Patents by Inventor Hiromasa Niwa

Hiromasa Niwa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Timing adjustment method and apparatus for semiconductor IC tester
    Patent number: 6448799
    Abstract: A comparator (30) is connected through switches (13, 14 and 15) with two or more drive-only pins, and the comparator 30 is shared by two or more drive-only pins by changing the switches (13, 14 and 15). The switches are changed one by one and the signal judgment system deskew is carried out on the drive-only pin, which is connected with the comparator. Then, the switches are changed one by one similarly and the signal supply system deskew is carried out using the result of the signal judgment system deskew. Even if the semiconductor IC tester has the drive-only tester pins, the timing adjustment can be performed by carrying out the signal judgment system deskew and the signal supply system deskew.
    Type: Grant
    Filed: June 20, 2000
    Date of Patent: September 10, 2002
    Assignee: Hitachi Electronics Engineering Co., Ltd.
    Inventor: Hiromasa Niwa