Abstract: A delay locked loop (DLL) circuit comprising: a fundamental phase comparator for detecting a fundamental phase difference of two input signals; a delay circuit; a delay control circuit for adjusting a delay time of the delay circuit in response to an output signal of the fundamental phase comparator; and at least one further phase comparator for detecting a phase difference other than the fundamental phase difference such that an amount of change of the delay time is changed in accordance with the fundamental phase difference.

Abstract: A plurality of electrical wires are provided on a rear surface of a semiconductor module substrate having a structure that it is possible to mount a repair chip having a long lead and a repair chip having a normal lead in an overlaying manner and that it is possible to provide either repair chip or repair chip, which correspond to a plurality of bare chips, respectively. Thereby, it is possible to obtain a semiconductor module capable of repairing in a case where any bare chip becomes defective or even in a case where any combination of bare chips becomes defective.

Abstract: A plurality of electrical wires are provided on a rear surface of a semiconductor module substrate having a structure that it is possible to mount a repair chip having a long lead and a repair chip having a normal lead in an overlaying manner and that it is possible to provide either repair chip or repair chip, which correspond to a plurality of bare chips, respectively. Thereby, it is possible to obtain a semiconductor module capable of repairing in a case where any bare chip becomes defective or even in a case where any combination of bare chips becomes defective.

Abstract: A delay locked loop (DLL) circuit comprising: a fundamental phase comparator for detecting a fundamental phase difference of two input signals; a delay circuit; a delay control circuit for adjusting a delay time of the delay circuit in response to an output signal of the fundamental phase comparator; and at least one further phase comparator for detecting a phase difference other than the fundamental phase difference such that an amount of change of the delay time is changed in accordance with the fundamental phase difference.

Abstract: Consuming current must be reduced in each operation state of a semiconductor device which operates in synchronized with an external clock signal. However, in each operation state, for satisfying the stability of an operation and a speedup, the suppression of consuming current has been performed under difficult circumstances. For solving this problem, a clock generation circuit generating an internal clock signal based on an external clock signal is activated during a specific time period when a clock synchronization circuit is in a state of inactivation.

Abstract: Consuming current must be reduced in each operation state of a semiconductor device which operates in synchronized with an external clock signal. However, in each operation state, for satisfying the stability of an operation and a speedup, the suppression of consuming current has been performed under difficult circumstances. For solving this problem, a clock generation circuit generating an internal clock signal based on an external clock signal is activated during a specific time period when a clock synchronization circuit is in a state of inactivation.