Patents by Inventor Hiroyasu Sotoma

Hiroyasu Sotoma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7239158
    Abstract: A holder supported by an arm comprises a metallic reinforcing member and a plastic holder hole forming member filled in an opening formed in the reinforcing member. Holder holes are formed in the holder hole forming member, and a coil spring and electroconductive needle members are installed in each holder hole to thereby provide a contact probe having two moveable ends. Because the holder is essentially made of the metallic member, the mechanical strength of the holder can be improved over that formed strictly from plastic material. Therefore, the contact probe holder would not suffer from dimensional changes of the holder owing to aging compounded by temperature changes for testing (tests under high temperature conditions) and residual stress so that the change in the pitch of the holder holes can be avoided, and a high level of precision can be ensured. Therefore, the contact probe allows tests to be conducted in a stable manner over an extended period of time.
    Type: Grant
    Filed: April 16, 2003
    Date of Patent: July 3, 2007
    Assignee: NHK Spring Co., Ltd.
    Inventors: Toshio Kazama, Mitsuhiro Nagaya, Hiroyasu Sotoma
  • Publication number: 20050225313
    Abstract: A holder supported by an arm comprises a metallic reinforcing member and a plastic holder hole forming member filled in an opening formed in the reinforcing member. Holder holes are formed in the holder hole forming member, and a coil spring and electroconductive needle members are installed in each holder hole to thereby provide a contact probe having two moveable ends. Because the holder is essentially made of the metallic member, the mechanical strength of the holder can be improved over that formed strictly from plastic material. Therefore, the contact probe holder would not suffer from dimensional changes of the holder owing to aging compounded by temperature changes for testing (tests under high temperature conditions) and residual stress so that the change in the pitch of the holder holes can be avoided, and a high level of precision can be ensured. Therefore, the contact probe allows tests to be conducted in a stable manner over an extended period of time.
    Type: Application
    Filed: April 16, 2003
    Publication date: October 13, 2005
    Inventors: Toshio Kazama, Mitsuhiro Nagaya, Hiroyasu Sotoma