Patents by Inventor Hirohisa Mizuno

Hirohisa Mizuno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Reversible recording medium and exterior member
    Patent number: 11993094
    Abstract: A reversible recording medium according to an embodiment of the present disclosure includes: a recording layer including a leuco pigment as a coloring compound; and a first barrier film that is provided on one surface and a side surface of the recording layer and suppresses mixing of at least one of water or oxygen.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: May 28, 2024
    Assignee: Sony Corporation
    Inventors: Hiroshi Mizuno, Hirohisa Amago, Kazumasa Nomoto, Nobukazu Hirai, Takehisa Ishida
  • Spectacle lens processing device and non-transitory computer-readable medium storing computer-readable instructions
    Patent number: 11992972
    Abstract: A spectacle lens processing device includes a drilling tool and a processor. The processor acquires a position of a hole formed in a lens and a pantoscopic angle. The pantoscopic angle is an angle in a vertical plane between a visual axis of a user and an optical axis of the lens when the user wears spectacles in which the lens after processing is mounted and faces forward. The processor determines, based on the acquired pantoscopic angle, a relative angle between the drilling tool and the lens when the hole is formed in the lens in the position of the hole.
    Type: Grant
    Filed: December 14, 2018
    Date of Patent: May 28, 2024
    Assignee: NIDEK CO., LTD.
    Inventors: Yuji Kanda, Kyoji Takeichi, Hirohisa Mizuno
  • SPECTACLE LENS PROCESSING DEVICE AND NON-TRANSITORY COMPUTER-READABLE MEDIUM STORING COMPUTER-READABLE INSTRUCTIONS
    Publication number: 20190118498
    Abstract: A spectacle lens processing device includes a drilling tool and a processor. The processor acquires a position of a hole formed in a lens and a pantoscopic angle. The pantoscopic angle is an angle in a vertical plane between a visual axis of a user and an optical axis of the lens when the user wears spectacles in which the lens after processing is mounted and faces forward. The processor determines, based on the acquired pantoscopic angle, a relative angle between the drilling tool and the lens when the hole is formed in the lens in the position of the hole.
    Type: Application
    Filed: December 14, 2018
    Publication date: April 25, 2019
    Applicant: NIDEK CO., LTD.
    Inventors: Yuji KANDA, Kyoji TAKEICHI, Hirohisa MIZUNO
  • Test apparatus for semiconductor device
    Patent number: 7107504
    Abstract: A test apparatus for a semiconductor device, which improves the reliability of an operational test on target devices on a wafer using BOST (Built Out Self Test) and BIST (Built In Self Test). The test apparatus includes an external test unit, the BIST circuit formed in the semiconductor device, and BOST device which is coupled between the external test unit and the semiconductor device. Pattern data for a pattern dependency test is stored in the BIST circuit and pattern data for a timing dependency test is stored in the BOST device.
    Type: Grant
    Filed: February 13, 2002
    Date of Patent: September 12, 2006
    Assignee: Fujitsu Limited
    Inventors: Masahiro Sato, Junji Akaza, Nobumi Kodama, Hirohisa Mizuno, Takashi Imura, Yasurou Matsuzaki
  • Test apparatus for semiconductor device
    Publication number: 20030002365
    Abstract: A test apparatus for a semiconductor device, which improves the reliability of an operational test on target devices on a wafer using BOST (Built Out Self Test) and BIST (Built In Self Test). The test apparatus includes an external test unit, the BIST circuit formed in the semiconductor device, and BOST device which is coupled between the external test unit and the semiconductor device. Pattern data for a pattern dependency test is stored in the BIST circuit and pattern data for a timing dependency test is stored in the BOST device.
    Type: Application
    Filed: February 13, 2002
    Publication date: January 2, 2003
    Applicant: Fujitsu Limited
    Inventors: Masahiro Sato, Junji Akaza, Nobumi Kodama, Hirohisa Mizuno, Takashi Imura, Yasurou Matsuzaki