Abstract: A clamping apparatus detachably clamps a work on a pallet. When a second pressing plate moves down from the unclamped state of a first position, elastic force of a first elastic member acts on a shaft through a first retainer and first operating balls so that a clamping arm is pressed down. When a first pressing plate moves down by a short distance, the first operating balls shift to the position of an unlocking segment of a sleeve, and a second operating balls are also located at an unlocking segment of a clamping case, to realize a releasing position. When the shaft is located at the releasing position where the first and second operating balls are not engaged with the shaft, the shaft can be removed from the clamping case.

Abstract: A clamping apparatus detachably clamps a work on a pallet. When a second pressing plate moves down from the unclamped state of a first position, elastic force of a first elastic member acts on a shaft through a first retainer and first operating balls so that a clamping arm is pressed down. When a first pressing plate moves down by a short distance, the first operating balls shift to the position of an unlocking segment of a sleeve, and a second operating balls are also located at an unlocking segment of a clamping case, to realize a releasing position. When the shaft is located at the releasing position where the first and second operating balls are not engaged with the shaft, the shaft can be removed from the clamping case.

Abstract: A flash memory testing apparatus is capable of testing a flash memory while maintaining the conventional memory test functions. The flash memory testing apparatus obtains the number of programming pulses applied to each address of the flash memory. The flash memory testing apparatus executes the following steps: comparing a readout data of the flash memory under test under a writing or erasing test with an expected data output from a test pattern generator, outputting a failure signal to a failure analysis memory to store the failure data in a memory part in the failure memory in case where readout data does not coincide with an expected data, and outputting a pass signal when the readout data coincides with the expected data. The flash memory testing system has a counter for counting the number of programming pulses or erasing pulses and supplying the count data to the memory part of the failure analysis memory.

Abstract: In a memory tester in which data read out of an address of a memory under test, specified by a pattern generator, is compared with an expected value and the result of comparison is written into a failure analysis memory at the address corresponding to that of the memory under test from which the data was read out, the output address of an address pointer which is incremented or decremented upon each application of a clock and the address from the pattern generator are selectively applied to the failure analysis memory. In the case of testing a memory which has an internal address generating function, the address from the address pointer is provided to the failure analysis memory.