Abstract: According to an embodiment, a method of calculating three-dimensional shape information of an object surface comprising: acquiring, color-mapping, and calculating. The acquiring includes acquiring an image captured through an anisotropic wavelength selection portion having at least two different regions configured to select a wavelength to be shielded and a wavelength to be passed from reflected light from the object surface illuminated with light. The color-mapping includes color-mapping light beam directions based on the image. The calculating includes calculating three-dimensional shape information of the object surface from a geometric optics relational expression between an inclination angle of the object surface and the light beam direction.

Abstract: According to the embodiment, an optical element assembly includes a wavelength selection portion and an imaging optical element. The wavelength selection portion includes a plurality of wavelength selection regions. The wavelength selection portion is configured to emit wavelengths different among the plurality of wavelength selection regions. The imaging optical element includes a plurality of different regions. The plurality of regions of the imaging optical element has focal lengths different from each other. Each of the regions of the imaging optical element optically faces corresponding one of the wavelength selection regions of the wavelength selection portion.

Abstract: According to an embodiment, an optical inspection apparatus includes: an illumination portion configured to emit illumination light including at least telecentric illumination; and an imaging portion configured to simultaneously capture telecentric light and entocentric light.

Abstract: According to an embodiment, an optical apparatus includes: a light receiving element, a light-collecting element array, a diaphragm aperture array, and a first light transmission portion. The light receiving element is configured to receive light and is configured to convert the light into a signal. The light-collecting element array has at least two or more repeating structures. The diaphragm aperture array has at least two or more repeating structures on a focal plane of the light-collecting element array between the light-collecting element array and the light receiving element. The first light transmission portion is filled between the diaphragm aperture array and the light-collecting element array and is configured to transmit the light.

Abstract: According to an embodiment, a processing apparatus to be used for optical measurement includes a processor. The processor is configured: to acquire an image of an object on an optical axis of an image capture by optical imaging using a light selection portion that selectively allows a plurality of wavelengths different from each other from a surface of the object to pass through, and to acquire depth information on the object with respect to the image capture based on variance of pixel values of the image or variance of pixel value change indexes.

Abstract: In an embodiment, an optical inspection apparatus includes: an imaging portion and an illumination portion. The imaging portion acquires a plurality of images by repeatedly photographing an object on an optical axis of the imaging portion, the object moving relative to the optical axis in a moving direction that is a predetermined axial direction, in such a manner as to cross the optical axis. The illumination portion radiates, in a plane including the optical axis of the imaging portion and the moving direction, at a time of imaging by the imaging portion, first illumination light at a first object point on a surface of the object, and second illumination light traveling in a direction different from the first illumination light at a second object point different from the first object point, a distribution of the first illumination light and the second illumination light being asymmetric in the plane.

Abstract: According to one embodiment, an optical test apparatus includes a light convergence element, an optical filter, and an image sensor. The light convergence element converges light from a subject. The optical filter is arranged on an optical axis of the light convergence element. The image sensor is arranged in an effective region not crossing the optical axis of the light convergence element, and receives light passing through the light convergence element and the optical filter.

Abstract: According to an embodiment, an optical inspection method includes: causing a wavelength selection portion to selectively pass light components including at least two different wavelength spectra from an object point and causing an imaging portion including at least two color channels configured to receive the light components of the wavelength spectra to capture the object point; defining the light components of the at least two different wavelength spectra as signal vectors having different directions based on light reception data in the at least two color channels for the object point; and estimating spread of a direction distribution of light at the object point based on the directions of the signal vectors.

Abstract: A surface-emitting semiconductor light-emitting device includes a semiconductor substrate; a first semiconductor layer on a front surface of the semiconductor substrate, an active layer on the first semiconductor layer; a photonic crystal layer on the active layer, a second semiconductor layer on the photonic crystal layer, a first electrode on the second semiconductor layer; and a second electrode on a back surface of the semiconductor substrate. The photonic crystal layer includes a plurality of protrusions arranged along an upper surface of the active layer. The second electrode includes a planar contact portion contacting the back surface of the semiconductor substrate, and at least one fine wire contact portion extending into a surface-emitting region in the back surface of the semiconductor substrate. The light radiated from the active layer is externally emitted from the surface-emitting region. The fine wire contact portion is arranged in the surface-emitting region with rotationally asymmetric.

Abstract: A group III nitride crystal substrate has a main surface and a back surface opposite to the main surface. The average dislocation density of the main surface and the average dislocation density of the back surface are less than or equal to 6.0×105 cm?2. Furthermore, the difference between the average dislocation density of the main surface and the average dislocation density of the back surface is less than or equal to 5.0×104 cm?2. The warpage of the crystal axis of the main surface has a radius of curvature of more than or equal to 30 m.

