Patents by Inventor Hirokazu Yokoyama
Hirokazu Yokoyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10584700Abstract: A high-pressure fuel pump (10) includes a plunger (11), a pump housing (12), an intake valve (13), a discharge passage (14), a fuel seal member (18), and a fuel inlet conduit (34). The pump housing (12) includes a fuel pressurizing chamber (23), an intake passage (24a), a discharge passage (24b), a cylinder housing member (21), a cover member (31) that covers the cylinder housing member (21), and an intake gallery chamber (12g). The fuel inlet conduit (34) is connected to the cover member (31) and configured to introduce fuel into the intake gallery chamber (12g) from outside the cover member (31). The pump housing (12) includes a return passage (33e) that communicates the intake gallery chamber (12g) with a space surrounded by the plunger (11), the cylinder housing member (21), and the fuel seal member (18). A first end portion of the return passage (33e) on the intake gallery chamber (12g) side is positioned on an opposite side of the cylinder housing member (21) from the fuel inlet conduit (34).Type: GrantFiled: June 5, 2014Date of Patent: March 10, 2020Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Takeyuki Yabuuchi, Hirokazu Yokoyama
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Patent number: 10066613Abstract: A fuel pump includes a plunger that reciprocates in a cylinder. The fuel pump further includes a first mover connected to the plunger, a second mover serving as a counterweight for the first mover, an electromagnet provided between the first mover and the second mover, a first magnetic member provided between the first mover and the second mover, and a first spring urging the first mover and the second mover away from each other. Further, a second magnetic member is provided between both of the electromagnet and the first magnetic member and a first inclined surface of the first mover, while a third magnetic member is provided between both of the electromagnet and the first magnetic member and a second inclined surface of the second mover.Type: GrantFiled: September 26, 2016Date of Patent: September 4, 2018Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Kazuhiro Asayama, Hirokazu Yokoyama, Satoki Takagi
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Patent number: 9777719Abstract: In a fuel pump that includes a pump housing (10) that has fuel passages (11a, 11b), a plunger (17) that is movably housed in the pump housing (10), a fuel pressurizing chamber (15) that is formed in the pump housing (10) and draws in fuel via one of the fuel passages (11a) that is on the intake side of the fuel pressurizing chamber (15), pressurizes the fuel that has been drawn in, and discharges the pressurized fuel via the other fuel passage (11b) that is on the discharge side of the fuel pressure chamber (15), in response to movement of the plunger (17), and valve elements (12, 14, 16) that are arranged in the fuel passages (11a, 11b) near the fuel pressurizing chamber (15), each of the valve elements (12, 14, 16) has a reed valve body (41, 42, 43; 74, 75, 76) arranged in the fuel passage (11a) on the intake side of the fuel pressurizing chamber (15) or the fuel passage (11b) on the discharge side of the fuel pressurizing chamber (15); and an operating member (21) that applies operating force in at least oType: GrantFiled: October 12, 2010Date of Patent: October 3, 2017Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Takashi Usui, Takeshi Kitamura, Hirokazu Yokoyama, Yoshihiro Tanaka
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Publication number: 20170096988Abstract: A fuel pump includes a plunger that reciprocates in a cylinder. The fuel pump further includes a first mover connected to the plunger, a second mover serving as a counterweight for the first mover, an electromagnet provided between the first mover and the second mover, a first magnetic member provided between the first mover and the second mover, and a first spring urging the first mover and the second mover away from each other. Further, a second magnetic member is provided between both of the electromagnet and the first magnetic member and a first inclined surface of the first mover, while a third magnetic member is provided between both of the electromagnet and the first magnetic member and a second inclined surface of the second mover.Type: ApplicationFiled: September 26, 2016Publication date: April 6, 2017Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Kazuhiro ASAYAMA, Hirokazu YOKOYAMA, Satoki TAKAGI
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Publication number: 20150068472Abstract: An EGR gas cooling system of the present invention includes a main cooling water circuit which circulates cooling water between an engine, a main radiator that radiates heat of the cooling water of the engine and a primary EGR cooler that cools EGR gas by the cooling water and a low temperature cooling water circuit which circulates the cooling water between the engine, a sub-radiator provided integrally with or separately from the main radiator to radiate heat in the cooling water and a secondary EGR cooler that cools the EGR gas by the cooling water. A flow rate controller which controls a flow rate of the cooling water is provided between the engine and the sub-radiator of the low temperature cooling water circuit.Type: ApplicationFiled: September 13, 2012Publication date: March 12, 2015Applicants: TOKYO RAIDATOR MFG. CO., LTD., CALSONIC KANSEI CORPORATIONInventors: Konomu Sakagawa, Hirokazu Yokoyama
