Abstract: Disclosed herein is a liquid crystal display device having first and second substrates disposed to face each other so as to hold a liquid crystal layer therebetween, and a gate potential creating circuit for outputting a selection potential and a non-selection potential, scanning lines, signal lines, thin film transistors formed so as to correspond to intersection portions between the scanning lines and the signal lines, respectively, pixel electrodes electrically connected to the thin film transistors, respectively, and a gate control circuit for switching the selection potential and the non-selection potential supplied from the gate potential creating circuit over to each other, thereby supplying one of the selection potential and the non-selection potential to corresponding ones of the thin film transistors through corresponding one of the scanning lines being formed on the first substrate, and a common electrode being formed either on the first substrate or the second substrate.

Abstract: An integrated circuit device includes first to Nth memory blocks disposed along a first direction, a power supply circuit, and a data driver disposed in a second direction with respect to the first to Nth memory blocks. The power supply circuit includes an analog reference power supply voltage output circuit that outputs an analog reference power supply voltage. The analog reference power supply voltage output circuit is disposed between an Mth memory block and an (M+1)th memory block among the first to Nth memory blocks. An analog reference power supply line is provided in an area of the data driver along the first direction.

Abstract: A display device includes an integrated circuit device and a display panel. The display panel includes a panel test terminal that is used to test the display panel, and a driver output terminal that is electrically connected with a data driver pad of the integrated circuit device and is electrically connected with the panel test terminal. The integrated circuit device includes a data driver block and a high-speed I/F circuit block including a physical layer circuit. The physical layer circuit is disposed in the integrated circuit device so that the physical layer circuit non-overlaps a predetermined test terminal region, the predetermined test terminal region being a region in which the panel test terminal is predetermined to locate under the integrated circuit device when the integrated circuit device is mounted on the display panel.

Abstract: An integrated circuit device includes a scan driver block, a high-speed interface circuit block, and a scan driver pad arrangement region in which pads electrically connecting scan output lines of the scan driver block and scan lines are disposed. The high-speed interface circuit block includes a physical layer circuit that receives data using differential signals, and a link controller that performs a link layer process. The scan output lines of the scan driver block are provided from the scan driver block to the scan driver pad arrangement region to pass over the link controller while avoiding the physical layer circuit. A common voltage line connecting first and second common voltage pads is provided from the first common voltage pad to the second common voltage pad along a first direction, the common voltage line being provided in a second direction with respect to the physical layer circuit along the first direction in an arrangement region of the physical layer circuit.

Abstract: Disclosed herein is a liquid crystal display device having first and second substrates disposed to face each other so as to hold a liquid crystal layer therebetween, and a gate potential creating circuit for outputting a selection potential and a non-selection potential, scanning lines, signal lines, thin film transistors formed so as to correspond to intersection portions between the scanning lines and the signal lines, respectively, pixel electrodes electrically connected to the thin film transistors, respectively, and a gate control circuit for switching the selection potential and the non-selection potential supplied from the gate potential creating circuit over to each other, thereby supplying one of the selection potential and the non-selection potential to corresponding ones of the thin film transistors through corresponding one of the scanning lines being formed on the first substrate, and a common electrode being formed either on the first substrate or the second substrate.

Abstract: An integrated circuit device includes: a driving voltage output unit that outputs a driving voltage supplied to a segment electrode of an electro-optical panel; a display data storage unit that stores display data; and a driving waveform information output unit that outputs driving waveform information when a display state of the segment electrode is changed from a first display state corresponding to first display data to a second display state corresponding to second display data, wherein the driving voltage output unit outputs the driving voltage specified by the first display data and the second display data from the display data storage unit, and the driving waveform information from the driving waveform information output unit.

Abstract: An integrated circuit device includes a data driver block, a memory block, an information storage block in which an address of a defective cell of the memory block is programmed and stored as a defective address, and a switch control circuit which performs control for switching access to the defective cell to access to a redundant cell. A row address of the defective cell having the row address and a column address is stored in the information storage block as the defective address. The switch control circuit performs control for switching access to the defective cell to access to the redundant cell by comparing a row address for display panel access with the defective address during the display panel access and comparing a row address for host access using the row address and a column address with the defective address during the host access.

Abstract: An integrated circuit device includes first to Nth data driver blocks that are disposed along a first direction. Each of the first to Nth data driver blocks includes first to Mth sub-driver blocks. Each of the sub-driver blocks includes a D/A conversion circuit that receives image data and D/A-converts the image data, and first to Lth data line driver circuits that are disposed along the first direction in a second direction with respect to the D/A conversion circuit and share the D/A conversion circuit.

Abstract: An integrated circuit device includes first to Nth memory blocks disposed along a first direction, a power supply circuit, and a data driver disposed in a second direction with respect to the first to Nth memory blocks. The power supply circuit includes an analog reference power supply voltage output circuit that outputs an analog reference power supply voltage. The analog reference power supply voltage output circuit is disposed between an Mth memory block and an (M+1)th memory block among the first to Nth memory blocks.

Abstract: An integrated circuit device includes first to Nth memory blocks that are disposed along a first direction, and first to Nth data driver blocks that are disposed along the first direction in a second direction with respect to the first to Nth memory blocks. A Jth memory block among the first to Nth memory blocks dot-sequentially reads subpixel image data and outputs the subpixel image data to a corresponding Jth data driver block among the first to Nth data driver blocks, the subpixel image data being image data corresponding to at least one subpixel. The Jth data driver block receives the subpixel image data from the Jth memory block, and outputs a data signal corresponding to the subpixel image data.

Abstract: A display device includes an integrated circuit device and a display panel. The display panel includes a panel test terminal that is used to test the display panel, and a driver output terminal that is electrically connected with a data driver pad of the integrated circuit device and is electrically connected with the panel test terminal. The integrated circuit device includes a data driver block and a high-speed I/F circuit block including a physical layer circuit. The physical layer circuit is disposed in the integrated circuit device so that the physical layer circuit non-overlaps a predetermined test terminal region, the predetermined test terminal region being a region in which the panel test terminal is predetermined to locate under the integrated circuit device when the integrated circuit device is mounted on the display panel.

Abstract: An integrated circuit device includes a scan driver block, a high-speed interface circuit block, and a scan driver pad arrangement region in which pads electrically connecting scan output lines of the scan driver block and scan lines are disposed. The high-speed interface circuit block includes a physical layer circuit that receives data using differential signals, and a link controller that performs a link layer process. The scan output lines of the scan driver block are provided from the scan driver block to the scan driver pad arrangement region to pass over the link controller while avoiding the physical layer circuit. A common voltage line connecting first and second common voltage pads is provided from the first common voltage pad to the second common voltage pad along a first direction, the common voltage line being provided in a second direction with respect to the physical layer circuit along the first direction in an arrangement region of the physical layer circuit.

Abstract: An integrated circuit device includes a data driver block, a memory block, an information storage block in which an address of a defective cell of the memory block is programmed and stored as a defective address, and a switch control circuit which performs control for switching access to the defective cell to access to a redundant cell. A row address of the defective cell having the row address and a column address is stored in the information storage block as the defective address. The switch control circuit performs control for switching access to the defective cell to access to the redundant cell by comparing a row address for display panel access with the defective address during the display panel access and comparing a row address for host access using the row address and a column address with the defective address during the host access.