Abstract: According to an embodiment, an optical fluid processing apparatus includes a first reflector, a light source, a housing, and a heat sink. The first reflector includes a mirror surface. The light source is disposed to face the mirror surface of the first reflector. The housing includes an inlet and an outlet of a fluid. The first reflector and the light source are disposed inside the housing. The heat sink is thermally connected to the light source, and extended along a flow direction of the fluid flowing from the inlet to the outlet. A light beam from the light source includes a wavelength that is configured to inactivate a microorganism in the fluid.

Abstract: According to an embodiment, an optical inspection apparatus includes: an image-forming optical element with an imaging optical axis; an image sensor having a light-receiving surface; and a movable first light selection aperture that is arranged on or near a focal plane of the image-forming optical element. The first light selection aperture includes a first light selection region and a second light selection region that selectively pass light in different directions from an object. When the first light selection region moves to a position, the image sensor acquires a first image of the object incident on the light-receiving surface through the image-forming optical element and the first light selection region. When the second light selection region moves to a position, the image sensor acquires a second image of the object incident on the light-receiving surface through the image-forming optical element and the second light selection region.

Abstract: According to the embodiment, an optical measurement method includes: forming an object image including at least a part of the object by a bright-field optical system, and capturing and acquiring object image data by an imaging element configured to distinguish spectrums including first and second wavelengths by each pixel; performing dark-field conversions for the first wavelength to obtain first converted image data and for the second wavelength to obtain second converted image data, based on the object image data; performing hue generation processing of generating hue image data based on the first and second converted image data; and estimating information regarding a physical property of the object based on the hue image data.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: A semiconductor laser device having an emission end surface of laser light includes: a semiconductor laser element; an oscillator housing having airtightness; and a gas circulation system including a circulation pump and a siloxane remover and connected to a supply port and an exhaust port of the oscillator housing, in which in the oscillator housing, the semiconductor laser element is disposed with the emission end surface of the laser light being exposed from the oscillator housing, and an optical member and an electric wiring member are also disposed, and when the gas circulation system is operated, the oscillator housing has an inside having an equilibrium siloxane concentration of 0.1 ?g/m3 or less.

Abstract: According to an embodiment, an optical apparatus includes a light emission portion; a light direction selection portion; and an image-forming optical element. The light emission portion is configured to emit a first light beam of a first wavelength spectrum including a first wavelength. The light direction selection portion includes a first light direction selection region and a second light direction selection region on or near a focal plane of the image-forming optical element. The first light beam incident on the first light direction selection region or the second light direction selection region is emitted as a light beam having a different optical characteristic according to the regions, and at least one of the regions includes a light direction changer that is configured to change a direction of the incident light beam to a different direction and emits the light beam.

Abstract: According to an embodiment, a non-transitory storage medium stores an optical inspection program. The optical inspection program causes a processor to execute generating a wavelength selection portion-removed image by removing, from a captured image of an object surface imaged through a wavelength selection portion configured to select at least two different wavelength spectra from incident light, an image of the wavelength selection portion included in the captured image.

Abstract: According to an embodiment, an optical apparatus includes: a light emission portion configured to emit light; an image-forming optical element array; and first and second wavelength emission surfaces. The image-forming optical element array includes first and second image-forming optical elements. The second wavelength emission surface is arranged at a position different from the first wavelength emission surface. The first and second wavelength emission surface respectively include: a first wavelength emission region configured to emit by the light, light of a first wavelength spectrum toward the image-forming optical element array; and a second wavelength emission region configured to emit by the light, light of a second wavelength spectrum toward the image-forming optical element array. The first wavelength emission surface is positioned at a focal plane of the first image-forming optical element.

Abstract: According to one embodiment, an optical machining apparatus includes a first light source, and a second light source. The first light source is configured to radiate a first beam onto a first position of a surface of a work in such a manner as to transfer heat at a temperature lower than a melting temperature of the work from the first position of the work to a second position of a surface of the work on an opposite side to the first position. The second light source is configured to radiate a second beam onto the second position such that a temperature of the work exceeds the melting temperature of the work, in a state in which a temperature of the second position is raised by the transfer of the heat.

Abstract: Provided is a stent comprising: a stent skeleton; and a deposition layer containing a plurality of layers deposited on the stent skeleton; each layer of the deposition layer comprising crystalline cilostazol, at least one of the plurality of layers comprising a bioabsorbable polymer.