Patents by Inventor Hiroshi Daimon

Hiroshi Daimon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11791148
    Abstract: Provided is a compact two-dimensional electron spectrometer that is capable of variably adjusting the deceleration ratio over a wide range, and performing simultaneous measurement of the two-dimensional emission angle distribution with a high energy resolution over a wide solid angle of acquisition. The two-dimensional electron spectrometer is configured from: a variable deceleration ratio spherical aberration correction electrostatic lens; a cylindrical mirror type energy analyzer or a wide angle energy analyzer; and a projection lens.
    Type: Grant
    Filed: August 5, 2019
    Date of Patent: October 17, 2023
    Assignee: University Corporation National Nara Institute of Science and Technology
    Inventors: Hiroyuki Matsuda, Hiroshi Daimon, Laszlo Toth
  • Publication number: 20210193448
    Abstract: Provided is a compact two-dimensional electron spectrometer that is capable of variably adjusting the deceleration ratio over a wide range, and performing simultaneous measurement of the two-dimensional emission angle distribution with a high energy resolution over a wide solid angle of acquisition. The two-dimensional electron spectrometer is configured from: a variable deceleration ratio spherical aberration correction electrostatic lens; a cylindrical mirror type energy analyzer or a wide angle energy analyzer; and a projection lens.
    Type: Application
    Filed: August 5, 2019
    Publication date: June 24, 2021
    Inventors: Hiroyuki MATSUDA, Hiroshi DAIMON, Laszlo Toth
  • Patent number: 7655923
    Abstract: A mesh (M) having an ellipsoid shape or a shape close to the ellipsoid shape is attached to an electrode (EL1) among electrodes (EL1 to ELn). Voltages of the later-stage electrodes (EL2 to ELn) are appropriately set. With this arrangement, a local negative spherical aberration generated by the mesh (M) is cancelled out with a positive spherical aberration. This optimizes an electric field distribution. As a result, this realizes an electrostatic lens whose acceptance angle is extended to about ±60°.
    Type: Grant
    Filed: November 9, 2004
    Date of Patent: February 2, 2010
    Assignees: National University Corporation Nara Institute of Science and Technology, Jeol, Ltd.
    Inventors: Hiroshi Daimon, Hiroyuki Matsuda, Makoto Kato, Masato Kudo
  • Publication number: 20080135748
    Abstract: A mesh (M) having an ellipsoid shape or a shape close to the ellipsoid shape is attached to an electrode (EL1) among electrodes (EL1 to ELn). Voltages of the later-stage electrodes (EL2 to ELn) are appropriately set. With this arrangement, a local negative spherical aberration generated by the mesh (M) is cancelled out with a positive spherical aberration. This optimizes an electric field distribution. As a result, this realizes an electrostatic lens whose acceptance angle is extended to about±60°.
    Type: Application
    Filed: November 9, 2004
    Publication date: June 12, 2008
    Inventors: Hiroshi Daimon, Hiroyuki Matsuda, Makoto Kato, Masato Kudo
  • Patent number: 6690007
    Abstract: Forward scattering peaks of photoelectrons having different angular momenta is generated by radiating to a sample two rays of circularly polarized light that differ in a rotary direction. Two images of photoelectron diffraction patterns are formed by two-dimensionally detecting the photoelectron diffraction patterns formed with the photoelectron forward scattering peaks. The observer can three-dimensionally observe the structure in an atomic arrangement by observing these photoelectron diffraction pattern images with his or hers right and left eyes, respectively.
    Type: Grant
    Filed: August 2, 2001
    Date of Patent: February 10, 2004
    Assignee: Shimadzu Corporation
    Inventor: Hiroshi Daimon
  • Publication number: 20020014589
    Abstract: Forward scattering peaks of photoelectrons having different angular momenta is generated by radiating to a sample two rays of circularly polarized light that differ in a rotary direction. Two images of photoelectron diffraction patterns are formed by two-dimensionally detecting the photoelectron diffraction patterns formed with the photoelectron forward scattering peaks. The observer can three-dimensionally observe the structure in an atomic arrangement by observing these photoelectron diffraction pattern images with his or hers right and left eyes, respectively.
    Type: Application
    Filed: August 2, 2001
    Publication date: February 7, 2002
    Applicant: SHIMADZU CORPORATION
    Inventor: Hiroshi Daimon
  • Patent number: 5112783
    Abstract: Cubic conductive copper oxide ceramics which are represented by the following formula I:(M.sub.x Cu.sub.y).sub.7 O.sub.z A.sub.w Iwherein M represents at least one element selected from the group consisting of In, Sc, Y, Tl, and Ga, A represents Cl, NO.sub.3, or Cl and NO.sub.3, x+Y is a value of 1, x/y is a number of 0 to 10, z is a number of from 6 to 8, and w is a number of from 1 to 9, and processes for producing same by mixing at least one nitrate and/or chloride of a metal selected from the group consisting of In, Sc, Y, Tl, and Ga, with copper nitrate and/or copper chloride, and firing the mixture at from 200.degree. to 600.degree. C. The copper oxide ceramics are preferably used as electrodes in various fields, heat emiters and also as a material for producing superconductors.
