Abstract: To reduce random noise caused by address setting in an apparatus that controls a read address of an image sensing device, without causing a significant increase in circuit complexity. A ring shift register sets a low-order address value depending on a value in steps of which an overall address value is incremented, and a Gray code counter sets a high-order address value. In the ring shift register, a carry from the lowest-order bit to the highest-order bit does not occur, and thus use of the ring shift register makes it possible to reduce the maximum number of toggled bits. The Gray code counter does not need to include a complicated circuit for switching the value in steps of which to increment the high-order address value.

Abstract: In particular for a solid-state image sensor with high resolution, a control line is not driven at any of two end points of the control line, but the control line is driven at two arbitrary dividing points on the control line. Preferably, two points on control line whose distance from a closer end of a range in which skew is to be suppressed is equal to ¼ of the total length of the range may be selected as the dividing points at which the control line is driven. In this case, the time constant at points farthest from the driving points becomes ¼ of that which occurs when the control line is driven at both end points thereof and 1/16 of that which occurs when the control line is driven at one end point thereof, and thus, theoretically, the skew can be reduced to ¼ or 1/16 of that which occurs when the control line is driven at both end points or only one end point.

Abstract: To check circuit characteristics of a function circuit block such as a gain circuit, data indicating an initial set point is set in a data set unit setting time period T1. A plurality of electric signals from converting optical signals of pixel cells for an image are accumulated in a pixel array in an accumulating time period T2. In a data outputting time period T3, a plurality of different set points are set in an automatic set point changing block according to the data set in the data set unit. The electric signals are repeatedly corrected in the gain circuit at a gain while changing the gain corresponding to each of the set points. The corrected electric signals corresponding to the set points are output from a semiconductor image pickup device. In a time period T4, the corrected electric signals is calculated, and the gain circuit characteristics are checked.

Abstract: A semiconductor image pickup device includes a pixel array having pixels arranged in a matrix. Each pixel includes a photodiode that converts an optical signal into an electrical signal, and a transistor connected to a charge accumulation section of the photodiode. A buffer is additionally provided. This buffer controls the transistor of the pixels using a lower control power supply voltage than a power supply voltage of the pixel array.

Abstract: To check circuit characteristics of a function circuit block such as a gain circuit, data indicating an initial set point is set in a data set unit in a data set unit setting time period T1, and a plurality of electric signals obtained by converting optical signals input to pixel cells to pickup an image are accumulated in a pixel array in an accumulating time period T2. Thereafter, in a data outputting time period T3, a plurality of set points different from each other are set in an automatic set point changing block according to the data set in the data set unit, the electric signals are repeatedly corrected in the gain circuit at a gain while changing the gain corresponding to each of the set points, and the corrected electric signals corresponding to the set points are output to the outside of a semiconductor image pickup device. Thereafter, in a calculating and judging time period T4, the calculation for the corrected electric signals is performed, and characteristics of the gain circuit are checked.

Abstract: The semiconductor image pickup device comprises a pixel array having a plurality of pixels arranged in a matrix form. Each pixel comprises a photodiode that converts an optical signal into an electric signal, and a transistor connected to a charge accumulation section of the photodiode 3mn. A buffer is additionally provided. This buffer controls the transistor of the pixels using a lower control power supply voltage than a power supply voltage of the pixel array.