Abstract: A surface-emitting semiconductor light-emitting device includes a semiconductor substrate; a first semiconductor layer on a front surface of the semiconductor substrate, an active layer on the first semiconductor layer; a photonic crystal layer on the active layer, a second semiconductor layer on the photonic crystal layer, a first electrode on the second semiconductor layer; and a second electrode on a back surface of the semiconductor substrate. The photonic crystal layer includes a plurality of protrusions arranged along an upper surface of the active layer. The second electrode includes a planar contact portion contacting the back surface of the semiconductor substrate, and at least one fine wire contact portion extending into a surface-emitting region in the back surface of the semiconductor substrate. The light radiated from the active layer is externally emitted from the surface-emitting region. The fine wire contact portion is arranged in the surface-emitting region with rotationally asymmetric.

Abstract: A group III nitride crystal substrate has a main surface and a back surface opposite to the main surface. The average dislocation density of the main surface and the average dislocation density of the back surface are less than or equal to 6.0×105 cm?2. Furthermore, the difference between the average dislocation density of the main surface and the average dislocation density of the back surface is less than or equal to 5.0×104 cm?2. The warpage of the crystal axis of the main surface has a radius of curvature of more than or equal to 30 m.

Abstract: According to an embodiment, an optical fluid processing apparatus includes a first reflector, a light source, a housing, and a heat sink. The first reflector includes a mirror surface. The light source is disposed to face the mirror surface of the first reflector. The housing includes an inlet and an outlet of a fluid. The first reflector and the light source are disposed inside the housing. The heat sink is thermally connected to the light source, and extended along a flow direction of the fluid flowing from the inlet to the outlet. A light beam from the light source includes a wavelength that is configured to inactivate a microorganism in the fluid.

Abstract: According to an embodiment, an optical inspection apparatus includes: an image-forming optical element with an imaging optical axis; an image sensor having a light-receiving surface; and a movable first light selection aperture that is arranged on or near a focal plane of the image-forming optical element. The first light selection aperture includes a first light selection region and a second light selection region that selectively pass light in different directions from an object. When the first light selection region moves to a position, the image sensor acquires a first image of the object incident on the light-receiving surface through the image-forming optical element and the first light selection region. When the second light selection region moves to a position, the image sensor acquires a second image of the object incident on the light-receiving surface through the image-forming optical element and the second light selection region.

Abstract: According to the embodiment, an optical measurement method includes: forming an object image including at least a part of the object by a bright-field optical system, and capturing and acquiring object image data by an imaging element configured to distinguish spectrums including first and second wavelengths by each pixel; performing dark-field conversions for the first wavelength to obtain first converted image data and for the second wavelength to obtain second converted image data, based on the object image data; performing hue generation processing of generating hue image data based on the first and second converted image data; and estimating information regarding a physical property of the object based on the hue image data.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: A semiconductor laser device having an emission end surface of laser light includes: a semiconductor laser element; an oscillator housing having airtightness; and a gas circulation system including a circulation pump and a siloxane remover and connected to a supply port and an exhaust port of the oscillator housing, in which in the oscillator housing, the semiconductor laser element is disposed with the emission end surface of the laser light being exposed from the oscillator housing, and an optical member and an electric wiring member are also disposed, and when the gas circulation system is operated, the oscillator housing has an inside having an equilibrium siloxane concentration of 0.1 ?g/m3 or less.

Abstract: According to an embodiment, an optical apparatus includes a light emission portion; a light direction selection portion; and an image-forming optical element. The light emission portion is configured to emit a first light beam of a first wavelength spectrum including a first wavelength. The light direction selection portion includes a first light direction selection region and a second light direction selection region on or near a focal plane of the image-forming optical element. The first light beam incident on the first light direction selection region or the second light direction selection region is emitted as a light beam having a different optical characteristic according to the regions, and at least one of the regions includes a light direction changer that is configured to change a direction of the incident light beam to a different direction and emits the light beam.

Abstract: According to an embodiment, a non-transitory storage medium stores an optical inspection program. The optical inspection program causes a processor to execute generating a wavelength selection portion-removed image by removing, from a captured image of an object surface imaged through a wavelength selection portion configured to select at least two different wavelength spectra from incident light, an image of the wavelength selection portion included in the captured image.

Abstract: According to an embodiment, an optical apparatus includes: a light emission portion configured to emit light; an image-forming optical element array; and first and second wavelength emission surfaces. The image-forming optical element array includes first and second image-forming optical elements. The second wavelength emission surface is arranged at a position different from the first wavelength emission surface. The first and second wavelength emission surface respectively include: a first wavelength emission region configured to emit by the light, light of a first wavelength spectrum toward the image-forming optical element array; and a second wavelength emission region configured to emit by the light, light of a second wavelength spectrum toward the image-forming optical element array. The first wavelength emission surface is positioned at a focal plane of the first image-forming optical element.

