Abstract: A pattern sewing machine which recognizes a reference point of a cloth in a cloth holding frame 2 by recognition means 11, can space stitch point data of the current sewing pattern to be sewn in the cloth holding frame 2 at a predetermined pattern distance apart from the already formed embroidered pattern in X and Y directions by correction means 13i based on the reference point, detects a rotation direction shift of the cloth set in the cloth holding frame 2 by rotation direction shift detection means 13g, and corrects the stitch point data spaced at the predetermined pattern distance apart from the already formed embroidered pattern in the X and Y directions in the rotation direction with the reference point as the center by the correction means 13i based on the reference point and the cloth rotation direction shift, thereby finely matching the relative positions of the already formed sewing pattern and the subsequent sewing pattern to be sewn.