Patents by Inventor Hirosuke SUGASAWA
Hirosuke SUGASAWA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11415499Abstract: The particle size distribution measurement device irradiates light onto a sample of particles, then detects secondary light generated by this irradiation, and then calculates a particle size distribution of the particles based on the detection data, and includes a separate measurement data receiving unit that receives separate measurement data obtained by separately measuring particles having a specific particle size in a separate sample, and light intensity data showing a light intensity of the secondary light generated by the particles in the separate sample, and a distribution conversion unit that, based on the separate measurement data and on the light intensity data, converts the particle size distribution from a distribution in which the numbers of particles of each particle size contained in the sample being measured are shown in relative terms to a distribution in which the numbers of these particles are shown in absolute terms.Type: GrantFiled: October 6, 2017Date of Patent: August 16, 2022Assignee: HORIBA, LTD.Inventors: Tetsuya Mori, Hirosuke Sugasawa, Keijiro Sakuramoto, Tetsuji Yamaguchi
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Patent number: 11169068Abstract: A particle size distribution measurement device contains a specific particle size light intensity calculation unit that calculates a light intensity generated by particles having a specific particle size that are contained in an object, a correlation data storage unit that stores particle number-light intensity correlation data, and a particle number calculation unit that calculates the number of particles having a specific particle size that are contained in the object being measured based on light intensities calculated by the specific particle size light intensity calculation unit, and on the particle number-light intensity correlation data.Type: GrantFiled: October 11, 2017Date of Patent: November 9, 2021Assignee: HORIBA, LTD.Inventors: Tetsuji Yamaguchi, Keijiro Sakuramoto, Tetsuya Mori, Hirosuke Sugasawa
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Publication number: 20210293686Abstract: A particle size distribution measurement device contains a specific particle size light intensity calculation unit that calculates a light intensity generated by particles having a specific particle size that are contained in an object, a correlation data storage unit that stores particle number-light intensity correlation data, and a particle number calculation unit that calculates the number of particles having a specific particle size that are contained in the object being measured based on light intensities calculated by the specific particle size light intensity calculation unit, and on the particle number-light intensity correlation data.Type: ApplicationFiled: October 11, 2017Publication date: September 23, 2021Inventors: Tetsuji YAMAGUCHI, Keijiro SAKURAMOTO, Tetsuya MORI, Hirosuke SUGASAWA
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Publication number: 20190353571Abstract: The particle size distribution measurement device irradiates light onto a sample of particles, then detects secondary light generated by this irradiation, and then calculates a particle size distribution of the particles based on the detection data, and includes a separate measurement data receiving unit that receives separate measurement data obtained by separately measuring particles having a specific particle size in a separate sample, and light intensity data showing a light intensity of the secondary light generated by the particles in the separate sample, and a distribution conversion unit that, based on the separate measurement data and on the light intensity data, converts the particle size distribution from a distribution in which the numbers of particles of each particle size contained in the sample being measured are shown in relative terms to a distribution in which the numbers of these particles are shown in absolute terms.Type: ApplicationFiled: October 6, 2017Publication date: November 21, 2019Inventors: Tetsuya MORI, Hirosuke SUGASAWA, Keijiro SAKURAMOTO, Tetsuji YAMAGUCHI
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Patent number: 10408726Abstract: In order to reduce a calculation time of a particle size distribution, a particle size distribution measuring apparatus includes: a light source for irradiating light to particles to be measured; a plurality of photodetectors for detecting light intensities of diffracted/scattered lights caused by the irradiation of the light; and an operation part for receiving light intensity signals outputted from the respective photodetectors and calculating a particle size distribution of the particles based on the fact that a vector s is represented by a predetermined expression including a product of a vector q and a coefficient matrix K, and the operation part is configured to compute in parallel and calculate at least two elements of the elements of the coefficient matrix K.Type: GrantFiled: June 23, 2014Date of Patent: September 10, 2019Assignee: HORIBA, LTD.Inventor: Hirosuke Sugasawa
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Patent number: 9329116Abstract: The particle size distribution measuring device 1 is so configured to calculate the particle size distribution with repeating several times a process to give the particle size distribution calculated by means of one iterative solver to the other iterative solver as an imaginary solution and to update the calculated particle size distribution as a new particle size distribution.Type: GrantFiled: June 11, 2014Date of Patent: May 3, 2016Assignee: HORIBA, LTD.Inventor: Hirosuke Sugasawa
