Patents by Inventor Hiroshi Yoshikawa
Hiroshi Yoshikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12204299Abstract: A machining condition searching method includes: generating a machining condition to be set in a machining device; collecting a machining state; collecting the machining result performed under the machining condition; calculating an evaluation value of the machining on the basis of the machining result; constructing an evaluation value prediction model predicting, on the basis of the machining condition, the machining state, and the evaluation value, an evaluation value corresponding to the machining condition that has not been tried; and constructing the evaluation value prediction model on the basis of a change degree in the relationship between the machining condition and the evaluation value, and performs weighting based on the machining state on the evaluation value prediction model. The machining condition to be tried next is generated using a predictive value of the evaluation value. Each of the above processes is repeatedly performed until it is determined to end a search.Type: GrantFiled: August 11, 2022Date of Patent: January 21, 2025Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Hideyuki Masui, Hiroshi Yoshikawa, Jun Maruta, Koki Nakane, Takayuki Nakagawa
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Publication number: 20240336898Abstract: The present disclosure relates to construction of three-dimensional organs from pluripotent stem cells. The present disclosure also relates to a method of forming a cell condensate for self-organization.Type: ApplicationFiled: June 17, 2024Publication date: October 10, 2024Applicant: Public University Corporation Yokohama City UniversityInventors: Takanori TAKEBE, Hideki TANIGUCHI, Hiroshi YOSHIKAWA
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Publication number: 20240337751Abstract: An imaging device includes a first light source that emits first irradiation light that is light having a first wavelength, a second light source that emits second irradiation light that is light having a second wavelength different from the first wavelength, a first detection unit that detects first reflected light that is reflected light of the first irradiation light with which a target object is irradiated, a second detection unit that detects second reflected light that is reflected light of the second irradiation light with which the target object is irradiated, and an optical member that transmits part of the light reflected by the target object to guide the first reflected light to the first detection unit, and reflects part of the light reflected by the target object to guide the second reflected light to the second detection unit.Type: ApplicationFiled: June 20, 2024Publication date: October 10, 2024Inventor: Hiroshi YOSHIKAWA
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Patent number: 12092525Abstract: A burner work measurement system configured to measure work using a burner is provided. The burner work measurement system includes one or more cameras configured to capture the work and a control unit configured to perform computing processing on images captured by the cameras, the control unit is configured to create work data obtained by calculating, based on the images captured by the cameras, at least one of a positional relation between a work object and the burner or flame, a positional relation between the work object and a brazing filler metal, and a positional relation between the burner or the flame and the brazing filler metal.Type: GrantFiled: August 28, 2020Date of Patent: September 17, 2024Assignees: HITACHI, LTD., DAIKIN INDUSTRIES, LTD.Inventors: Akihide Tanaka, Hiroshi Yoshikawa, Shinya Kaneko, Isamu Takahashi, Naoya Okizaki, Xudong Zhang, Yasunori Hama
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Patent number: 12042877Abstract: Provided is a welding management system that appropriately manages welding. The welding management system (100) includes a plurality of local magnetic sensors (10a to 10f) provided around a target joining position (K) and a correction magnetic sensor (20) curved to surround the target joining position (K). A data processing unit (30) generates information of a joining state of the target joining position (K) based on a difference between a detection value of each of the plurality of the local magnetic sensors (10a to 10f) and a detection value of the correction magnetic sensor (20).Type: GrantFiled: March 30, 2018Date of Patent: July 23, 2024Assignee: HITACHI, LTD.Inventors: Ryoji Nakagawa, Hisashi Endou, Hiroshi Yoshikawa, Toshihiro Yamada, Nobuhiro Kakeno, Hideya Isaka
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Publication number: 20240233357Abstract: A learning apparatus performs a first assignment in which M tasks that are different from each other are assigned to N neural networks (where N<M) and perform learning processing that is related to the M tasks in parallel; and determines, based on learning results of the respective M tasks, whether to assign, in subsequent learning processing, the respective M tasks to the same neural networks as in the first assignment or to neural networks different from those of the first assignment.Type: ApplicationFiled: December 29, 2023Publication date: July 11, 2024Inventor: Hiroshi YOSHIKAWA
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Patent number: 11982998Abstract: A manufacturing monitoring assistance device includes: a model creation unit creating a computation model when a product as a sample is normal, based on a three-dimensional form acquired from the product; a simulation unit creating a corrective computation model when the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and performing a simulation on each of the computation model and the corrective computation model; and a monitoring method determination unit determining a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and causing an output device to display the determined method and the abnormality index.Type: GrantFiled: January 30, 2020Date of Patent: May 14, 2024Assignee: HITACHI, LTD.Inventors: Masanori Kitaoka, Hisashi Endou, Nobuhiro Kakeno, Hiroshi Yoshikawa, Toshihiro Yamada
