Abstract: An easy to use scanning probe instrument such as a microscope or memory device is provided with a probe which does not require optical alignment. The scanning probe is a cantilever probe adapted to undergo relative movement with respect to an object such as a sample or a recording media. Optical interference and/or displacement of the cantilever probe caused by interaction with the object while the probe is being scanned across the object is measured to determine characteristics of the object. The cantilever probe has a base member, a cantilever formed in the base member, at least a portion of the cantilever being elastically deflectable to enable the cantilever to be displaced in a given direction.

Abstract: An apparatus capable of measuring the topography and the optical characteristics of the surface of a sample at high resolution irrespective of the transmittance and the conductivity of the sample is realized. The apparatus comprises a probe, a light source for illuminating a sample with light, a photoelectric converter device and optics for receiving light transmitted through the sample or light reflected by the sample, a laser emitting laser light for detecting deflections of the probe, a condenser lens for directing the laser light to the rear surface of the probe, a detection system for detecting reflected light, a rough-motion mechanism and a fine-motion mechanism for moving the sample and the probe relative to each other, a control means for controlling the distance between the sample and the probe, and a computer for controlling the whole apparatus. The probe has a front end portion and a light-propagating body continuous with the front end portion.

Abstract: An optical probe is used in a near-field effect microscope for performing topographical observation and physical property measurement on a surface of a sample. The optical probe comprises an optical resonator having an optical fiber having at least one microscopic projection composed of a dielectric material disposed at an end portion of the optical fiber for transmitting light.

Abstract: A quartz oscillator for detecting a physicochemical change in a substance to be measured comprises a first electrode having at least two separate electrode portions for contact with the substance to be measured, and a second electrode. A chemical measuring instrument comprises a piezoelectric characteristic-measuring circuit having an output signal line connected to capacitors connected in parallel to the separate electrode portions of the first electrode of the quartz oscillator. An input signal line of the piezoelectric characteristic-measuring circuit is connected to the second electrode of the quartz oscillator. A voltage application circuit is connected to one of the separate electrode portions of the first electrode for applying a voltage between the separate electrode portions. An electrical current-measuring circuit is connected to the other of the separate electrode portions which is electrically grounded.

Abstract: An optical probe comprises a waveguide having an optical opening for passing light therethrough, the waveguide terminating in a sharp tip at a distal end thereof. A metal film is coated on the distal end of the waveguide except for the optical opening. The metal film has a curved surface gradually retreating from the optical opening to an outer circumference of the waveguide.

Abstract: A microscopic area scanning apparatus is provided with at least three hollow cylindrical piezoelectric elements each driven in three XYZ directions by one of divided electrodes. Three or more hollow cylindrical piezoelectric elements are arranged on a circumference of a common plane. Balls are each axially provided at a free end of the hollow cylindrical piezoelectric element. Ball retainers rotatably and slidably support a respective ball in contact therewith. A sample stage is fixed to the ball retainers. A table fixes the hollow cylindrical piezoelectric elements on the circumference of the common plane. Thus, the microscopic area scanning apparatus can realize both a wide X-Y scanning range and a high Z-direction resonant frequency without utilizing an elastic hinge.

Abstract: A stator core has 3N salient poles arranged circularly where N is a natural number of four or more but except a multiple of three. Coils are formed around the salient poles where winding directions of the coils is the same for the salient poles. A first, a second and a third crossover are formed between a first and an (N+1)-th salient pole, between the (N+1)-th and a (2N+1)-th salient pole and between the (2N+1)-th and the first salient pole, respectively, to forming a triangle before cutting within the salient poles arranged circularly. An end portion of each crossover is connected to a substrate.

Abstract: A minute structure such as a cantilever 11 is formed on a silicon substrate 10 and heated by irradiating a laser beam to a part of the cantilever 11, by which the cantilever 11 is bent. The two bent cantilevers 11 are inserted into through holes 14 in a crystal substrate 10 formed in advance, and the tip end portions 15 thereof are heated. The heared tip end portions 15 become thicker and at the same time shorter, so that the crystal substrate 12 can be fixed to the silicon substrate 10 without play. By heating a part of the minute structure by such a method, plastic deformation is produced, so that bending and deforming can be performed. Thereby, a three-dimensional micromachined structure is constructed and assembled.

Abstract: An optical waveguide probe comprises a cantilever having a longitudinal axis, a fixed end and a free end, the free end being elastically displaceable by application of a force to the cantilever. A probe is disposed on the free end of the cantilever for undergoing displacement in a direction generally perpendicular to a surface of a sample during elastic displacement of the cantilever. The probe extends in a direction generally perpendicular to the longitudinal axis of the cantilever. An optical waveguide is disposed in the cantilever and extends from the fixed end of the cantilever to the probe for transmitting light applied to or detected from the surface of the sample. The optical waveguide has a first optical waveguide portion extending generally along the longitudinal axis of the cantilever and a second optical waveguide portion extending generally in the direction of extension of the probe.