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Patent number: 9297736Abstract: To facilitate evaluation of a measurement condition in order to set an optimum measurement condition for each sample. A particle size distribution measuring device is provided with: an device main body that measures a particle size distribution of a sample; and an interface device that receives an input from an operator to perform drive control of the device main body, and receives a measurement result from the device main body to display the measurement result, wherein the interface device displays, in a graph, a relationship between values of operational parameters, which are to be set to measure the particle size distribution, and values of evaluation parameters obtained by using the measurement result from the device main body, which correspond to each of the values of the operational parameters.Type: GrantFiled: February 28, 2011Date of Patent: March 29, 2016Assignee: HORIBA, LTD.Inventor: Hirosuke Sugasawa
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Patent number: 9243989Abstract: In order to reduce a calculation time of a particle size distribution, a particle size distribution measuring apparatus includes an operation part for receiving light intensity signals outputted from photodetectors and calculating a particle size distribution of the particles based on the fact that a vector s is represented by a predetermined expression including a product of a vector q and a coefficient matrix K, and the operation part is adapted to calculate values of a plurality of first parameters that depend on the particle sizes of the particles and a plurality of second parameters that depend on spread angles of the diffracted/scattered lights, wherein the first and second parameters are used for calculating one element among elements of the coefficient matrix K, and at least one of these calculated values is stored to be used for calculating another element of the coefficient matrix K.Type: GrantFiled: June 23, 2014Date of Patent: January 26, 2016Assignee: HORIBA, LTD.Inventor: Hirosuke Sugasawa
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Publication number: 20140375992Abstract: In order to reduce a calculation time of a particle size distribution, a particle size distribution measuring apparatus includes an operation part for receiving light intensity signals outputted from photodetectors and calculating a particle size distribution of the particles based on the fact that a vector s is represented by a predetermined expression including a product of a vector q and a coefficient matrix K, and the operation part is adapted to calculate values of a plurality of first parameters that depend on the particle sizes of the particles and a plurality of second parameters that depend on spread angles of the diffracted/scattered lights, wherein the first and second parameters are used for calculating one element among elements of the coefficient matrix K, and at least one of these calculated values is stored to be used for calculating another element of the coefficient matrix K.Type: ApplicationFiled: June 23, 2014Publication date: December 25, 2014Inventor: Hirosuke SUGASAWA
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Publication number: 20140379289Abstract: In order to reduce a calculation time of a particle size distribution, a particle size distribution measuring apparatus includes: a light source for irradiating light to particles to be measured; a plurality of photodetectors for detecting light intensities of diffracted/scattered lights caused by the irradiation of the light; and an operation part for receiving light intensity signals outputted from the respective photodetectors and calculating a particle size distribution of the particles based on the fact that a vector s is represented by a predetermined expression including a product of a vector q and a coefficient matrix K, and the operation part is configured to compute in parallel and calculate at least two elements of the elements of the coefficient matrix K.Type: ApplicationFiled: June 23, 2014Publication date: December 25, 2014Inventor: Hirosuke SUGASAWA
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Publication number: 20140368820Abstract: The particle size distribution measuring device 1 is so configured to calculate the particle size distribution with repeating several times a process to give the particle size distribution calculated by means of one iterative solver to the other iterative solver as an imaginary solution and to update the calculated particle size distribution as a new particle size distribution.Type: ApplicationFiled: June 11, 2014Publication date: December 18, 2014Inventor: Hirosuke SUGASAWA
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Publication number: 20110213581Abstract: To facilitate evaluation of a measurement condition in order to set an optimum measurement condition for each sample. A particle size distribution measuring device is provided with: an device main body that measures a particle size distribution of a sample; and an interface device that receives an input from an operator to perform drive control of the device main body, and receives a measurement result from the device main body to display the measurement result, wherein the interface device displays, in a graph, a relationship between values of operational parameters, which are to be set to measure the particle size distribution, and values of evaluation parameters obtained by using the measurement result from the device main body, which correspond to each of the values of the operational parameters.Type: ApplicationFiled: February 28, 2011Publication date: September 1, 2011Applicant: HORIBA, LTD.Inventor: Hirosuke SUGASAWA