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Publication number: 20240094758Abstract: The stabilized voltage generation circuit includes: a first voltage generation circuit configured to generate a first voltage with positive temperature characteristics; and a second voltage generation circuit including a first MOSFET having a gate of a first conductivity type and a second MOSFET having a gate of a second conductivity type different from the first conductivity type and configured to generate a second voltage with negative temperature characteristics based on the difference in gate threshold voltage between the first and second MOSFETs. The output voltage is generated based on the sum voltage of the first and second voltages.Type: ApplicationFiled: November 28, 2023Publication date: March 21, 2024Inventor: Hiroshi YOSHIKAWA
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Publication number: 20230196722Abstract: A learning apparatus trains an estimator that executes a recognition task. The learning apparatus comprises: an obtaining unit configured to obtain a plurality of training data items including input data and supervisory data corresponding to the input data; a calculating unit configured to calculate statistic information relating to a predetermined perspective in the plurality of training data items; a determining unit configured to determine a degree of importance of each training data item included in the plurality of training data items based on the statistic information; and a control unit configured to control training of the estimator based on the degree of importance. The determining unit determines the degree of importance of each training data item such that unevenness of the plurality of training data items with respect to the predetermined perspective is reduced.Type: ApplicationFiled: December 15, 2022Publication date: June 22, 2023Inventors: Hiroshi YOSHIKAWA, Takamasa TSUNODA
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Publication number: 20230109640Abstract: A skeleton detection system includes, a first storage unit configured to store reference operation information related to at least one cycle of a reference operation being a repetitive operation performed by an operator, a skeleton information detection unit configured to detect skeleton information about the operator from a working video obtained by capturing the operator during work, and a target identification unit configured to identify, as a target, among pieces of skeleton information about a plurality of operators during work, detected by the skeleton information detection unit, skeleton information about an operator indicating an operation satisfying a target requirement that a difference between the reference operation information and inspection target information being operation information during work falls within a preset allowable operation range.Type: ApplicationFiled: December 12, 2022Publication date: April 6, 2023Applicants: DAICEL CORPORATION, HITACHI, LTD.Inventors: Yasutsugu Toyoda, Yasuhiko Inadomi, Yuki Ishito, Toshihiro Yamada, Hiroshi Yoshikawa
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Publication number: 20230019417Abstract: A garbage disposal support apparatus capable of reducing the load on a person disposing of garbage is achieved. A garbage disposal support apparatus includes: a position obtaining unit configured to obtain position information about a person having an object; an object image obtaining unit configured to obtain image information about the object that the person has; a garbage determination unit configured to check the image information about the object that the person has against garbage image information stored in a database, and determine whether the object is garbage or not; a route generation unit configured to generate route information to a disposal place of the garbage, based on the position information about the person and on disposal place information stored in the database, if the object is garbage; and a transmitter unit configured to transmit the route information to a display apparatus.Type: ApplicationFiled: September 13, 2022Publication date: January 19, 2023Inventors: Masaya MIHARA, Hiroshi TAKESHITA, Ayako KONDO, Tomoki SUGIYAMA, Tadashi FURUKAWA, Toshitaka MURATA, Toshihide KOBAYASHI, Hiroshi YOSHIKAWA, Ryohei SUNAGA
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Publication number: 20230010300Abstract: There is provided a technique that includes: a first voltage generation circuit configured to generate a first voltage having a positive temperature characteristic; a second voltage generation circuit that includes a first MOSFET having a gate of a first conductive type and a second MOSFET having a gate of a second conductive type different from the first conductive type, and configured to generate a second voltage having a negative temperature characteristic based on a difference in gate threshold voltages between the first MOSFET and the second MOSFET; and a comparator configured to output a temperature detection signal indicating a high/low relationship between a detection target temperature and a predetermined temperature, based on the first voltage and the second voltage.Type: ApplicationFiled: June 10, 2022Publication date: January 12, 2023Inventor: Hiroshi Yoshikawa
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Publication number: 20220382229Abstract: A machining condition searching method includes: generating a machining condition to be set in a machining device; collecting a machining state; collecting the machining result performed under the machining condition; calculating an evaluation value of the machining on the basis of the machining result; constructing an evaluation value prediction model predicting, on the basis of the machining condition, the machining state, and the evaluation value, an evaluation value corresponding to the machining condition that has not been tried; and constructing the evaluation value prediction model on the basis of a change degree in the relationship between the machining condition and the evaluation value, and performs weighting based on the machining state on the evaluation value prediction model. The machining condition to be tried next is generated using a predictive value of the evaluation value. Each of the above processes is repeatedly performed until it is determined to end a search.Type: ApplicationFiled: August 11, 2022Publication date: December 1, 2022Applicant: Mitsubishi Electric CorporationInventors: Hideyuki MASUI, Hiroshi YOSHIKAWA, Jun MARUTA, Koki NAKANE, Takayuki NAKAGAWA
