Patents by Inventor Hiromitsu Furukawa

Hiromitsu Furukawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220369959
    Abstract: The present invention is provided with a four-wavelength light emitter that emits four kinds of wavelengths of light toward a predetermined site on a living body; a light receiver that receives the four kinds of wavelengths of light transmitted through the predetermined site on the living body; a received light intensity information acquirer that acquires received light intensity information for the four wavelengths on the basis of an optical signal received by the light receiver; an absorbance time change value acquirer that finds time change values of the absorbances corresponding to the four wavelengths on the basis of the received light intensity information of the four wavelengths; a calibration data table that stores calibration data for finding a predetermined component in blood based on the absorbance time change values; and a component concentration acquirer that finds the concentration of the predetermined component in the blood.
    Type: Application
    Filed: November 5, 2020
    Publication date: November 24, 2022
    Applicants: National Institute of Advanced Industrial Science and Technology, CBC Co., Ltd.
    Inventors: Hiromitsu FURUKAWA, Anri WATANABE, Shinichi NAKAMURA, Hiroaki AIZAWA
  • Patent number: 7154092
    Abstract: Method of three-dimensional image reconstruction and transmission electron microscope capable of producing three-dimensional images. When a TEM image is taken at each tilt angle of a specimen, the amount of defocus ?f is switched to plural amounts ?f1, ?f2, and ?f3, in turn. When a three-dimensional image is reconstructed, image data stored in the image memory is sent to a CRT. TEM images acquired with the amounts ?f1, ?f2, and ?f3 are displayed on the CRT. One optimum TEM image is selected at each tilt angle of the specimen. A three-dimensional image reconstruction circuit reconstructs a three-dimensional image based on the selected TEM images.
    Type: Grant
    Filed: August 18, 2005
    Date of Patent: December 26, 2006
    Assignee: JEOL Ltd.
    Inventor: Hiromitsu Furukawa
  • Patent number: 7064326
    Abstract: An electron microscope is offered which can analyze the three-dimensional structure of a specimen without sectioning it by making use of computerized tomography. The microscope has solved the problems intrinsic to the microscope and permits application of computerized tomography to general cases. A series of transmission images is obtained by tilting the specimen by plural angles. Two-dimensional correlation processing is performed between each of the series of images and a reference image. The same field of view is selected and extracted. Thus, positional deviation of the specimen is corrected.
    Type: Grant
    Filed: June 24, 2004
    Date of Patent: June 20, 2006
    Assignees: JEOL Ltd., JEOL System Technology Co., Ltd.
    Inventors: Hiromitsu Furukawa, Miyoko Shimizu
  • Publication number: 20060038127
    Abstract: Method of three-dimensional image reconstruction and transmission electron microscope capable of producing three-dimensional images. When a TEM image is taken at each tilt angle of a specimen, the amount of defocus ?f is switched to plural amounts ?f1, ?f2, and ?f3, in turn. When a three-dimensional image is reconstructed, image data stored in the image memory is sent to a CRT. TEM images acquired with the amounts ?f1, ?f2, and ?f3 are displayed on the CRT. One optimum TEM image is selected at each tilt angle of the specimen. A three-dimensional image reconstruction circuit reconstructs a three-dimensional image based on the selected TEM images.
    Type: Application
    Filed: August 18, 2005
    Publication date: February 23, 2006
    Applicant: JEOL Ltd.
    Inventor: Hiromitsu Furukawa
  • Publication number: 20050029452
    Abstract: An electron microscope is offered which can analyze the three-dimensional structure of a specimen without sectioning it by making use of computerized tomography. The microscope has solved the problems intrinsic to the microscope and permits application of computerized tomography to general cases. A series of transmission images is obtained by tilting the specimen by plural angles. Two-dimensional correlation processing is performed between each of the series of images and a reference image. The same field of view is selected and extracted. Thus, positional deviation of the specimen is corrected.
    Type: Application
    Filed: June 24, 2004
    Publication date: February 10, 2005
    Applicants: JEOL Ltd., JEOL System Technology Co., Ltd.
    Inventors: Hiromitsu Furukawa, Miyoko Shimizu