Patents by Inventor Hirofumi Nakatoyodome

Hirofumi Nakatoyodome has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for detecting a defect in a pixel of an electrical display unit and a method for manufacturing an electrical display unit
    Patent number: 6831995
    Abstract: In image-capture inspection of electronic displays, the object of the present invention is to reduce moire generation, improve inspection precision by making pixel defects easier to discover, and allowing quantitative evaluation of these pixel defects. The relative positioning of the electronic display and an imaging element is changed by very small amounts of 1/n of the pixel pitch. The n images are arranged by pixel and the images are combined by taking the moving average of the image data values to reduce the image-capture moires generated during the image capture operations. The composite image is used to inspect pixel defects in the electronic display.
    Type: Grant
    Filed: March 8, 2000
    Date of Patent: December 14, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Toshio Asano, Kaoru Sakai, Jun Mochizuki, Tatsuo Horiuchi, Hirofumi Nakatoyodome, Tadashi Furukawa, Atsuo Ohsawa