Abstract: A manual feed tray is located at a side surface of a main housing. A supply roller conveys a sheet on the manual feed tray toward a print engine. A pressure plate is movable between a contact position at which the sheet on the manual feed tray contacts the supply roller and a separated position at which the sheet on the manual feed tray is separated from the supply roller. A push-up cam pushes up the pressure plate from the separated position to the contact position. The push-up cam includes a contact portion configured to contact the pressure plate. A controller is configured to: when performing printing on a plurality of sheets, after moving the pressure plate from the separated position to the contact position, convey the plurality of sheets by intermittently driving the supply roller while maintaining the pressure plate at the contact position.

Abstract: An overtube device includes: a tube body having a bending part and a main body part; a wire having a distal end part fixed to the bending part and a proximal end part positioned on the proximal end side and extending along a longitudinal axis; an operation part capable of pulling the wire to the proximal end side; and an overtube base configured to fix the tube body in a longitudinal axis direction so as not to advance and retract, and configured so that the operation part is provided in a state where the wire is pulled toward the proximal end side of the wire until a curved shape of the bending part is held. In a state where the operation part is mounted on the overtube base, the overtube base holds the wire in a state where the wire is pulled toward the proximal end side of the wire.

Abstract: A thin film for a reflection film or for a semi-transparent reflection film, having a compound phase formed of at least one chemical compound selected from the group consisting of a nitride, an oxide, a composite oxide, a nitroxide, a carbide, a sulfide, a chloride, a silicide (excluding silicon), a fluoride, a boride, a hydride, a phosphide, a selenide and a telluride of aluminum, magnesium, tin, zinc, indium, titanium, zirconium, manganese and silicon, dispersed in a matrix formed of silver or a silver alloy. The thin film may disperse at least one compound selected from the group consisting of a nitride, an oxide, a composite oxide, a nitroxide, a carbide, a sulfide, a chloride, a silicide, a fluoride, a boride, a hydride, a phosphide, a selenide and a telluride of silver, gallium, palladium or copper, in addition to aluminum or the like, therein.

Abstract: A thin film for a reflection film or a semi-transparent reflection film, which has a compound phase comprising at least one selected from the group consisting of a nitride, an oxide, a complex oxide, a nitroxide, a carbide, a sulfide, a chloride, a silicide, a fluoride, a boride, a hydride, a phosphide, a selenide and a telluride of gallium, palladium or copper, dispersed in a matrix formed of silver or a silver alloy. The compound phase in the thin film may include at least one compound selected from the group consisting of nitride, oxide, complex oxide, nitroxide, carbide, sulfide, chloride, silicide, fluoride, boride, hydride, phosphide, selenide and telluride of silver. The thin film of the present invention minimizes the deterioration of the reflectance even after a long period of use, and can prolong the life of various devices which use the thin film as a reflection film, such as an optical recording medium and a display.

Abstract: A thin film for reflective film or semi-reflective film comprising a matrix of silver or silver alloy and, dispersed therein, a compound phase of at least one member selected from among aluminum, magnesium, tin, zinc, indium, titanium, zirconium, manganese and silicon nitrides, oxides, composite oxides, nitroxides, carbides, sulfides, chlorides, silicides (excluding silicon), fluorides, borides, hydrides, phosphides, selenides and tellurides. In this thin film, in addition to the above aluminum, etc., there may be dispersed at least one member selected from among silver, gallium, palladium and copper nitrides, oxides, composite oxides, nitroxides, carbides, sulfides, chlorides, silicides, fluorides, borides, hydrides, phosphides, selenides and tellurides.

Abstract: A thin film for a reflection film or a semi-transparent reflection film, having a compound phase formed of at least one chemical compound selected from the group consisting of a nitride, an oxide, a complex oxide, a nitroxide, a carbide, a sulfide, a chloride, a silicide, a fluoride, a boride, a hydride, a phosphide, a selenide and a telluride of dysprosium, gadolinium, erbium, praseodymium, samarium, lanthanum and yttrium, dispersed in a matrix formed of silver or a silver alloy. The thin film may disperse at least one compound selected from the group consisting of a nitride, an oxide, a complex oxide, a nitroxide, a carbide, a sulfide, a chloride, a silicide, a fluoride, a boride, a hydride, a phosphide, a selenide and a telluride of silver, and/or gallium, palladium or copper, in addition to dysprosium or the like, therein.

Abstract: The present invention provides a thin film for a reflection film or for a semi-transparent reflection film, which has at least one silver compound phase of nitride, oxide, complex oxide, nitroxide, carbide, sulfide, chloride, silicide, fluoride, boride, hydride, phosphide, selenide and telluride of silver, dispersed in a matrix formed of silver. The thin film according to the present invention keeps its reflectance without significant loss even after a long period of use, and can prolong the life of various devices which comprises the thin film as a reflection film, such as an optical recording medium and a display. The thin film can be also applied to a semi-reflective/semi-transparent film used in the optical recording medium.