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Publication number: 20120207632Abstract: In a fuel pump that includes a pump housing (10) that has fuel passages (11a, 11b), a plunger (17) that is movably housed in the pump housing (10), a fuel pressurizing chamber (15) that is formed in the pump housing (10) and draws in fuel via one of the fuel passages (11a) that is on the intake side of the fuel pressurizing chamber (15), pressurizes the fuel that has been drawn in, and discharges the pressurized fuel via the other fuel passage (11b) that is on the discharge side of the fuel pressure chamber (15), in response to movement of the plunger (17), and valve elements (12, 14, 16) that are arranged in the fuel passages (11a, 11b) near the fuel pressurizing chamber (15), each of the valve elements (12, 14, 16) has a reed valve body (41, 42, 43; 74, 75, 76) arranged in the fuel passage (11a) on the intake side of the fuel pressurizing chamber (15) or the fuel passage (11b) on the discharge side of the fuel pressurizing chamber (15); and an operating member (21) that applies operating force in at least oType: ApplicationFiled: October 12, 2010Publication date: August 16, 2012Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Takashi Usui, Takeshi Kitamura, Hirokazu Yokoyama, Yoshihiro Tanaka
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Patent number: 8114500Abstract: The purpose of the present invention is to provide a polyimide film with excellent passage characteristic, especially in an automatic optical inspection system (AOI), not to mention running characteristic (easy slip characteristic) and adhesion.Type: GrantFiled: October 30, 2009Date of Patent: February 14, 2012Assignee: E. I. du Pont de Nemours and CompanyInventors: Naofumi Yasuda, Hiroki Ishikawa, Hirokazu Yokoyama
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Publication number: 20100129605Abstract: The purpose of the present invention is to provide a polyimide film with excellent passage characteristic, especially in an automatic optical inspection system (AOI), not to mention running characteristic (easy slip characteristic) and adhesion.Type: ApplicationFiled: October 30, 2009Publication date: May 27, 2010Applicant: E. I. DU PONT DE NEMOURS AND COMPANYInventors: NAOFUMI YASUDA, Hiroki Ishikawa, Hirokazu Yokoyama
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Publication number: 20090171063Abstract: A polyimide film with advantageous handleability, flexibility, dimensional stability and heat resistance is provided. The polyimide film is characterized by block-copolymerizing an aromatic diamine component comprising 10˜25 mol % of paraphenylenediamine (a1) and 75˜90 mol % of 4,4?-diaminodiphenyl ether (a2) with an aromatic tetracarboxylic acid component consisting of 75˜99.9 mol % of pyromellitic acid dianhydride (b1) and 0.1˜25 mol % of 3,3?,4,4?-biphenyl tetracarboxylic acid dianhydride (b2). The Young's modulus, linear expansion coefficient, water absorption rate and glass transition temperature of such polyimide films can be controlled within very useful ranges.Type: ApplicationFiled: January 31, 2008Publication date: July 2, 2009Inventors: Tadashi Ishibashi, Hirokazu Yokoyama, Shinsuke Yamashita, Shotaro Hidaka, Hitomi Murase
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Patent number: 7287967Abstract: A high pressure pump for preventing distortion of a sealing surface or a cylinder form. The high pressure pump has an intermediate member including a cylinder body having a pressurizing chamber communicated with a cylinder accommodating a plunger. Fluid in the pressurizing chamber is pressurized by reciprocating the plunger. The intermediate member is arranged between a cover and a flange and is clamped by clamping bolts. An electromagnetic spill valve for receiving reaction force from the pressurizing chamber when the fluid in the pressurizing chamber is pressurized is attached to the cover at a position for reducing the clamping force applied to the intermediate member by the clamping bolts.Type: GrantFiled: April 17, 2001Date of Patent: October 30, 2007Assignees: Toyota Jidosha Kabushiki Kaisha, Denso CorporationInventors: Kazuhiro Asayama, Hirokazu Yokoyama, Shinobu Ishida, Hiroshi Inoue
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Publication number: 20070155948Abstract: The present invention is directed to polyamic acids comprising a diamine represented by the following formula, where m is an integer between and including any two of the following numbers 0, 1, 2, 3 and 4 and wherein n is an integer between and including any two of the following numbers 0, 1, 2, 3 and 4. The sum of m+n is equal to any integer between and including any two of the following numbers 1, 2, 3, 4, 5, 6, 7, 8.Type: ApplicationFiled: December 30, 2005Publication date: July 5, 2007Inventors: Tadashi Ishibashi, Hirokazu Yokoyama
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Patent number: 7011150Abstract: A plurality of beads protruding from an inner face of the tube are provided in such a manner that the beads are arranged at a predetermined pitch in an axial direction of the tube; and a circumference of the tube is divided at least into thirds, and the beads are aligned in a circumferential direction of the tube; and the beads aligned in the circumferential direction of the tube are provided at plural rows at the predetermined pitch in the axial direction of the tube, and the beads adjoining in the axial direction are shifted by substantially a half of a circumferential length of the bead to one another. Alternatively, the circumference of the tube is divided into parts of an even number of four or more, and the beads are aligned in the circumferential direction so as to be alternately formed in the parts of the circumference.Type: GrantFiled: April 20, 2004Date of Patent: March 14, 2006Assignee: Tokyo Radiator Mfg. Co., Ltd.Inventors: Tamio Komatsubara, Hirokazu Yokoyama, Noboru Shirako
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Patent number: 7002674Abstract: Provided are a method and apparatus for inspecting a defect on a plane, such as a surface or a section, of an object to be inspected. The object is, for instance, a silicon wafer. A whole area of a plane of the object is first imaged by an optical system to gain image signals. Then, a particular region on the plane is positionally detected from the image signals. The particular region includes a blot and a defect and has a higher luminance than a remaining region on the plane. A blot is distinguishably detected from the particular region. A specified region on the plane is then subjected to a detailed inspection under a microscope. The region is set to avoid the blot even if the blot is on the region. The detailed inspection under the microscope is performed toward only the region with no blot.Type: GrantFiled: April 28, 2003Date of Patent: February 21, 2006Assignee: Sumitomo Mitsubishi Silicon CorporationInventors: Hirokazu Yokoyama, Hiroki Murakami
