Abstract: A forklift drive unit is configured to be installed in a forklift. The forklift drive unit includes an electric motor and a transmission. The electric motor is configured to drive and rotate a drive wheel. The transmission is configured to change a speed of rotation of the electric motor at a variable gear ratio.

Abstract: The pipe inspection method and apparatus can be used to implement rapid, tomographic inspection of a pipe set up at a narrow location. The pipe inspection method includes: a first step for scanning the pipe by translating a radiation source and radiation detector arranged opposedly to the pipe; a second step for the radiation detector to detect radiation that the radiation source has emitted, at given scanning distance intervals; a third step for creating a transmission image of the pipe, based on a radiation dose that the radiation detector has detected; and a fourth step for constructing a tomogram or stereoscopic image of the pipe, based on the transmission image. Thus, it is possible to provide the pipe inspection method and apparatus that can be used to implement rapid, tomographic inspection of the pipe set up at a narrow location.

Abstract: The pipe inspection method and apparatus can be used to implement rapid, tomographic inspection of a pipe set up at a narrow location. The pipe inspection method of the present invention includes: a first step for scanning the pipe by translating a radiation source and radiation detector arranged opposedly to the pipe; a second step for the radiation detector to detect radiation that the radiation source has emitted, at given scanning distance intervals; a third step for creating a transmission image of the pipe, based on a radiation dose that the radiation detector has detected; and a fourth step for constructing a tomogram or stereoscopic image of the pipe, based on the transmission image. According to this invention, it is possible to provide the pipe inspection method and apparatus that can be used to implement rapid, tomographic inspection of the pipe set up at a narrow location.

Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first capacitor having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first capacitor, and an integrator having a second resistor and a second capacitor each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first capacitor are returned to a steady state after irradiation of the pulsed X-ray.

Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first condenser having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first condenser, and an integrator having a second resistor and a second condenser each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first condenser are returned to a steady state after irradiation of the pulsed X-ray.

Abstract: [OBJECT]The present invention provides CT system capable of obtaining tomographic images having high in the image quality regardless of a change in the ambient temperature for a long period of time even if a cooling device is simple. [MEANS FOR ACHIEVING THE OBJECT] Computerized tomography system, comprising: a detecting device to detect radiation rays that penetrates an object to be detected; and a collimator to restrict radiation rays that are entered to the detecting device, wherein a separation gap for separating thermally the collimator and the detecting device is defined between an end surface 6f of the collimator 6 at the detecting device side and an end surface of the a detector holder at the collimator side in the detecting device, and the separation gap is hermetically sealed.

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.

Abstract: A CT imaging method and apparatus in which an object is to be imaged by the CT apparatus using an X-ray or radiation, and a tomographic image of the object is obtained, wherein the object includes a reference portion. The processing the tomographic image is processed and a relative positional relation between a reference coordinate system of the object and a coordinate system of the CT apparatus is obtained. The object is imaged by the CT apparatus, and based on the relative positional relation, a tomographic image of a desired position of the object is obtained.

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor, and an integration circuit for integrating the output signal of the X-ray sensor from which the DC component is removed by the filter.

Abstract: A CT imaging method and apparatus in which an object is to be imaged by the CT apparatus using an X-ray or radiation, and a tomographic image of the object is obtained, wherein the object includes a reference portion. The processing the tomographic image is processed and a relative positional relation between a reference coordinate system of the object and a coordinate system of the CT apparatus is obtained. The object is imaged by the CT apparatus, and based on the relative positional relation, a tomographic image of a desired position of the object is obtained.

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor and a circuit for obtaining a difference between a voltage corresponding to a current including a dark current generated in the X-ray sensor by incidence of the X-ray and a voltage corresponding to the dark current.

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray semiconductor sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray semiconductor sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray semiconductor sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray semiconductor sensor, and an integration circuit for integrating an output signal of the X-ray semiconductor sensor from which the DC component is removed by the filter.

Abstract: A CT imaging method determines geometric features (information representing geometries) of contact surfaces between markers and an object from tomographic images obtained by imaging the object attached with the markers on its reference surfaces using a CT apparatus, determines from the geometric features a positional relation between a reference coordinate system of the object and a coordinate system of the CT apparatus, and, based on the positional relation, produces tomographic images (bit-map data) of a desired portion of the object.

Abstract: An X-ray sensor signal processor including capacitors 114 for removing DC components (dark currents) from output signals of semiconductor sensors 21 to 2n detecting pulse-like X-rays passed through an object, and integrators (each of which is constituted by a combination of an operational amplifier 115, a resistor 116 and a capacitor 117) for integrating the output signals of the X-ray sensors after removal of the DC components by the capacitors 114. By this, a value proportional to the average number of photons in X-rays can be obtained even in the case where a small number of incident photons are given, and an X-ray CT system using the X-ray sensor signal processor.

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor, and an integration circuit for integrating the output signal of the X-ray sensor from which the DC component is removed by the filter.

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor and a circuit for obtaining a difference between a voltage corresponding to a current including a dark current generated in the X-ray sensor by incidence of the X-ray and a voltage corresponding to the dark current.

Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray semiconductor sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray semiconductor sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray semiconductor sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray semiconductor sensor, and an integration circuit for integrating an output signal of the X-ray semiconductor sensor from which the DC component is removed by the filter.

Abstract: A CT imaging method determines geometric features (information representing geometries) of contact surfaces between markers and an object from tomographic images obtained by imaging the object attached with the markers on its reference surfaces using a CT apparatus, determines from the geometric features a positional relation between a reference coordinate system of the object and a coordinate system of the CT apparatus, and, based on the positional relation, produces tomographic images (bit-map data) of a desired portion of the object.

Abstract: An X-ray sensor signal processor including capacitors 114 for removing DC components (dark currents) from output signals of semiconductor sensors 21 to 2n detecting pulse-like X-rays passed through an object, and integrators (each of which is constituted by a combination of an operational amplifier 115, a resistor 116 and a capacitor 117) for integrating the output signals of the X-ray sensors after removal of the DC components by the capacitors 114. By this, a value proportional to the average number of photons in X-rays can be obtained even in the case where a small number of incident photons are given, and an X-ray CT system using the X-ray sensor signal processor.