Patents by Inventor Hiroko Onuki

Hiroko Onuki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11892416
    Abstract: A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and notify a user of information indicating a relationship between a first orientation of a pattern on the surface detected from the image and a second orientation that gives a direction of imaging in which a sensitivity of detection by the imaging device is high.
    Type: Grant
    Filed: November 2, 2021
    Date of Patent: February 6, 2024
    Assignee: FUJIFILM Business Innovation Corp.
    Inventors: Kiyofumi Aikawa, Takashi Hiramatsu, Kaito Tasaki, Miho Uno, Hirokazu Ichikawa, Hiroko Onuki, Yoshitaka Kuwada
  • Patent number: 11710225
    Abstract: The disclosure provides a surface inspection apparatus for inspecting a surface of an object, a non-transitory computer readable medium thereof, and a surface inspection method thereof. According to an aspect of the disclosure, the surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and display, on a display device, the image including an index for specifying a position of a portion that has contributed to the calculation of the numerical value and the numerical value.
    Type: Grant
    Filed: October 31, 2021
    Date of Patent: July 25, 2023
    Assignee: FUJIFILM Business Innovation Corp.
    Inventors: Takashi Hiramatsu, Kaito Tasaki, Kiyofumi Aikawa, Miho Uno, Hirokazu Ichikawa, Hiroko Onuki, Yoshitaka Kuwada
  • Publication number: 20230089064
    Abstract: A surface inspection apparatus includes an imaging device that images a surface of an object to be inspected, and a processor configured to: calculate an evaluation value of a texture of the object through processing of an image imaged by the imaging device; and detect reflection of a cause of erroneous calculation of the image within a specific range based on at least brightness information of the image.
    Type: Application
    Filed: February 6, 2022
    Publication date: March 23, 2023
    Applicant: FUJIFILM Business Innovation Corp.
    Inventors: Kiyofumi AIKAWA, Takashi HIRAMATSU, Kaito TASAKI, Miho UNO, Hirokazu ICHIKAWA, Hiroko ONUKI, Yoshitaka KUWADA
  • Publication number: 20220392052
    Abstract: A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and display, on a display device, the image including an index for specifying a position of a portion that has contributed to the calculation of the numerical value and the numerical value.
    Type: Application
    Filed: October 31, 2021
    Publication date: December 8, 2022
    Applicant: FUJIFILM Business Innovation Corp.
    Inventors: Takashi HIRAMATSU, Kaito TASAKI, Kiyofumi AIKAWA, Miho UNO, Hirokazu ICHIKAWA, Hiroko ONUKI, Yoshitaka KUWADA
  • Publication number: 20220390385
    Abstract: A surface inspection apparatus includes an imaging device configured to image a surface of an object to be inspected, and a processor configured to: calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device, and notify a user of information indicating a relationship between a first orientation of a pattern on the surface detected from the image and a second orientation that gives a direction of imaging in which a sensitivity of detection by the imaging device is high.
    Type: Application
    Filed: November 2, 2021
    Publication date: December 8, 2022
    Applicant: FUJIFILM Business Innovation Corp.
    Inventors: Kiyofumi AIKAWA, Takashi HIRAMATSU, Kaito TASAKI, Miho UNO, Hirokazu ICHIKAWA, Hiroko ONUKI, Yoshitaka KUWADA
  • Publication number: 20220291137
    Abstract: A surface inspection apparatus includes an imaging device that images a portion of an object to be inspected, a first light source that is included in multiple light sources that illuminate the portion and that is configured such that a light component that is included in light emitted from the first light source and that is reflected by specular reflection from the portion to be inspected is a principal light component that is incident on the imaging device, and a second light source that is included in the multiple light sources and that is disposed opposite the first light source with an optical axis of the imaging device interposed therebetween such that a light component that is reflected by diffuse reflection from the portion to be inspected is a principal light component that is incident on the imaging device.
    Type: Application
    Filed: July 21, 2021
    Publication date: September 15, 2022
    Applicant: FUJIFILM Business Innovation Corp.
    Inventors: Takashi HIRAMATSU, Kaito TASAKI, Kiyofumi AIKAWA, Miho UNO, Hiroko ONUKI, Hirokazu ICHIKAWA, Yoshitaka KUWADA
  • Publication number: 20220277168
    Abstract: An information processing apparatus includes a processor configured to: acquire positional information indicating a position of a portion of an article; acquire condition information indicating a condition of the portion of the article; and store the positional information and the condition information in association with each other.
    Type: Application
    Filed: July 13, 2021
    Publication date: September 1, 2022
    Applicant: FUJIFILM Business Innovation Corp.
    Inventors: Hiroko ONUKI, Takashi HIRAMATSU
  • Patent number: 7058543
    Abstract: An analysis and evaluation apparatus analyzes, for organizations and individuals, the communication content of email, and extracts common words for each organization. The analysis and evaluation apparatus compares common words and concepts for an organization or an individual that is to be evaluated, with common words and concepts for other organizations, and performs an evaluation to determine how they influence the other organizations. Thereafter, the analysis and evaluation apparatus analyzes the usage level whereat the other organizations utilize the organization or individual to be evaluated. And then, based on the usage level and the number of organizations that are influenced by the organization or the individual to be evaluated, the analysis and evaluation apparatus evaluates and ascertains the value of the organization or individual to be evaluated, and analyzes and stores a time-transient change as to how others are influenced.
    Type: Grant
    Filed: January 23, 2004
    Date of Patent: June 6, 2006
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Masamichi Takahashi, Masakazu Fujimoto, Nobuhiro Yamasaki, Hiroyuki Hattori, Hiroko Onuki
  • Publication number: 20040215502
    Abstract: An analysis and evaluation apparatus conducts a survey by questionnaire of the members of organizations, and extracts from the responses to the questionnaire common words (attributes) for each organization or for each member. The analysis and evaluation apparatus compares the attribute to be evaluated with a common word and concept for an organization or a member, and analyzes the range and the level that the attribute to be evaluated provides for the influence for the organization. In this manner, the evaluation of the organization or the member is performed. Further, the analysis and evaluation apparatus performs a statistical analysis and a time-series analysis for the evaluation results, and stores or outputs the evaluation results and the analysis results.
    Type: Application
    Filed: January 23, 2004
    Publication date: October 28, 2004
    Applicant: FUJI XEROX CO., LTD.
    Inventors: Masamichi Takahashi, Masakazu Fujimoto, Nobuhiro Yamasaki, Hiroyuki Hattori, Hiroko Onuki
  • Publication number: 20040210422
    Abstract: An analysis and evaluation apparatus analyzes, for organizations and individuals, the communication content of email, and extracts common words for each organization. The analysis and evaluation apparatus compares common words and concepts for an organization or an individual that is to be evaluated, with common words and concepts for other organizations, and performs an evaluation to determine how they influence the other organizations. Thereafter, the analysis and evaluation apparatus analyzes the usage level whereat the other organizations utilize the organization or individual to be evaluated. And then, based on the usage level and the number of organizations that are influenced by the organization or the individual to be evaluated, the analysis and evaluation apparatus evaluates and ascertains the value of the organization or individual to be evaluated, and analyzes and stores a time-transient change as to how others are influenced.
    Type: Application
    Filed: January 23, 2004
    Publication date: October 21, 2004
    Applicant: FUJI XEROX CO., LTD.
    Inventors: Masamichi Takahashi, Masakazu Fujimoto, Nobuhiro Yamasaki, Hiroyuki Hattori, Hiroko Onuki