Patents by Inventor Hiroshi Ezoe

Hiroshi Ezoe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor device testing apparatus and device interface board
    Patent number: 7514950
    Abstract: A interface board is provided with a first and second contact instruments each comprising a first and second contact terminal groups to which a first to third type semiconductor devices having different numbers of external terminals used can be connected. The first contact terminal group of the first contact instrument is connected to the corresponding terminals of the second contact terminal group of the second contact instrument using bridging lines. One end of each bridging wire is connected to a driver output pin of an channel provided in pin electronics. The other end of the bridging wire is connected to a comparator input pin of the IO channel provided in the pin electronics. The first contact terminal group of the second contact instrument is connected, using different connection lines, to a driver output pin and a comparator input pin of an IO channel provided in the pin electronics.
    Type: Grant
    Filed: April 7, 2008
    Date of Patent: April 7, 2009
    Assignee: Advantest Corporation
    Inventor: Hiroshi Ezoe
  • Semiconductor device testing apparatus and device interface board
    Publication number: 20080191731
    Abstract: A interface board is provided with a first and second contact instruments each comprising a first and second contact terminal groups to which a first to third type semiconductor devices having different numbers of external terminals used can be connected. The first contact terminal group of the first contact instrument is connected to the corresponding terminals of the second contact terminal group of the second contact instrument using bridging lines. One end of each bridging wire is connected to a driver output pin of an channel provided in pin electronics. The other end of the bridging wire is connected to a comparator input pin of the IO channel provided in the pin electronics. The first contact terminal group of the second contact instrument is connected, using different connection lines, to a driver output pin and a comparator input pin of an IO channel provided in the pin electronics.
    Type: Application
    Filed: April 7, 2008
    Publication date: August 14, 2008
    Applicant: Advantes Corporation
    Inventor: Hiroshi Ezoe
  • Semiconductor device testing apparatus and device interface board
    Patent number: 7372287
    Abstract: A interface board is provided with a first and second contact instruments each comprising a first and second contact terminal groups to which a first to third type semiconductor devices having different numbers of external terminals used can be connected. The first contact terminal group of the first contact instrument is connected to the corresponding terminals of the second contact terminal group of the second contact instrument using bridging lines. One end of each bridging wire is connected to a driver output pin of an IO channel provided in pin electronics. The other end of the bridging wire is connected to a comparator input pin of the IO channel provided in the pin electronics. The first contact terminal group of the second contact instrument is connected, using different connection lines, to a driver output pin and a comparator input pin of an IO channel provided in the pin electronics.
    Type: Grant
    Filed: December 28, 2004
    Date of Patent: May 13, 2008
    Assignee: Advantest Corporation
    Inventor: Hiroshi Ezoe
  • Semiconductor Device Testing Apparatus And Device Interface Board
    Publication number: 20070205790
    Abstract: A interface board is provided with a first and second contact instruments each comprising a first and second contact terminal groups to which a first to third type semiconductor devices having different numbers of external terminals used can be connected. The first contact terminal group of the first contact instrument is connected to the corresponding terminals of the second contact terminal group of the second contact instrument using bridging lines. One end of each bridging wire is connected to a driver output pin of an IO channel provided in pin electronics. The other end of the bridging wire is connected to a comparator input pin of the IO channel provided in the pin electronics. The first contact terminal group of the second contact instrument is connected, using different connection lines, to a driver output pin and a comparator input pin of an IO channel provided in the pin electronics.
    Type: Application
    Filed: December 28, 2004
    Publication date: September 6, 2007
    Applicant: ADVANTEST CORPORATION
    Inventor: Hiroshi Ezoe