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Publication number: 20050230094Abstract: A plurality of beads protruding from an inner face of the tube are provided in such a manner that the beads are arranged at a predetermined pitch in an axial direction of the tube; and a circumference of the tube is divided at least into thirds, and the beads are aligned in a circumferential direction of the tube; and the beads aligned in the circumferential direction of the tube are provided at plural rows at the predetermined pitch in the axial direction of the tube, and the beads adjoining in the axial direction are shifted by substantially a half of a circumferential length of the bead to one another. Alternatively, the circumference of the tube is divided into parts of an even number of four or more, and the beads are aligned in the circumferential direction so as to be alternately formed in the parts of the circumference.Type: ApplicationFiled: April 20, 2004Publication date: October 20, 2005Inventors: Tamio Komatsubara, Hirokazu Yokoyama, Noboru Shirako
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Patent number: 6779159Abstract: A defect inspection method and a defect inspection apparatus accurately determine whether potential defects on a surface of a wafer are true defects, and restrains the oversight or the like of defects, permitting reliable quality assurance and accurate quality control to be achieved. The number and positions of detected potential defects are used as the parameters for determining whether potential defects are true defects. The density of potential defects is determined, and the determined density is compared with a set value to decide whether the potential defects are true defects. A surface of a wafer is captured using a differential interference microscope, and the image is processed to count the number of potential defects observed on the surface. The potential defects are detected at the spots where luminance shifts in the captured image. A spatial filter is applied to the captured image to enhance the area where the luminance shifts, and the enhanced area is binarized.Type: GrantFiled: May 29, 2002Date of Patent: August 17, 2004Assignee: Sumitomo Mitsubishi Silicon CorporationInventors: Hirokazu Yokoyama, Yutaka Nakashima
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Publication number: 20030227620Abstract: Provided are a method and apparatus for inspecting a defect on a plane, such as a surface or a section, of an object to be inspected. The object is, for instance, a silicon wafer. A whole area of a plane of the object is first imaged by an optical system to gain image signals. Then, a particular region on the plane is positionally detected from the image signals. The particular region includes a blot and a defect and has a higher luminance than a remaining region on the plane. A blot is distinguishably detected from the particular region. A specified region on the plane is then subjected to a detailed inspection under a microscope. The region is set to avoid the blot even if the blot is on the region. The detailed inspection under the microscope is performed toward only the region with no blot.Type: ApplicationFiled: April 28, 2003Publication date: December 11, 2003Applicant: SUMITOMO MITSUBISHI SILICON CORPORATIONInventors: Hirokazu Yokoyama, Hiroki Murakami
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Publication number: 20030103853Abstract: A high pressure pump for preventing distortion of a sealing surface or a cylinder form. The high pressure pump has an intermediate member including a cylinder body (4) having a pressurizing chamber (14) communicated with a cylinder (4a) accommodating a plunger (12). Fluid in the pressurizing chamber is pressurized by reciprocating the plunger. The intermediate member is arranged between a cover (6) and a flange (8) and is clamped by clamping bolts (40). An electromagnetic spill valve (10) for receiving reaction force from the pressurizing chamber when the fluid in the pressurizing chamber is pressurized is attached to the cover (6) at a position for reducing the clamping force applied to the intermediate member by the clamping bolts.Type: ApplicationFiled: October 16, 2002Publication date: June 5, 2003Inventors: Kazuhiro Asayama, Hirokazu Yokoyama, Shinobu Ishida, Hiroshi Inoue
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Publication number: 20020188917Abstract: A defect inspection method and a defect inspection apparatus accurately determine whether potential defects on a surface of a wafer are true defects, and restrains the oversight or the like of defects, permitting reliable quality assurance and accurate quality control to be achieved. The number and positions of detected potential defects are used as the parameters for determining whether potential defects are true defects. The density of potential defects is determined, and the determined density is compared with a set value to decide whether the potential defects are true defects. A surface of a wafer is captured using a differential interference microscope, and the image is processed to count the number of potential defects observed on the surface. The potential defects are detected at the spots where luminance shifts in the captured image. A spatial filter is applied to the captured image to enhance the area where the luminance shifts, and the enhanced area is binarized.Type: ApplicationFiled: May 29, 2002Publication date: December 12, 2002Applicant: SUMITOMO MITSUBISHI SILICON CORPORATIONInventors: Hirokazu Yokoyama, Yutaka Nakashima