Patents by Inventor Hiroki Sugihara

Hiroki Sugihara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11841332
    Abstract: An inspection apparatus and method are described for detecting, with high accuracy, whether a structure contains defects, where the inspection apparatus comprises: an X-ray emitting means (1a, 1b) for emitting X-rays through two or more paths; one or more X-ray detection means (3) for detecting the X-rays passing through the a structure (2); a multiple position distance measurement means (4) for measuring the distance from the X-ray emitting means to the structure at a plurality of positions; and an image processing means (5).
    Type: Grant
    Filed: December 19, 2019
    Date of Patent: December 12, 2023
    Assignee: Toray Industries, Inc.
    Inventors: Hiroki Sugihara, Takahiro Tanino
  • Patent number: 11493459
    Abstract: For the purpose of enabling high-accuracy detection as to whether a molded resin product is a non-defective product or a defective product and advance detection of a molded resin product that may suffer deformation or the like in the future, the present invention relates to an inspection method and a manufacturing method for a molded resin product as well as an inspection device and a manufacturing device for a molded resin product, wherein, in an inspection of a joint interface of a molded resin product divided into a plurality of members, the height positions of defect candidates are measured from the results of detecting X rays radiated via at least two paths when the X rays are transmitted through the molded resin product, which makes it possible to detect a defect with high accuracy.
    Type: Grant
    Filed: September 28, 2018
    Date of Patent: November 8, 2022
    Assignee: Toray Industries, Inc.
    Inventors: Hiroki Sugihara, Takahiro Tanino
  • Patent number: 11341630
    Abstract: A lighting for defect inspection of sheet-shaped objects includes: an elongated light application unit configured to apply illumination light to a sheet-shaped object, the light application unit extending in a second direction that is orthogonal to a first direction on a surface of the sheet-shaped object; a first light shielding unit that is located on a light path from the light application unit to the sheet-shaped object, the first light shielding unit having light shielding sections and opening sections alternately arranged; and a second light shielding unit that is located between the first light shielding unit and the sheet-shaped object, the second light shielding unit having light shielding sections and opening sections alternately arranged in a direction parallel to the second direction.
    Type: Grant
    Filed: August 23, 2019
    Date of Patent: May 24, 2022
    Assignee: Toray Industries, Inc.
    Inventor: Hiroki Sugihara
  • Publication number: 20220057342
    Abstract: It is possible to detect, with high accuracy, whether a structure is a good product or a defective product. This inspection apparatus for a structure comprises: X-ray emitting means (1a, 1b) for emitting X-rays through two or more paths; one or more X-ray detection means (3) for detecting the X-rays passing through the a structure (2); a multiple position distance measurement means (4) for measuring the distance from the X-ray emitting means to the structure at a plurality of positions; and an image processing means (5).
    Type: Application
    Filed: December 19, 2019
    Publication date: February 24, 2022
    Applicant: Toray Industries, Inc.
    Inventors: Hiroki Sugihara, Takahiro Tanino
  • Publication number: 20210358109
    Abstract: A lighting for defect inspection of sheet-shaped objects includes: an elongated light application unit configured to apply illumination light to a sheet-shaped object, the light application unit extending in a second direction that is orthogonal to a first direction on a surface of the sheet-shaped object; a first light shielding unit that is located on a light path from the light application unit to the sheet-shaped object, the first light shielding unit having light shielding sections and opening sections alternately arranged; and a second light shielding unit that is located between the first light shielding unit and the sheet-shaped object, the second light shielding unit having light shielding sections and opening sections alternately arranged in a direction parallel to the second direction.
    Type: Application
    Filed: August 23, 2019
    Publication date: November 18, 2021
    Applicant: Toray Industries, Inc.