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Patent number: 11513013Abstract: A stress distribution measurement device includes: a first magnetostrictive sensor and a second magnetostrictive sensor each including an excitation coil that excites AC magnetism in a measurement target using alternating current, and a detection coil to which alternating current is induced due to the AC magnetism flowing in the measurement target; an excitation circuit that applies a first excitation voltage to the excitation coil of the first magnetostrictive sensor and applies a second excitation voltage to the excitation coil of the second magnetostrictive sensor, the second excitation voltage having a phase or a waveform different from the first excitation voltage; and a detection circuit that includes a first detector that performs synchronous detection of current flowing in the detection coil of the first magnetostrictive sensor based on the first excitation voltage and a second detector that performs synchronous detection of current flowing in the detection coil of the second magnetostrictive sensor bType: GrantFiled: September 1, 2020Date of Patent: November 29, 2022Assignee: Hitachi, Ltd.Inventors: Masanori Kitaoka, Hisashi Endo, Hiroshi Yoshikawa, Toshihiro Yamada, Nobuhiro Kakeno
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Publication number: 20220283035Abstract: A burner work measurement system configured to measure work using a burner is provided. The burner work measurement system includes one or more cameras configured to capture the work and a control unit configured to perform computing processing on images captured by the cameras, the control unit is configured to create work data obtained by calculating, based on the images captured by the cameras, at least one of a positional relation between a work object and the burner or flame, a positional relation between the work object and a brazing filler metal, and a positional relation between the burner or the flame and the brazing filler metal.Type: ApplicationFiled: August 28, 2020Publication date: September 8, 2022Applicants: Hitachi, Ltd., Daikin Industries, Ltd.Inventors: Akihide TANAKA, Hiroshi YOSHIKAWA, Shinya KANEKO, Isamu TAKAHASHI, Naoya OKIZAKI, Xudong ZHANG, Yasunori HAMA
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Patent number: 11325209Abstract: To improve quality control of welding, there is included in resistance welding: a magnetic field measuring unit (205) disposed around a welded part and configured to measure a local current at the welded part; a high-speed camera (202) configured to capture an image for measuring local temperature at the welded part from variation of luminance of emission by capturing light emission state of the welded part; a comparison determination unit (106) configured to determine whether or not at least one of current information and temperature information has an abnormal value by comparing the current information calculated based on magnetic field information acquired from the magnetic field measuring unit with past current information and comparing the temperature information measured from an image of the high-speed camera (202) with past temperature information.Type: GrantFiled: March 15, 2017Date of Patent: May 10, 2022Assignee: HITACHI, LTD.Inventors: Hisashi Endoh, Hiroshi Yoshikawa, Toshihiro Yamada
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Publication number: 20220057789Abstract: A manufacturing monitoring assistance device includes: a model creation unit creating a computation model when a product as a sample is normal, based on a three-dimensional form acquired from the product; a simulation unit creating a corrective computation model when the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and performing a simulation on each of the computation model and the corrective computation model; and a monitoring method determination unit determining a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and causing an output device to display the determined method and the abnormality index.Type: ApplicationFiled: January 30, 2020Publication date: February 24, 2022Applicant: HITACHI, LTD.Inventors: Masanori KITAOKA, Hisashi ENDOU, Nobuhiro KAKENO, Hiroshi YOSHIKAWA, Toshihiro YAMADA
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Patent number: 11150196Abstract: The disclosure provides a joining process line monitoring system capable of preventing joining quality deterioration and operation delay.Type: GrantFiled: August 30, 2018Date of Patent: October 19, 2021Assignee: HITACHI, LTD.Inventors: Hisashi Endou, Masanori Miyagi, Hiroshi Yoshikawa, Toshihiro Yamada, Nobuhiro Kakeno, Yasunori Hama
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Patent number: 11146748Abstract: An imaging device includes pixel units, a control unit, and a correction unit. The control unit causes each pixel unit to output first and second signal. The first signal is a potential of a floating diffusion held when the charge accumulated in a photoelectric conversion unit is transferred upon a transfer switch being closed. The second signal is a potential of the floating diffusion held when a reset switch is closed with the transfer switch being open. The correction unit generates, with respect to the first and second signals output by each pixel unit, the pixel signal by subtracting a correction amount from a signal intensity of the first signal. The correction amount is a product of a signal intensity of the second signal and a coefficient determined in advance in accordance with a position of each pixel unit.Type: GrantFiled: January 27, 2020Date of Patent: October 12, 2021Assignee: JVCKENWOOD CORPORATIONInventor: Hiroshi Yoshikawa
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Patent number: 11029254Abstract: There are provided a welding monitoring system which can multidimensionally monitor a welding portion with high accuracy and a monitoring method thereof, by using a relatively simple configuration.Type: GrantFiled: July 11, 2018Date of Patent: June 8, 2021Assignee: HITACHI, LTD.Inventors: Ryoji Nakagawa, Hisashi Endou, Hiroshi Yoshikawa, Toshihiro Yamada, Nobuhiro Kakeno