Abstract: A system includes an imaging optical system that forms an optical image of an observed object; a control apparatus that switches between a superresolution observation mode and a normal observation mode; and a rotatable disk located at a position conjugate to a front focal position of the imaging optical system and having a plurality of apertures. The imaging optical system changes a projection magnification of an intermediate image that is a point image of a portion of the observed object that is formed on the disk. The control apparatus sets, during the superresolution observation mode, the projection magnification in a manner such that the intermediate image becomes at least twice as large as the apertures and sets, during the normal observation mode, the projection magnification in a manner such that the projection magnification becomes lower than the projection magnification in the superresolution observation mode.

Abstract: A system includes an imaging optical system that forms an optical image of an observed object; a control apparatus that switches between a superresolution observation mode and a normal observation mode; and a rotatable disk located at a position conjugate to a front focal position of the imaging optical system and having a plurality of apertures. The imaging optical system changes a projection magnification of an intermediate image that is a point image of a portion of the observed object that is formed on the disk. The control apparatus sets, during the superresolution observation mode, the projection magnification in a manner such that the intermediate image becomes at least twice as large as the apertures and sets, during the normal observation mode, the projection magnification in a manner such that the projection magnification becomes lower than the projection magnification in the superresolution observation mode.

Abstract: Optical equipment for detecting beams emitted from a sample by irradiating the sample with linear polarization according to an aspect of the present invention includes a wavelength-independent optical path division element arranged at a position of coupling of a illumination optical path of the linear polarization and a detection optical path of the beams, and the linear polarization is reflected by the interface of the optical path division element entered as S polarization and led to the sample, and the beams pass through the optical path division element and are detected.

Abstract: Optical equipment for detecting beams emitted from a sample by irradiating the sample with linear polarization according to an aspect of the present invention includes a wavelength-independent optical path division element arranged at a position of coupling of a illumination optical path of the linear polarization and a detection optical path of the beams, and the linear polarization is reflected by the interface of the optical path division element entered as S polarization and led to the sample, and the beams pass through the optical path division element and are detected.

Abstract: It in an object to acquire a high-precision polarization image.

Abstract: While carrying out microscope examination, it is possible to specify a position to be irradiated with optical stimulus light and to accurately apply an optical stimulus to the specified irradiation position. A microscope examination method includes a step of introducing into a specimen a substance in which a structural change is caused by irradiation with light of a first wavelength; a step of specifying an optical stimulation site in the specimen by irradiating the specimen with visible light of a second wavelength that does not cause a structural change in the substance, while examining the specimen in which the substance is introduced using a microscope examination apparatus; and a step of irradiating the specified optical stimulus site with the light of the first wavelength.

Abstract: While carrying out microscope examination, it is possible to specify a position to be irradiated with optical stimulus light and to accurately apply an optical stimulus to the specified irradiation position. A microscope examination method includes a step of introducing into a specimen a substance in which a structural change is caused by irradiation with light of a first wavelength; a step of specifying an optical stimulation site in the specimen by irradiating the specimen with visible light of a second wavelength that does not cause a structural change in the substance, while examining the specimen in which the substance is introduced using a microscope examination apparatus; and a step of irradiating the specified optical stimulus site with the light of the first wavelength.