Abstract: A tip of a probe is sharpened and a level difference portion 6 in a boundary zone between a base portion 5 and an elastic functioning portion 4 is formed into a tapered configuration. The diameter of the elastic functioning portion 4 is made smaller than that of the base portion 5. Also, a part of the elastic functioning portion 4 is shaped into a constricted configuration. Also, the probe material is an optical fiber and this probe is composed of a core portion 2 that propagates light therethrough and clad portions 3 that differ in refractive index from each other. And the portion of the probe that excludes a aperture is clothed by a metal film cladding 7.

Abstract: A pharmaceutical preparation for intranasal administration having a better absorption rate and less irritant effects is provided. The pharmaceutical preparation comprises a mixture of a powder of an adsorbent resin and a biologically active peptide having a drug effect under the condition that they are dry prior to or after the mixing.

Abstract: A scanning type near field interatomic force microscope of the type having a hook-shaped probe formed of a light transmitting material and having a sharpened tip portion with a transmitting hole for transmitting light, the probe being disposed over and moved relative to a sample surface for simultaneously measuring the shape of the surface of the sample and the optical characteristics of a minute region of the surface of the sample by scanning over the surface of the sample under a state in which the distance between the tip portion of the probe and the surface of the sample is within an operation distance in which an interatomic force acts between the tip portion of the probe and the surface of the sample. A quartz oscillator is attached to a shaft portion of the probe and has electrodes. A detection circuit detects a change in the resonance characteristics of the oscillator caused by the interatomic force acting between the tip portion of the probe and the surface of the sample.

Abstract: A probe for an atomic force microscope comprises a body having a cantilever portion and a probe portion made from a single-crystal material. The probe portion has a tip formed as a vertex of three planes including at least two crystal planes.

Abstract: A scanning near-field optic/atomic-force microscope comprises a holder for holding a sample immersed in a liquid, and a plate disposed over the holder for covering a surface of the liquid and for transmitting therethrough a laser light. A probe has an optical propagation body terminating in a distal end, and a light reflecting element disposed thereon, and the probe is immersed in the liquid. A light source emits a light which is introduced into the optical propagation body of the probe, which guides the light through the probe and out the distal end thereof to irradiate the sample. A detecting device detects information from the light irradiated on the sample and converts the information to an electric signal. A laser source irradiates the light reflecting element of the probe with a laser light for detecting a bending amount of the probe resulting from an interaction between the sample and the probe. An angle adjusting mechanism adjusts an optical axis of the laser light transmitted through the plate.

Abstract: There is provided an optical memory medium comprising a flat plate modified on the surface thereof by a photolytic residual group, an optical recording apparatus comprising an optical probe having a microscopic aperture on the leading end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as whole and an apparatus for reading the optical memory medium comprising the optical memory medium, a friction detecting probe, an X-Y-Z position control means and a controller for controlling the apparatus as a whole.

Abstract: A radiated light of a light source for optical characteristic measurement is amplitude modulated by an optical modulator and directed into a light-propagating probe. A phase and intermittent rate of the optical modulator are adjusted by a phase shifter. A sample characteristic measuring light is radiated onto the surface of the sample from the distal end of the probe. A light transmitted through or scattered by the sample, or fluorescent light generated from the sample is directed into a photoelectric converter via an optical system. The light radiating area of sample characteristic measuring light can be efficiently modified to improve the resolution of a light characteristic image of the surface topography and optical characteristic of the sample at high resolution, without relying on the existence of transmissivity and conductivity in the sample.

Abstract: There is provided an optical memory medium comprising a flat plate modified on the surface thereof by a photolytic residual group, an optical recording apparatus comprising an optical probe having a microscopic aperture on the leading end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as whole and an apparatus for reading the optical memory medium comprising the optical memory medium, a friction detecting probe, an X-Y-Z position control means and a controller for controlling the apparatus as a whole.

Abstract: An optical scan type tunnel microscope based on a new principle, having higher resolution, is provided. The apparatus of the invention is comprised of at least an optical fiber 3 whose head portion is covered by an energy acceptor 6, a prism on which a sample which contains an energy donator 7 or is covered by the energy donator 7 is placed, a XY-axis transfer mechanism 9, XY-axis control mechanism 10, Z-axis transfer mechanism 11, Z-axis control mechanism 12, light source 13, optical system 14, and an optical detecting system 15.

Abstract: A quartz crystal resonator is utilized to effect evaluation of the viscoelastic characteristic of a film deposited on an electrode by an electrochemical reaction. The quartz crystal resonator is connected to a resonator characteristic measurement unit comprised of an oscillating circuit, a frequency counter, and an amplitude level meter. An electrochemical measurement unit in the form of a potentiostat is connected to a working electrode which comprises one of the electrodes of the resonator, to a reference electrode and to a counter electrode. The frequency counter, the amplitude level meter and the potentiostat are connected to a CPU. The resonator, reference electrode and counter electrode are all immersed in an electrolyte solution in an electrochemical cell.

Abstract: A viscosity measuring system comprises a cell containing gelable liquid and a piezoelectric resonator mounted in the cell. The piezoelectric resonator has a prescribed characteristic, such as electrical resistance or resonant frequency, which varies in accordance with the gelating of the liquid. Solid particles suspended in the liquid are deposited on the piezoelectric resonator during gelating of the liquid to amplify the prescribed resonator characteristic. A measuring circuit measures the variation of the resonator characteristic to thereby determine the gelation time of the liquid.