Abstract: A thin film for a reflection film or a semi-transparent reflection film, which has a compound phase comprising at least one selected from the group consisting of a nitride, an oxide, a complex oxide, a nitroxide, a carbide, a sulfide, a chloride, a silicide, a fluoride, a boride, a hydride, a phosphide, a selenide and a telluride of gallium, palladium or copper, dispersed in a matrix formed of silver or a silver alloy. The compound phase in the thin film may include at least one compound selected from the group consisting of nitride, oxide, complex oxide, nitroxide, carbide, sulfide, chloride, silicide, fluoride, boride, hydride, phosphide, selenide and telluride of silver. The thin film of the present invention minimizes the deterioration of the reflectance even after a long period of use, and can prolong the life of various devices which use the thin film as a reflection film, such as an optical recording medium and a display.

Abstract: The present invention is a silver alloy including silver as the main component and at least one rare-earth element as a first dopant element, and excellent in reflectance maintenance property. In the present invention, the first dopant element is preferably samarium, neodymium, lanthanum, cerium, ytterbium, terbium, dysprosium, holmium, erbium, thulium, europium, and gadolinium. Also, in the present invention, the silver alloy preferably includes, as a second dopant element, at least one element selected from copper, manganese, silicon, chromium, nickel, cobalt, yttrium, iron, scandium, zirconium, niobium, molybdenum, tantalum, tungsten, platinum, gold, rhodium, iridium, palladium, indium, tin, lead, aluminum, calcium, gallium, bismuth, antimony, strontium, hafnium, and germanium.

Abstract: The present invention provides a silver alloy for use in a reflection film in an optical recording medium, comprising silver as a main component, and at least one metal element as a first additive element having lower melting point than that of silver. Preferable first additive elements in the present invention are aluminum, indium, tin, bismuth, gallium, zinc, strontium, calcium and germanium. Further, second additive elements in the present invention are preferable if they contain at least one of elements comprising platinum, gold, rhodium, iridium, ruthenium, palladium, lead, copper, manganese, silicon, nickel, chrome, cobalt, yttrium, iron, scandium, zirconium, titanium, niobium, molybdenum, tantalum, tungsten, hafnium, lanthanum, cerium, praseodymium, neodymium, samarium, europium, gadolinium, terbium, dysprosium, holmium, thulium, ytterbiumm, magnesium, and boron.

Abstract: The present invention is a silver alloy including silver as the main component and at least one precious metal element as a first dopant element, and excellent in reflectance maintenance property. In the present invention, the first dopant element is preferably platinum, gold, palladium, rhodium, ruthenium and iridium. Also, in the present invention, the silver alloy preferably includes, as a second dopant element, at least one element selected from copper, manganese, silicon, chromium, nickel, cobalt, iron, scandium, zirconium, niobium, molybdenum, tantalum, tungsten, indium, tin, lead, aluminum, calcium, germanium, gallium, bismuth, antimony, strontium, hafnium, gadolinium, samarium, neodymium, lanthanum, cerium, ytterbium and europium.

Abstract: The present invention is a silver alloy including silver as the main component and at least one rare-earth element as a first dopant element, and excellent in reflectance maintenance property. In the present invention, the first dopant element is preferably samarium, neodymium, lanthanum, cerium, ytterbium, terbium, dysprosium, holmium, erbium, thulium, europium, and gadolinium. Also, in the present invention, the silver alloy preferably includes, as a second dopant element, at least one element selected from copper, manganese, silicon, chromium, nickel, cobalt, yttrium, iron, scandium, zirconium, niobium, molybdenum, tantalum, tungsten, platinum, gold, rhodium, iridium, palladium, indium, tin, lead, aluminum, calcium, gallium, bismuth, antimony, strontium, hafnium, and germanium.

Abstract: The present invention is a silver alloy including silver as the main component and at least one element as a first dopant element higher than silver in melting point, and excellent in reflectance maintenance property. In the present invention, the first dopant element is preferably copper, manganese, silicon, nickel, cobalt, yttrium, iron, scandium, zirconium, niobium, molybdenum, tantalum and tungsten. Also, in the present invention, the silver alloy preferably includes, as a second dopant element, at least one element selected from platinum, gold, rhodium, iridium, ruthenium, palladium, chromium, germanium, indium, tin, lead, aluminum, calcium, gallium, bismuth, antimony, strontium, hafnium, gadolinium, samarium, neodymium, lanthanum, cerium, ytterbium and europium.

Abstract: The present invention provides a silver alloy for use in a reflection film in an optical recording medium, comprising silver as a main component, and at least one metal element as a first additive element having lower melting point than that of silver. Preferable first additive elements in the present invention are aluminum, indium, tin, bismuth, gallium, zinc, strontium, calcium and germanium. Further, second additive elements in the present invention are preferable if they contain at least one of elements comprising platinum, gold, rhodium, iridium, ruthenium, palladium, lead, copper, manganese, silicon, nickel, chrome, cobalt, yttrium, iron, scandium, zirconium, titanium, niobium, molybdenum, tantalum, tungsten, hafnium, lanthanum, cerium, praseodymium, neodymium, samarium, europium, gadolinium, terbium, dysprosium, holmium, thulium, ytterbiumm, magnesium, and boron.

Abstract: The present invention provides a silver alloy for use in a reflection coating for an optical recording medium, comprising silver as a main component and indium and/or tin as an additive element. It is preferable when the concentration of the additive elements falls within 0.1-25 wt %, and reflectivity can be inhibited from deteriorating especially when the concentration falls within a range of 0.1-5.0 wt %. When the thermal conductivity of the reflective layer is taken into account, the concentration of the additive elements may be further limited to 0.1-0.5 wt % to provide a reflective layer of higher thermal conductivity.