Abstract: According to one embodiment, an optical machining apparatus includes a first light source, and a second light source. The first light source is configured to radiate a first beam onto a first position of a surface of a work in such a manner as to transfer heat at a temperature lower than a melting temperature of the work from the first position of the work to a second position of a surface of the work on an opposite side to the first position. The second light source is configured to radiate a second beam onto the second position such that a temperature of the work exceeds the melting temperature of the work, in a state in which a temperature of the second position is raised by the transfer of the heat.

Abstract: Provided is a stent comprising: a stent skeleton; and a deposition layer containing a plurality of layers deposited on the stent skeleton; each layer of the deposition layer comprising crystalline cilostazol, at least one of the plurality of layers comprising a bioabsorbable polymer.

Abstract: According to the embodiment, an optical inspection method includes: acquiring an image by capturing the image, using light from a surface of an object, which passes through a wavelength selection portion configured to selectively pass light components of a plurality of predetermined wavelengths different from each other, the image sensor including color channels configured to discriminately receive the light components of the plurality of predetermined wavelengths, performing color count estimation processing configured to estimate the number of colors based on the intensity ratio of the color channels that have received the light in each pixel of the image, and performing scattered light distribution identification processing configured to identify a scattered light distribution as BRDF from the surface of the object based on the number of colors or surface state identification processing configured to identify a state of the surface of the object based on the number of colors.

Abstract: According to an embodiment, an optical apparatus includes: an illumination portion, a light receiving portion, and a processor. The illumination portion is configured to illuminate an object with light. The illumination portion is configured to illuminate a first illumination point of the object with light having a first wavelength and illuminate a second illumination point different from the first illumination point of the object with light having a second wavelength. The light receiving portion is configured to move relative to the object while maintaining a positional relationship with the illumination portion and is configured to receive light that passed through the first illumination point of the object and light that passed through the second illumination point. The processor is configured to image the object by light reception signals of the light that passed through the first illumination point and the second illumination point.

Abstract: According to an embodiment, an optical inspection apparatus includes an illumination portion, an imaging portion, and a processor. The illumination portion is configured to irradiate a first object point of an object with a light beam flux at one or more solid angles. The imaging portion is configured to acquire an image of the object according to illumination with the light beam flux. The processor causes the first object point to be irradiated with a light beam flux at a first solid angle by first illumination light, acquires a first captured image of the object with the first illumination light, causes the first object point to be irradiated with light beam fluxes at the third and fourth solid angles by second illumination light, acquires a second captured image of the object with the second illumination light, and acquires information regarding the object by the first and second captured images.

Abstract: According to one embodiment, an optical inspection method includes projecting first pattern light in a first basic modulation mode that periodically changes in bright and dark, onto an object, acquiring a first image by capturing an image of the object onto which the first pattern light has been projected, projecting second pattern light in a first inverted modulation mode in which bright and dark are inverted with respect to the first basic modulation mode, onto the object, acquiring a second image by capturing an image of the object onto which the second pattern light has been projected, and generating a singular light-scattered image in which a singular region including uniquely-scattered light that is extracted based at least on the first image and the second image is intensified.

Abstract: According to an embodiment, an optical inspection method includes calculating irradiation field information concerning an irradiation field on a surface of a subject when irradiating the surface of the subject with a light beam from an illumination device that is supported by a movable body and moved; and performing path calculation processing of calculating, based on the irradiation field information, a path for the illumination device to move.

Abstract: According to the embodiment, a processing apparatus includes an arithmetic section. The arithmetic section is configured to calculate a refractive index distribution forming a light beam path based on an estimated output calculated by inputting light beam data indicating the light beam path to an estimation model, an updated output calculated based on the light beam data and the estimated output, and an evaluation index of the estimation model calculated from a ray equation independent of a time which the light beam path follows.

Abstract: According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Abstract: According to the embodiment, a processing apparatus includes a processor. The processor is configured to: cause a plurality of different projection lights to be projected onto an object, the projection lights respectively including a plurality of wavelengths different from each other; cause intensity values of the plurality of wavelengths to be acquired from the object for each of the projection lights, as intensity values of detection signals having no information regarding position at a stage of processing signals; transform numerical values of the intensity values of the detection signals using independent parameters for each of wavelengths to first transformed signals corresponding to the plurality of wavelengths from the object; and cause an image of the object to be acquired by the first transformed signals corresponding to the plurality of wavelengths from the object and signals related to the projection lights.