Patents by Inventor Hiroyasu Koike

Hiroyasu Koike has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240313270
    Abstract: A battery device is disclosed. The battery device includes a lithium-ion battery cell; a strain gauge attached to a surface of the battery cell; a temperature sensor detecting a temperature of the battery cell; and a measurement device calculating an SOC (State of Charge) of the battery cell a strain amount based on the temperature detected by the temperature sensor and a strain amount of the strain gauge changed according to a volume change due to charge and discharge of the battery cell.
    Type: Application
    Filed: March 15, 2024
    Publication date: September 19, 2024
    Applicant: Renesas Electronics Corporation
    Inventors: Masaki HOGARI, Hirofumi MAEDA, Hiroshi TADOKORO, Kenji NOGUCHI, Hiroyasu KOIKE
  • Patent number: 6853941
    Abstract: Methods and apparatus, including computer program products, implementing and using techniques for open-loop waveform acquisition. In general, in one aspect, the invention provides a method for open-loop waveform acquisition. The method includes acquiring an S-curve of an acquisition loop of an electron-beam probe system. The S-curve represents a response of the acquisition loop to changes of potential differences between the acquisition loop and a device under test. The method includes calibrating the acquisition loop to obtain a linear region in the acquired S-curve and using the linear portion of the acquired S-curve to calculate voltage at a probe point of the device under test.
    Type: Grant
    Filed: April 30, 2002
    Date of Patent: February 8, 2005
    Assignee: NPTest, Inc.
    Inventors: Hui Wang, Kenichi Kanai, Hiroyasu Koike
  • Publication number: 20030016153
    Abstract: Methods and apparatus, including computer program products, implementing and using techniques for open-loop waveform acquisition. In general, in one aspect, the invention provides a method for open-loop waveform acquisition. The method includes acquiring an S-curve of an acquisition loop of an electron-beam probe system. The S-curve represents a response of the acquisition loop to changes of potential differences between the acquisition loop and a device under test. The method includes calibrating the acquisition loop to obtain a linear region in the acquired S-curve and using the linear portion of the acquired S-curve to calculate voltage at a probe point of the device under test.
    Type: Application
    Filed: April 30, 2002
    Publication date: January 23, 2003
    Inventors: Hui Wang, Kenichi Kanai, Hiroyasu Koike
  • Patent number: 4285659
    Abstract: The present invention relates to a mold device for an injection molding machine which consists of an injection machine and a mold device. The mold device is divided into two portions, namely, a mounting portion and a molding portion, which are designed so that they may be handled individually and/or integrally. The present invention further provides an arrangement in which the molding portion may be installed on the mounting portion with considerable transverse tolerance, despite employment of a hot runner system therein.
    Type: Grant
    Filed: April 19, 1979
    Date of Patent: August 25, 1981
    Inventor: Hiroyasu Koike