application
    Filed: March 28, 2008
    Publication date: October 2, 2008
    Applicants: NATIONAL UNIVERSITY COPORATION HOKKAIDO UNIVERSITY, SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Bunsho OHTANI, Ryu ABE, Yoshiaki SAKATANI, Makoto MURATA, Hiroaki NISHIMINE
  • Test apparatus and test method
    Patent number: 7409615
    Abstract: A test apparatus for testing a device under test 15 is provided. The test apparatus includes a driver 122 for applying a test signal to the device under test, a comparator 128 for comparing a result signal outputted by the device under test 15 corresponding to the applied test signal with a predetermined reference voltage and a setting voltage output section 110 for setting the voltage of the test signal to a predetermined voltage value to cause the driver 122 to terminate the transmission path of the result signal when the test apparatus reads from the device under test 15.
    Type: Grant
    Filed: July 28, 2006
    Date of Patent: August 5, 2008
    Assignee: Advantest Corporation
    Inventors: Hiroaki Nishimine, Hirokatsu Niijima, Takeo Miura
  • Test apparatus and test method
    Publication number: 20070022346
    Abstract: A test apparatus for testing a device under test 15 is provided. The test apparatus includes a driver 122 for applying a test signal to the device under test, a comparator 128 for comparing a result signal outputted by the device under test 15 corresponding to the applied test signal with a predetermined reference voltage and a setting voltage output section 110 for setting the voltage of the test signal to a predetermined voltage value to cause the driver 122 to terminate the transmission path of the result signal when the test apparatus reads from the device under test 15.
    Type: Application
    Filed: July 28, 2006
    Publication date: January 25, 2007
    Applicant: Advantest Corporation
    Inventors: Hiroaki Nishimine, Hirokatsu Niijima, Takeo Miura