    Type: Grant
    Filed: January 14, 1991
    Date of Patent: May 12, 1992
    Assignees: Ube Industries, Ltd., Agency of Industrial Science and Technology
    Inventors: Ryoji Sugise, Hiroshi Daimon, Itsuhiro Fujii, Hideo Ihara, Norio Terada, Masatoshi Jo, Masayuki Hirabayashi
  • Patent number: 5107111
    Abstract: A charged particle analyzer comprises a spherical grid, a spherical electrode concentric with each other, an emission portion for emitting charged particles, a screen plate having an exit opening, a plurality of second spherical grids forming a high pass filter for the charged particles, a detector for detecting the charged particles, and an obstacle ring being in parallel with an equatorial plane normal to a line connecting the emission portion and the center of the exit opening and being within the spherical electrode.
    Type: Grant
    Filed: July 6, 1990
    Date of Patent: April 21, 1992
    Assignee: Shimadzu Corporation
    Inventors: Hiroshi Daimon, Shozo Ino
  • Patent number: 4849629
    Abstract: A charged particle analyzer comprises a spherical grid, a spherical electrode, a screen plate, and a detector. The spherical electrode is outside of the spherical grid and is concentric with the spherical grid. The screen plate has an entry window and an exit opening, which are symmetrical with the center of the sphere of the spherical grid. A sample is disposed at the entry window of the screen plate. The detector is positioned behind the exit opening to detect charged particles emitted from the sample. The charged particles having the same energy can travel through the exit opening of the screen plate, and their amount or their angular distribution is measured.
    Type: Grant
    Filed: November 13, 1987
    Date of Patent: July 18, 1989
    Assignee: Shimadzu Corporation
    Inventors: Hiroshi Daimon, Shozo Ino
  • Patent number: 4724320
    Abstract: A method for observing the arrangement of atoms in a thin layer on a surface and an apparatus for employing the method are disclosed. According to the method, a finely converged electron beam is directed to a surface of a sample and the X-ray emitted from the surface is detected at a take-off angle equivalent to, or in the vicinity of, the total reflection angle, thereby avoiding interference from X-rays emitted beneath the surface. The apparatus includes an electron gun, a sample holding means, one or more detectors and devices for storing, processing and displaying the output signal from the detectors. The apparatus also provides for two-dimensional scanning of a surface and for adjustment of the position of the sample and of the detectors.
    Type: Grant
    Filed: September 25, 1985
    Date of Patent: February 9, 1988
    Assignee: Shozo Ino
    Inventors: Shozo Ino, Hiroshi Daimon, Shuji Hasegawa
  • Patent number: 4373087
    Abstract: A novel copolyamide fiber having an excellent initial modulus of elasticity and mechanical strength, is made from a copolyamide consisting essentially of unit A of the formula (A): ##STR1## unit (B) of the formula (B): ##STR2## and unit (C) of the formula (C): ##STR3## wherein CH.sub.3 groups in the formula (A) are located in the ortho-position to NH groups, the sum of the amount of units (A) and (B) is substantially equimolar to the amount of unit (C) and the molar ratio of unit (A) to unit (B) is from 10/90 to 50/50.
    Type: Grant
    Filed: March 13, 1981
    Date of Patent: February 8, 1983
    Assignee: UBE Industries Ltd.
    Inventors: Takaho Kaneda, Seiji Ishikawa, Hiroshi Daimon, Toshio Katsura, Tadahiro Hondo, Masahiro Ueda
  • Patent number: 4178431
    Abstract: Fibers of a copolyamide derived from a diamine component including 10 to 50 mole % of benzidine sulfone or 2,7-diaminophenanthridone and 90 to 50 mole % of p-phenylene diamine and a dicarboxylic acid component derived from a reactive derivative of terephthalic acid are disclosed. The fibers have an initial modulus of elasticity of at least 400 g/d and a tensile strength of at least 16 g/d.The fibers have in combination various desirable properties, such as excellent initial modulus of elasticity, high tensile strength, high knot strength, high heat resistance and good adhesiveness to various plastics, rubbers and adhesives, and they are valuably used in various industrial fields as fibrous reinforcers and for production of fiber-reinforced plastics and rubber products.
    Type: Grant
    Filed: May 20, 1977
    Date of Patent: December 11, 1979
    Assignee: Ube Industries, Ltd.
    Inventors: Takaho Kaneda, Seiji Ishikawa, Hiroshi Daimon, Toshio Katsura, Tatsuaki Maeda, Tadahiro Hondo