    Inventor: Hiroki Sugihara
  • Patent number: 10955354
    Abstract: A cylindrical-body surface inspection device includes: a light irradiation unit configured to irradiate the cylindrical body with light; a two-dimensional imaging unit; a scanning-position determination unit configured to determine at a predetermined period, with respect to two-dimensional image data acquired by the two-dimensional imaging unit, a scanning position that is corresponding to a circumferential direction of the cylindrical body; a time-series scanning image generator configured to perform extraction of image data in a second direction perpendicular to the first direction at the scanning position determined by the scanning-position determination unit on a plurality of pieces of the two-dimensional image data acquired by the two-dimensional imaging unit, and generate a time-series scanning image by arranging in chronological order in the first direction each piece of extracted image data of the second direction; and an inspection unit configured to inspect the time-series scanning image to detect a
    Type: Grant
    Filed: March 2, 2018
    Date of Patent: March 23, 2021
    Inventor: Hiroki Sugihara
  • Publication number: 20200249180
    Abstract: For the purpose of enabling high-accuracy detection as to whether a molded resin product is a non-defective product or a defective product and advance detection of a molded resin product that may suffer deformation or the like in the future, the present invention relates to an inspection method and a manufacturing method for a molded resin product as well as an inspection device and a manufacturing device for a molded resin product, wherein, in an inspection of a joint interface of a molded resin product divided into a plurality of members, the height positions of defect candidates are measured from the results of detecting X rays radiated via at least two paths when the X rays are transmitted through the molded resin product, which makes it possible to detect a defect with high accuracy.
    Type: Application
    Filed: September 28, 2018
    Publication date: August 6, 2020
    Applicant: Toray Industries, Inc.
    Inventors: HIroki Sugihara, Takahiro Tanino
  • Publication number: 20200116648
    Abstract: A cylindrical-body surface inspection device includes: a light irradiation unit configured to irradiate the cylindrical body with light; a two-dimensional imaging unit; a scanning-position determination unit configured to determine at a predetermined period, with respect to two-dimensional image data acquired by the two-dimensional imaging unit, a scanning position that is corresponding to a circumferential direction of the cylindrical body; a time-series scanning image generator configured to perform extraction of image data in a second direction perpendicular to the first direction at the scanning position determined by the scanning-position determination unit on a plurality of pieces of the two-dimensional image data acquired by the two-dimensional imaging unit, and generate a time-series scanning image by arranging in chronological order in the first direction each piece of extracted image data of the second direction; and an inspection unit configured to inspect the time-series scanning image to detect a
    Type: Application
    Filed: March 2, 2018
    Publication date: April 16, 2020
    Applicant: Toray Industries, Inc.
    Inventor: Hiroki Sugihara
  • Publication number: 20190033229
    Abstract: An inspection device for a sheet object includes: an irradiation unit configured to irradiate, with irradiation light, the sheet object that is continuously conveyed; a projection unit configured to project transmitted light or reflected light from the sheet object; an image capture unit configured to capture a projection image projected on the projection unit; and a data processing unit configured to detect a defect present on the sheet object from image data captured by the image capture unit. A longitudinal direction of the irradiation unit viewed from a direction perpendicular to a traveling surface of the sheet object is same as a conveyance direction of the sheet object, and the irradiation unit is configured to emit light spreading in a sheet width direction of the sheet object.
    Type: Application
    Filed: December 22, 2016
    Publication date: January 31, 2019
    Applicant: Toray Industries, Inc.
    Inventors: Keita Ikeda, Hiroki Sugihara, Kazuki Nakata
  • Patent number: 7412088
    Abstract: A method of inspecting a display panel having a substrate and a plurality of fluorescent layers including measuring bright and dark signals reflected by the fluorescent layers while moving the substrate or an illuminating means generating the signals and an imaging means receiving the signals in a direction across the plurality of fluorescent layers at predetermined intervals, and measuring an application volume for each fluorescent layer from the signals obtained by the imaging means.
    Type: Grant
    Filed: February 28, 2002
    Date of Patent: August 12, 2008
    Assignee: Toray Industries, Inc.
    Inventors: Osamu Kuramata, Hiromichi Sasamoto, Hiroki Sugihara, Keiji Tsuda
  • Publication number: 20040135827
    Abstract: An object of the present invention is to provide a display panel inspection method, a display panel inspection device, and a display panel manufacturing method capable of determining the optimum optical conditions for inspecting a surface shape from the structural characteristic of an object to be inspected, reflecting the determined conditions on the inspection device to carry out the inspection with high accuracy, improving the yield without degrading the yield rate, and manufacturing a substrate of high quality and high reliability.
    Type: Application
    Filed: September 4, 2003
    Publication date: July 15, 2004
    Inventors: Osamu Kuramata, Hiromichi Sasamoto, Hiroki Sugihara, Keiji Tsuda